In situ three-dimensional reciprocal-space mapping during mechanical deformation

• Published in: Journal of synchrotron radiation Vol. 19; no. 5; pp. 688 - 694
• Main Authors: Cornelius, T. W., Davydok, A., Jacques, V. L. R., Grifone, R., Schülli, T., Richard, M.-I., Beutier, G., Verdier, M., Metzger, T. H., Pietsch, U., Thomas, O.
• Format: Journal Article
• Language: English
• Published: 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.09.2012
• Subjects: 3D reciprocal-space mapping; Beams (radiation); Chemical Sciences; Deformation; energy scan; in situ AFM; Islands; Material chemistry; mechanical deformation/properties; nanofocused XRD; Nanostructure; Recording; Silicon germanides; Three dimensional; X-ray diffraction

Mechanical deformation of a SiGe island epitaxically grown on Si(001) was studied by a specially adapted atomic force microscope and nanofocused X‐ray diffraction. The deformation was monitored during in situ mechanical loading by recording three‐dimensional reciprocal‐space maps around a selected B...