High n-type conductivity and carrier concentration in Si-implanted homoepitaxial AlN
We demonstrate Si-implanted AlN with high conductivity (>1 Ω−1 cm−1) and high carrier concentration (5 × 1018 cm−3). This was enabled by Si implantation into AlN with a low threading dislocation density (TDD) (<103 cm−2), a non-equilibrium damage recovery and dopant activation annealing proces...
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Published in | Applied physics letters Vol. 118; no. 11 |
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Main Authors | , , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
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American Institute of Physics
15.03.2021
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Abstract | We demonstrate Si-implanted AlN with high conductivity (>1 Ω−1 cm−1) and high carrier concentration (5 × 1018 cm−3). This was enabled by Si implantation into AlN with a low threading dislocation density (TDD) (<103 cm−2), a non-equilibrium damage recovery and dopant activation annealing process, and in situ suppression of self-compensation during the annealing. Low TDD and active suppression of VAl-nSiAl complexes via defect quasi Fermi level control enabled low compensation, while low-temperature, non-equilibrium annealing maintained the desired shallow donor state with an ionization energy of ∼70 meV. The realized n-type conductivity and carrier concentration are over one order of magnitude higher than that reported thus far and present a major technological breakthrough in doping of AlN. |
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AbstractList | We demonstrate Si-implanted AlN with high conductivity (>1 Ω−1 cm−1) and high carrier concentration (5 × 1018 cm−3). This was enabled by Si implantation into AlN with a low threading dislocation density (TDD) (<103 cm−2), a non-equilibrium damage recovery and dopant activation annealing process, and in situ suppression of self-compensation during the annealing. Low TDD and active suppression of VAl-nSiAl complexes via defect quasi Fermi level control enabled low compensation, while low-temperature, non-equilibrium annealing maintained the desired shallow donor state with an ionization energy of ∼70 meV. The realized n-type conductivity and carrier concentration are over one order of magnitude higher than that reported thus far and present a major technological breakthrough in doping of AlN. |
Author | Bagheri, Pegah Collazo, Ramón Mita, Seiji Reddy, Pramod Breckenridge, M. Hayden Sarkar, Biplab Guo, Qiang Tweedie, James Sitar, Zlatko Pavlidis, Spyridon Kirste, Ronny Khachariya, Dolar |
Author_xml | – sequence: 1 givenname: M. Hayden surname: Breckenridge fullname: Breckenridge, M. Hayden organization: Department of Material Science and Engineering, North Carolina State University – sequence: 2 givenname: Pegah surname: Bagheri fullname: Bagheri, Pegah organization: Department of Material Science and Engineering, North Carolina State University – sequence: 3 givenname: Qiang surname: Guo fullname: Guo, Qiang organization: Department of Material Science and Engineering, North Carolina State University – sequence: 4 givenname: Biplab surname: Sarkar fullname: Sarkar, Biplab organization: Department of Material Science and Engineering, North Carolina State University – sequence: 5 givenname: Dolar surname: Khachariya fullname: Khachariya, Dolar organization: Department of Electrical and Computer Engineering, North Carolina State University – sequence: 6 givenname: Spyridon surname: Pavlidis fullname: Pavlidis, Spyridon organization: Department of Electrical and Computer Engineering, North Carolina State University – sequence: 7 givenname: James surname: Tweedie fullname: Tweedie, James organization: Adroit Materials – sequence: 8 givenname: Ronny surname: Kirste fullname: Kirste, Ronny organization: Adroit Materials – sequence: 9 givenname: Seiji surname: Mita fullname: Mita, Seiji organization: Adroit Materials – sequence: 10 givenname: Pramod surname: Reddy fullname: Reddy, Pramod organization: Adroit Materials – sequence: 11 givenname: Ramón surname: Collazo fullname: Collazo, Ramón organization: Department of Material Science and Engineering, North Carolina State University – sequence: 12 givenname: Zlatko surname: Sitar fullname: Sitar, Zlatko organization: 3Adroit Materials, Cary, North Carolina 27518, USA |
BackLink | https://www.osti.gov/biblio/1771214$$D View this record in Osti.gov |
BookMark | eNp90M1KAzEUBeAgFWyrC99g0JXC1PxMJtNlKWqFogvrOqRJxqZMkzFJi317U1sRRF2FkO_eHE4PdKyzGoBzBAcIluSGDiAscEXZEegiyFhOEKo6oAshJHk5pOgE9EJYpivFhHTBbGJeF5nN47bVmXRWrWU0GxO3mbAqk8J7o_3uQWobvYjG2czY7NnkZtU2wkatsoVbOd2aKN6NaLJR83gKjmvRBH12OPvg5e52Np7k06f7h_FomsuC0pjPtapZwVKUSlJZMKogVgILyErMqESCMFZoNMSYSFLOWZVYpZSAgtF5XSnSBxf7vS5Ew4M0UctFymq1jBwxhjAqErrco9a7t7UOkS_d2tuUi2MKEWWwrFBSV3slvQvB65q33qyE33IE-a5ZTvmh2WRvftj082c1qSHT_DpxvZ8IX_Lf9X_ijfPfkLeqJh9hUJdB |
CODEN | APPLAB |
CitedBy_id | crossref_primary_10_1063_5_0082348 crossref_primary_10_1063_5_0214291 crossref_primary_10_1063_5_0253813 crossref_primary_10_1063_5_0146439 crossref_primary_10_1063_5_0071791 crossref_primary_10_1093_oxfmat_itac004 crossref_primary_10_1063_5_0174524 crossref_primary_10_1103_PhysRevB_107_245202 crossref_primary_10_1002_pssr_202400017 crossref_primary_10_1088_1674_4926_45_2_021501 crossref_primary_10_1063_5_0059037 crossref_primary_10_1063_5_0074454 crossref_primary_10_3390_cryst12010038 crossref_primary_10_3390_cryst12121812 crossref_primary_10_1088_1361_6641_ac27e7 crossref_primary_10_35848_1882_0786_acdcde crossref_primary_10_1002_aelm_202300840 crossref_primary_10_1002_pssr_202200397 crossref_primary_10_1063_5_0156691 crossref_primary_10_35848_1347_4065_acb898 crossref_primary_10_1063_5_0086314 crossref_primary_10_35848_1347_4065_ac47aa crossref_primary_10_1063_5_0159641 crossref_primary_10_35848_1347_4065_ac15ae crossref_primary_10_35848_1882_0786_ad81c9 crossref_primary_10_1103_PhysRevB_108_035205 crossref_primary_10_1016_j_vacuum_2023_112829 |
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ContentType | Journal Article |
Copyright | Author(s) 2021 Author(s). Published under license by AIP Publishing. |
Copyright_xml | – notice: Author(s) – notice: 2021 Author(s). Published under license by AIP Publishing. |
DBID | AAYXX CITATION 8FD H8D L7M OTOTI |
DOI | 10.1063/5.0042857 |
DatabaseName | CrossRef Technology Research Database Aerospace Database Advanced Technologies Database with Aerospace OSTI.GOV |
DatabaseTitle | CrossRef Technology Research Database Aerospace Database Advanced Technologies Database with Aerospace |
DatabaseTitleList | Technology Research Database CrossRef |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Physics |
EISSN | 1077-3118 |
ExternalDocumentID | 1771214 10_1063_5_0042857 apl |
GrantInformation_xml | – fundername: Army Research Office grantid: W911NF-16-C-0101 funderid: https://doi.org/10.13039/100000183 – fundername: National Science Foundation grantid: ECCS-1610992 funderid: https://doi.org/10.13039/100000001 – fundername: National Science Foundation grantid: DMR-1508191 funderid: https://doi.org/10.13039/100000001 – fundername: Army Research Office grantid: W911NF-15-2-0068 funderid: https://doi.org/10.13039/100000183 – fundername: Air Force Office of Scientific Research grantid: FA9550-17-1-0225 funderid: https://doi.org/10.13039/100000181 – fundername: National Science Foundation grantid: ECCS-1653383 funderid: https://doi.org/10.13039/100000001 – fundername: U.S. Department of Energy grantid: DE-SC0011883 funderid: https://doi.org/10.13039/100000015 – fundername: National Science Foundation grantid: ECCS-1508854 funderid: https://doi.org/10.13039/100000001 – fundername: Air Force Office of Scientific Research grantid: FA9550-19-1-0114 funderid: https://doi.org/10.13039/100000181 |
GroupedDBID | -DZ -~X .DC 1UP 2-P 23M 4.4 53G 5GY 5VS 6J9 A9. AAAAW AABDS AAEUA AAGZG AAPUP AAYIH ABFTF ABJNI ABZEH ACBEA ACBRY ACGFO ACGFS ACLYJ ACNCT ACZLF ADCTM AEGXH AEJMO AENEX AFATG AFHCQ AGKCL AGLKD AGMXG AGTJO AHSDT AIAGR AJJCW AJQPL ALEPV ALMA_UNASSIGNED_HOLDINGS AQWKA ATXIE AWQPM BPZLN CS3 D0L EBS ESX F.2 F5P FDOHQ FFFMQ HAM M6X M71 M73 N9A NPSNA O-B P2P RIP RNS RQS SJN TAE TN5 UCJ UPT WH7 XJE YZZ ~02 AAGWI AAYXX ABJGX ADMLS BDMKI CITATION 8FD H8D L7M 0ZJ ABPTK AGIHO OTOTI UE8 |
ID | FETCH-LOGICAL-c455t-bedf7470058c5c475d02da2a076275c1a3774e19223c36b788c58dda0a75bf8d3 |
ISSN | 0003-6951 |
IngestDate | Fri May 19 00:45:58 EDT 2023 Sun Jun 29 15:36:04 EDT 2025 Thu Apr 24 23:02:30 EDT 2025 Tue Jul 01 01:08:04 EDT 2025 Fri Jun 21 00:13:52 EDT 2024 Thu Jun 23 13:44:59 EDT 2022 |
IsDoiOpenAccess | false |
IsOpenAccess | true |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 11 |
Language | English |
License | 0003-6951/2021/118(11)/112104/4/$30.00 Published under license by AIP Publishing. |
LinkModel | OpenURL |
MergedId | FETCHMERGED-LOGICAL-c455t-bedf7470058c5c475d02da2a076275c1a3774e19223c36b788c58dda0a75bf8d3 |
Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 USDOE SC0011883 |
ORCID | 0000-0002-8556-1178 0000-0002-3530-1888 0000-0002-8780-4583 0000-0002-8738-5921 0000-0002-1880-4811 0000-0002-7385-0837 0000-0003-0074-0626 0000-0002-1690-2581 0000000285561178 0000000287385921 0000000287804583 0000000273850837 0000000300740626 0000000218804811 0000000235301888 0000000216902581 |
OpenAccessLink | https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/5.0042857/13040399/112104_1_online.pdf |
PQID | 2501570681 |
PQPubID | 2050678 |
PageCount | 4 |
ParticipantIDs | scitation_primary_10_1063_5_0042857 crossref_primary_10_1063_5_0042857 proquest_journals_2501570681 crossref_citationtrail_10_1063_5_0042857 osti_scitechconnect_1771214 |
ProviderPackageCode | CITATION AAYXX |
PublicationCentury | 2000 |
PublicationDate | 20210315 2021-03-15 |
PublicationDateYYYYMMDD | 2021-03-15 |
PublicationDate_xml | – month: 03 year: 2021 text: 20210315 day: 15 |
PublicationDecade | 2020 |
PublicationPlace | Melville |
PublicationPlace_xml | – name: Melville – name: United States |
PublicationTitle | Applied physics letters |
PublicationYear | 2021 |
Publisher | American Institute of Physics |
Publisher_xml | – name: American Institute of Physics |
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SSID | ssj0005233 |
Score | 2.4901848 |
Snippet | We demonstrate Si-implanted AlN with high conductivity (>1 Ω−1 cm−1) and high carrier concentration (5 × 1018 cm−3). This was enabled by Si implantation into... |
SourceID | osti proquest crossref scitation |
SourceType | Open Access Repository Aggregation Database Enrichment Source Index Database Publisher |
SubjectTerms | Annealing Applied physics Carrier density Dislocation density Low temperature Self compensation Threading dislocations |
Title | High n-type conductivity and carrier concentration in Si-implanted homoepitaxial AlN |
URI | http://dx.doi.org/10.1063/5.0042857 https://www.proquest.com/docview/2501570681 https://www.osti.gov/biblio/1771214 |
Volume | 118 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1Lb9NAEF5BKgQcEBQQoQWtgAOS5db2er3OMeUVIVqB2ki9WftyazW1o9RBwK9n1usnjVDhYkXWJF7t9-1kZjwPhN4IsJK9SaBcIaR2QyKZKwIqXM_OYiQ0rLLdD4-i2Tz8fEpPu4TMqrqkFHvy18a6kv9BFe4BrqZK9h-QbX8UbsBnwBeugDBcb4SxSdJwcset4qjg2JrerXYYRFWtxlfVODppKhPzuj2uiW8cZ252uVyYPVXOeXFZaDM65IeJnU8XR31ztbFRbfzjyllUxT9dZB3U5QUsrh3QvufM-E_VVZcdcJNFktlE4LMu9PxpXUVovwE3z9oYD19d2GzvgwwWJ_rxiKBKyLIVma2OJW40qdvIaqtWPWaiobWmbfRup3jXTfHJNYUOFhSgYOJe4CfZVtbDptl__Jm1KYbVy_WIJDSpv3obbQXgSgQjtDV9f_jluJcIREgzV9Gsu-k_FZH99rkDq2VUgPYdeCR3wVyxmRM94-TkIXpQexV4ainyCN3S-Ta63-s1uY3ufLUYPkZzQxuc44o2uE8bDLTBNW3wgDY4y3GfNnhAGwy0eYLmHz-cvJu59XQNV4aUlq7QKgVf0syVlFSGjCovUDzgHjONq6XPCXgGGhyAgEgSCRaDWKwU9zijIo0VeYpGeZHrZwjLKKaepiCu0jBl0YTDyWfcI5L7Unr-GL1tdi9pNspMQFkk11Aao1et6NL2W9kktGMgSMyua3kuTUqYLBOfMT_wwzHabZBJ6sN6lYCl71PmRTEs5nWL1t8esUHqe7HqJJKlSp_fZLU76F53TnbRqFyt9QuwZEvxsqbib-VBnBU |
linkProvider | EBSCOhost |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=High+n+-type+conductivity+and+carrier+concentration+in+Si-implanted+homoepitaxial+AlN&rft.jtitle=Applied+physics+letters&rft.au=Breckenridge%2C+M.+Hayden&rft.au=Bagheri%2C+Pegah&rft.au=Guo%2C+Qiang&rft.au=Sarkar%2C+Biplab&rft.date=2021-03-15&rft.issn=0003-6951&rft.eissn=1077-3118&rft.volume=118&rft.issue=11&rft_id=info:doi/10.1063%2F5.0042857&rft.externalDBID=n%2Fa&rft.externalDocID=10_1063_5_0042857 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0003-6951&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0003-6951&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0003-6951&client=summon |