Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS): A New Tool for the Analysis of Toxicological Effects on Single Cell Level
Single cell imaging mass spectrometry opens up a complete new perspective for strategies in toxicological risk assessment and drug discovery. In particular, time-of-flight secondary ion mass spectrometry (ToF-SIMS) with its high spatial and depth resolution is becoming part of the imaging mass spect...
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Published in | Toxics (Basel) Vol. 4; no. 1; p. 5 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Switzerland
MDPI
15.02.2016
MDPI AG |
Subjects | |
Online Access | Get full text |
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