In Situ Formation of Nanoporous Silicon on a Silicon Wafer via the Magnesiothermic Reduction Reaction (MRR) of Diatomaceous Earth

Successful direct route production of silicon nanostructures from diatomaceous earth (DE) on a single crystalline silicon wafer via the magnesiothermic reduction reaction is reported. The formed porous coating of 6 µm overall thickness contains silicon as the majority phase along with minor traces o...

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Published inNanomaterials (Basel, Switzerland) Vol. 10; no. 4; p. 601
Main Authors Aggrey, Patrick, Abdusatorov, Bakhodur, Kan, Yuliya, Salimon, Igor A, Lipovskikh, Svetlana A, Luchkin, Sergey, Zhigunov, Denis M, Salimon, Alexey I, Korsunsky, Alexander M
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LanguageEnglish
Published Switzerland MDPI 25.03.2020
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Abstract Successful direct route production of silicon nanostructures from diatomaceous earth (DE) on a single crystalline silicon wafer via the magnesiothermic reduction reaction is reported. The formed porous coating of 6 µm overall thickness contains silicon as the majority phase along with minor traces of Mg, as evident from SEM-EDS and the Focused Ion Beam (FIB) analysis. Raman peaks of silicon at 519 cm and 925 cm were found in both the film and wafer substrate, and significant intensity variation was observed, consistent with the SEM observation of the directly formed silicon nanoflake layer. Microstructural analysis of the flakes reveals the presence of pores and cavities partially retained from the precursor diatomite powder. A considerable reduction in surface reflectivity was observed for the silicon nanoflakes, from 45% for silicon wafer to below 15%. The results open possibilities for producing nanostructured silicon with a vast range of functionalities.
AbstractList Successful direct route production of silicon nanostructures from diatomaceous earth (DE) on a single crystalline silicon wafer via the magnesiothermic reduction reaction is reported. The formed porous coating of 6 µm overall thickness contains silicon as the majority phase along with minor traces of Mg, as evident from SEM-EDS and the Focused Ion Beam (FIB) analysis. Raman peaks of silicon at 519 cm and 925 cm were found in both the film and wafer substrate, and significant intensity variation was observed, consistent with the SEM observation of the directly formed silicon nanoflake layer. Microstructural analysis of the flakes reveals the presence of pores and cavities partially retained from the precursor diatomite powder. A considerable reduction in surface reflectivity was observed for the silicon nanoflakes, from 45% for silicon wafer to below 15%. The results open possibilities for producing nanostructured silicon with a vast range of functionalities.
Successful direct route production of silicon nanostructures from diatomaceous earth (DE) on a single crystalline silicon wafer via the magnesiothermic reduction reaction is reported. The formed porous coating of 6 µm overall thickness contains silicon as the majority phase along with minor traces of Mg, as evident from SEM-EDS and the Focused Ion Beam (FIB) analysis. Raman peaks of silicon at 519 cm −1 and 925 cm −1 were found in both the film and wafer substrate, and significant intensity variation was observed, consistent with the SEM observation of the directly formed silicon nanoflake layer. Microstructural analysis of the flakes reveals the presence of pores and cavities partially retained from the precursor diatomite powder. A considerable reduction in surface reflectivity was observed for the silicon nanoflakes, from 45% for silicon wafer to below 15%. The results open possibilities for producing nanostructured silicon with a vast range of functionalities.
Successful direct route production of silicon nanostructures from diatomaceous earth (DE) on a single crystalline silicon wafer via the magnesiothermic reduction reaction is reported. The formed porous coating of 6 µm overall thickness contains silicon as the majority phase along with minor traces of Mg, as evident from SEM-EDS and the Focused Ion Beam (FIB) analysis. Raman peaks of silicon at 519 cm−1 and 925 cm−1 were found in both the film and wafer substrate, and significant intensity variation was observed, consistent with the SEM observation of the directly formed silicon nanoflake layer. Microstructural analysis of the flakes reveals the presence of pores and cavities partially retained from the precursor diatomite powder. A considerable reduction in surface reflectivity was observed for the silicon nanoflakes, from 45% for silicon wafer to below 15%. The results open possibilities for producing nanostructured silicon with a vast range of functionalities.
Author Abdusatorov, Bakhodur
Kan, Yuliya
Salimon, Alexey I
Aggrey, Patrick
Luchkin, Sergey
Korsunsky, Alexander M
Salimon, Igor A
Lipovskikh, Svetlana A
Zhigunov, Denis M
AuthorAffiliation 3 Multi-Beam Laboratory for Engineering Microscopy (MBLEM), Department of Engineering Science, University of Oxford, Oxford OX1 3PJ, UK
2 Center Photonics and Quantum Materials, Skolkovo Institute of Science and Technology, 121205 Moscow, Russia; igor.salimon@skoltech.ru (I.A.S.); D.Zhigunov@skoltech.ru (D.M.Z.)
1 Hierarchically Structured Materials lab, Center for Energy Science and Technology, Skolkovo Institute of Science and Technology, 121205 Moscow, Russia; patrick.aggrey@skoltech.ru (P.A.); bakhodur.abdusatorov@skoltech.ru (B.A.); Yuliya.Kan@skoltech.ru (Y.K.); s.lipovskikh@skoltech.ru (S.A.L.); s.luchkin@skoltech.ru (S.L.); a.salimon@skoltech.ru (A.I.S.)
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– name: 3 Multi-Beam Laboratory for Engineering Microscopy (MBLEM), Department of Engineering Science, University of Oxford, Oxford OX1 3PJ, UK
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Issue 4
Keywords surface reflection
fractal structure
in situ processing
light absorption
diatomaceous earth
magnesiothermic reduction reaction
black silicon
nanoflakes
Language English
License Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
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Snippet Successful direct route production of silicon nanostructures from diatomaceous earth (DE) on a single crystalline silicon wafer via the magnesiothermic...
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SubjectTerms black silicon
diatomaceous earth
fractal structure
in situ processing
light absorption
magnesiothermic reduction reaction
nanoflakes
surface reflection
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Title In Situ Formation of Nanoporous Silicon on a Silicon Wafer via the Magnesiothermic Reduction Reaction (MRR) of Diatomaceous Earth
URI https://www.ncbi.nlm.nih.gov/pubmed/32218203
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