Electromagnetic Analysis of Vertical Resistive Memory with a Sub-nm Thick Electrode - Alimkhanuly, Batyrbek; Kim, Sanghoek; Kim, Lok-won; Lee, Seunghyun (Nanomaterials (Basel, Switzerland), 2020)
Keywords: Arrays; Circuits; Compliance; Computer storage devices; device modeling; Electrodes; Electromagnetic fields; EM analysis; Energy consumption; Etching; Field strength; Graphene; memory; Memory devices; Random access memory; sub-nm thin electrode; Switching; Transistors; VRRAM; United States--US