Adaptive prototype few-shot image classification method based on feature pyramid

• Published in: PeerJ. Computer science Vol. 10; p. e2322
• Main Authors: Shen, Linshan, Feng, Xiang, Xu, Li, Ding, Weiyue
• Format: Journal Article
• Language: English
• Published: United States PeerJ. Ltd 01.10.2024; PeerJ Inc
• Subjects: Few-shot learning; Image classification; Learning strategies; Methods; Metric learning; Prototype network; Colombia; Few-shot learning; Prototype network; Metric learning; Image classification

Few-shot learning aims to enable machines to recognize unseen novel classes using limited samples akin to human capabilities. Metric learning is a crucial approach to addressing this challenge, with its performance primarily dependent on the effectiveness of feature extraction and prototype computat...