APA (7th ed.) Citation

Alimkhanuly, B., Kim, S., Kim, L., & Lee, S. (2020). Electromagnetic Analysis of Vertical Resistive Memory with a Sub-nm Thick Electrode. Nanomaterials (Basel, Switzerland), 10(9), 1634. https://doi.org/10.3390/nano10091634

Chicago Style (17th ed.) Citation

Alimkhanuly, Batyrbek, Sanghoek Kim, Lok-won Kim, and Seunghyun Lee. "Electromagnetic Analysis of Vertical Resistive Memory with a Sub-nm Thick Electrode." Nanomaterials (Basel, Switzerland) 10, no. 9 (2020): 1634. https://doi.org/10.3390/nano10091634.

MLA (9th ed.) Citation

Alimkhanuly, Batyrbek, et al. "Electromagnetic Analysis of Vertical Resistive Memory with a Sub-nm Thick Electrode." Nanomaterials (Basel, Switzerland), vol. 10, no. 9, 2020, p. 1634, https://doi.org/10.3390/nano10091634.