Atomic‐Resolution Imaging of Halide Perovskites Using Electron Microscopy

• Published in: Advanced energy materials Vol. 10; no. 26
• Main Authors: Song, Kepeng, Liu, Lingmei, Zhang, Daliang, Hautzinger, Matthew P., Jin, Song, Han, Yu
• Format: Journal Article
• Language: English
• Published: Weinheim Wiley Subscription Services, Inc 01.07.2020; Wiley Blackwell (John Wiley & Sons)
• Subjects: Electron beams; electron‐beam‐sensitive materials; halide perovskites; Image acquisition; low‐dose imaging; Mapping; Microscopy; Perovskites; Structural damage; Transmission electron microscopy

Atomic‐resolution imaging of halide perovskites (HPs) using transmission electron microscopy (TEM) is challenging because of the sensitivity of their structures to the electron beam. In this article, recent achievements in this area are reviewed, covering both all‐inorganic and organic–inorganic hyb...