Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS): A New Tool for the Analysis of Toxicological Effects on Single Cell Level

Single cell imaging mass spectrometry opens up a complete new perspective for strategies in toxicological risk assessment and drug discovery. In particular, time-of-flight secondary ion mass spectrometry (ToF-SIMS) with its high spatial and depth resolution is becoming part of the imaging mass spect...

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Bibliographic Details
Published inToxics (Basel) Vol. 4; no. 1; p. 5
Main Authors Jungnickel, Harald, Laux, Peter, Luch, Andreas
Format Journal Article
LanguageEnglish
Published Switzerland MDPI 15.02.2016
MDPI AG
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