Analysis and Optimization of Switched-Capacitor DC-DC Converters
Analysis methods are developed that fully determine a switched-capacitor (SC) dc-dc converter's steady-state performance through evaluation of its output impedance. This analysis method has been verified through simulation and experimentation. The simple formulation developed permits optimizati...
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| Published in | IEEE transactions on power electronics Vol. 23; no. 2; pp. 841 - 851 |
|---|---|
| Main Authors | , |
| Format | Journal Article |
| Language | English |
| Published |
New York, NY
IEEE
01.03.2008
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subjects | |
| Online Access | Get full text |
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| Abstract | Analysis methods are developed that fully determine a switched-capacitor (SC) dc-dc converter's steady-state performance through evaluation of its output impedance. This analysis method has been verified through simulation and experimentation. The simple formulation developed permits optimization of the capacitor sizes to meet a constraint such as a total capacitance or total energy storage limit, and also permits optimization of the switch sizes subject to constraints on total switch conductances or total switch volt-ampere (V-A) products. These optimizations then permit comparison among several switched-capacitor topologies, and comparisons of SC converters with conventional magnetic-based dc-dc converter circuits, in the context of various application settings. Significantly, the performance (based on conduction loss) of a ladder-type converter is found to be superior to that of a conventional magnetic-based converter for medium to high conversion ratios. |
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| AbstractList | Analysis methods are developed that fully determine a switched-capacitor (SC) dc-dc converter's steady-state performance through evaluation of its output impedance. This analysis method has been verified through simulation and experimentation. The simple formulation developed permits optimization of the capacitor sizes to meet a constraint such as a total capacitance or total energy storage limit, and also permits optimization of the switch sizes subject to constraints on total switch conductances or total switch volt-ampere (V-A) products. These optimizations then permit comparison among several switched-capacitor topologies, and comparisons of SC converters with conventional magnetic-based dc-dc converter circuits, in the context of various application settings. Significantly, the performance (based on conduction loss) of a ladder-type converter is found to be superior to that of a conventional magnetic-based converter for medium to high conversion ratios. Analysis methods are developed that fully determine a switched-capacitor (SC) dc-dc converter's steady-state performance through evaluation of its output impedance. This analysis method has been verified through simulation and experimentation. The simple formulation developed permits optimization of the capacitor sizes to meet a constraint such as a total capacitance or total energy storage limit, and also permits optimization of the switch sizes subject to constraints on total switch conductances or total switch volt-ampere (V-A) products. These optimizations then permit comparison among several switched-capacitor topologies, and comparisons of SC converters with conventional magnetic-based dc-dc converter circuits, in the context of various application settings. Significantly, the performance (based on conduction loss) of a ladder-type converter is found to be superior to that of a conventional magnetic-based converter for medium to high conversion ratios. [PUBLICATION ABSTRACT] Analysis methods are developed that fully determine a switched-capacitor (SC) dc-dc converter's steady-state performance through evaluation of its output impedance. This analysis method has been verified through simulation and experimentation. [abstract truncated by publisher]. |
| Author | Seeman, M.D. Sanders, S.R. |
| Author_xml | – sequence: 1 givenname: M.D. surname: Seeman fullname: Seeman, M.D. organization: Univ. of California, Berkeley – sequence: 2 givenname: S.R. surname: Sanders fullname: Sanders, S.R. organization: Univ. of California, Berkeley |
| BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=20188249$$DView record in Pascal Francis |
| BookMark | eNp9kE1Lw0AQhhepYP24C16CoJ5SZz-S7N6U1C8oKKjnZbuZ4JY0W3dTRX-9CZUePHiawzzvO8OzT0atb5GQYwoTSkFdvjzdzCYMoJgomlHJdsiYKkFToFCMyBikzFKpFN8j-zEuAKjIgI7J1XVrmq_oYmLaKnlcdW7pvk3nfJv4Onn-dJ19wyotzcpY1_mQTMt0Wialbz8wdBjiIdmtTRPx6HcekNfbm5fyPp093j2U17PUCqG6lHE6r4xF1V9VUgAzc85EYSqeYVbVucGiyCRagXUlK0szBJWjhX4DZg4FPyAXm95V8O9rjJ1eumixaUyLfh21Ap5zyNhAnv9LciFEDqB68PQPuPDr0PuImkGeS8XoAMEGssHHGLDWq-CWJnxpCnowrwfzejCvN-b7yNlvr4nWNHUwrXVxm2NApWRiqD7ZcA4Rt-v-OS7zgv8A7-KMbg |
| CODEN | ITPEE8 |
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| Cites_doi | 10.1109/4.663564 10.1109/ISCAS.2000.856107 10.1109/PESC.1995.474969 10.21236/ADA474049 10.1109/PESC.1999.788980 10.1109/PESC.1992.254649 10.1109/APEC.2005.1453209 10.1109/CICC.2007.4405795 10.1109/JSSC.1971.1049670 10.1109/TCS.1977.1084273 |
| ContentType | Journal Article |
| Copyright | 2008 INIST-CNRS Copyright Institute of Electrical and Electronics Engineers, Inc. (IEEE) Mar 2008 |
| Copyright_xml | – notice: 2008 INIST-CNRS – notice: Copyright Institute of Electrical and Electronics Engineers, Inc. (IEEE) Mar 2008 |
| DBID | 97E RIA RIE IQODW AAYXX CITATION 7SP 7TB 8FD FR3 JQ2 KR7 L7M F28 |
| DOI | 10.1109/TPEL.2007.915182 |
| DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005-present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE/IET Electronic Library (IEL) Pascal-Francis CrossRef Electronics & Communications Abstracts Mechanical & Transportation Engineering Abstracts Technology Research Database Engineering Research Database ProQuest Computer Science Collection Civil Engineering Abstracts Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering |
| DatabaseTitle | CrossRef Civil Engineering Abstracts Technology Research Database Mechanical & Transportation Engineering Abstracts Electronics & Communications Abstracts ProQuest Computer Science Collection Engineering Research Database Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering |
| DatabaseTitleList | Civil Engineering Abstracts Civil Engineering Abstracts Civil Engineering Abstracts |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE/IET Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering Applied Sciences |
| EISSN | 1941-0107 |
| EndPage | 851 |
| ExternalDocumentID | 1444957691 10_1109_TPEL_2007_915182 20188249 4463867 |
| Genre | orig-research Feature |
| GroupedDBID | -~X 0R~ 29I 3EH 4.4 5GY 5VS 6IK 97E AAJGR AASAJ ABFSI ABQJQ ABVLG ACGFO ACGFS ACIWK ACKIV AENEX AETIX AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BKOMP BPEOZ CS3 DU5 E.L EBS EJD HZ~ H~9 ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 MS~ O9- OCL P2P PQQKQ RIA RIE RIG RNS RXW TAE TAF TN5 VH1 VJK XFK 08R ABPTK IQODW AAYXX CITATION 7SP 7TB 8FD FR3 JQ2 KR7 L7M F28 |
| ID | FETCH-LOGICAL-c449t-231bdace950198402ab3247ad35e5df6ae7758ec4efd8dc15e096ec0f6a0ab073 |
| IEDL.DBID | RIE |
| ISSN | 0885-8993 |
| IngestDate | Fri Aug 16 08:45:52 EDT 2024 Fri Aug 16 10:25:22 EDT 2024 Fri Sep 13 03:52:14 EDT 2024 Fri Aug 23 02:13:00 EDT 2024 Sun Oct 22 16:08:28 EDT 2023 Wed Jun 26 19:26:53 EDT 2024 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 2 |
| Keywords | Magnetic circuit convertor Performance evaluation dc-dc converter Direct current convertor Optimization method switched-capacitor Power capacitor Output impedance Experimental study DC-DC power convertors Steady state Switching Optimization Analysis method Analysis Capacitance Electric loss System simulation Selector switch Comparative study Energy storage |
| Language | English |
| License | CC BY 4.0 |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c449t-231bdace950198402ab3247ad35e5df6ae7758ec4efd8dc15e096ec0f6a0ab073 |
| Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
| PQID | 206689219 |
| PQPubID | 23500 |
| PageCount | 11 |
| ParticipantIDs | pascalfrancis_primary_20188249 crossref_primary_10_1109_TPEL_2007_915182 proquest_miscellaneous_903630527 proquest_miscellaneous_34446009 ieee_primary_4463867 proquest_journals_206689219 |
| PublicationCentury | 2000 |
| PublicationDate | 2008-03-01 |
| PublicationDateYYYYMMDD | 2008-03-01 |
| PublicationDate_xml | – month: 03 year: 2008 text: 2008-03-01 day: 01 |
| PublicationDecade | 2000 |
| PublicationPlace | New York, NY |
| PublicationPlace_xml | – name: New York, NY – name: New York |
| PublicationTitle | IEEE transactions on power electronics |
| PublicationTitleAbbrev | TPEL |
| PublicationYear | 2008 |
| Publisher | IEEE Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher_xml | – name: IEEE – name: Institute of Electrical and Electronics Engineers – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| References | ref12 ref7 chua (ref9) 1987 ref4 zhu (ref6) 1996 ref3 ref11 ref10 ref5 seeman (ref8) 2006 ref2 ref1 |
| References_xml | – start-page: 553 year: 1996 ident: ref6 article-title: switched-capacitor power supplies: dc voltage ratio, efficiency, ripple, regulation publication-title: Proc IEEE Int Symp Circuits Syst contributor: fullname: zhu – ident: ref10 doi: 10.1109/4.663564 – ident: ref5 doi: 10.1109/ISCAS.2000.856107 – ident: ref1 doi: 10.1109/PESC.1995.474969 – year: 2006 ident: ref8 publication-title: Analytical and Practical Analysis of Switched-Capacitor DCDC Converters doi: 10.21236/ADA474049 contributor: fullname: seeman – ident: ref11 doi: 10.1109/PESC.1999.788980 – ident: ref7 doi: 10.1109/PESC.1992.254649 – ident: ref4 doi: 10.1109/APEC.2005.1453209 – ident: ref12 doi: 10.1109/CICC.2007.4405795 – ident: ref3 doi: 10.1109/JSSC.1971.1049670 – year: 1987 ident: ref9 publication-title: Linear and Nonlinear Circuits contributor: fullname: chua – ident: ref2 doi: 10.1109/TCS.1977.1084273 |
| SSID | ssj0014501 |
| Score | 2.5312078 |
| Snippet | Analysis methods are developed that fully determine a switched-capacitor (SC) dc-dc converter's steady-state performance through evaluation of its output... |
| SourceID | proquest crossref pascalfrancis ieee |
| SourceType | Aggregation Database Index Database Publisher |
| StartPage | 841 |
| SubjectTerms | Analysis Analytical models Applied sciences Capacitance Capacitors Capacitors. Resistors. Filters Circuit properties Circuits Constraint optimization dc-dc converter DC-DC power converters Dielectric, amorphous and glass solid devices Electric currents Electric, optical and optoelectronic circuits Electrical engineering. Electrical power engineering Electronic circuits Electronics Exact sciences and technology Impedance Methods output impedance Performance analysis Power electronics, power supplies Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Signal convertors Steady-state switched-capacitor Switches Switching converters Various equipment and components |
| Title | Analysis and Optimization of Switched-Capacitor DC-DC Converters |
| URI | https://ieeexplore.ieee.org/document/4463867 https://www.proquest.com/docview/206689219/abstract/ https://search.proquest.com/docview/34446009 https://search.proquest.com/docview/903630527 |
| Volume | 23 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8QwEB7WPenBt1gfaw5eBLPWNm2Tm1JXFvEFruCtJE0CInbF3UXw1zvpC5_grZDQpjPJzHyZF8B-pGwQGF9SK31OWRhLijhL0xB1m0WNx5Pywu3qOh7es4uH6KEDh20ujDGmDD4zffdY-vL1OJ-5q7IjhC4hj5M5mON-UOVqtR4DFpWtjvHQRBQxRNi4JH1xNLodXFbFCgXqNx58UUFlTxUXESknSBRbdbP4IZhLbXO-BFfNOqsgk6f-bKr6-fu3Eo7__ZFlWKzNTnJa7ZMV6JhiFRY-FSNcg5OmPgmRhSY3KEqe6xxNMrbk7u3R8VfTFLVrjmLglZyl9CwlqQtbd3Ghk3W4Px-M0iGt-yvQnDExpWjaKS1zI5B0AoFeIBWaV4nUYWQibWNpkFHc5MxYzXV-HBnEOyb3ccSXCmXDBnSLcWE2gSglAkRz7oUKRYISmjGLtqeUlsfHPPHgoCF59lKV0chK-OGLzLHHdcNMsoo9Hqw5irXzamJ50PvCo3YcTRiECUx4sN0wLasP4iRz1eq5QLHswV47iifIuUVkYcazSRYy_AKamh6QP2YI5-32oyDZ-n1p2zBfhZG40LQd6E5fZ2YXbZWp6pWb9AOJEOWe |
| link.rule.ids | 315,786,790,802,27957,27958,55109 |
| linkProvider | IEEE |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT9wwEB7xOJQeWiitmtKCD1yQ6iUkTmLfQGHRArtQqbsSt8iObalCJBWbqFJ_fcd5iUeRuEWylTgz9sx8nhfAfqRsEBhfUit9TlkYS4o4S9MQdZtFjceT5sJtdhVPFuziJrpZge9DLowxpgk-MyP32PjydZnX7qrsEKFLyONkFdZRz_uizdYafAYsapod47GJKKKIsHdK-uJw_mM8bcsVCtRwPHikhJquKi4mUi6RLLbtZ_FMNDf65uw9zPqVtmEmt6O6UqP875Mijq_9lU141xme5KTdKVuwYooP8PZBOcJtOO4rlBBZaHKNwuSuy9IkpSU___xyHNY0Rf2aoyC4J6cpPU1J6gLXXWTo8iMszsbzdEK7Dgs0Z0xUFI07pWVuBJJOINQLpEIDK5E6jEykbSwNsoqbnBmruc6PIoOIx-Q-jvhSoXT4BGtFWZjPQJQSAeI590KFQkEJzZhF61NKy-Mjnnhw0JM8-90W0sgaAOKLzLHH9cNMspY9Hmw7ig3zOmJ5sPuIR8M4GjEIFJjwYKdnWtYdxWXm6tVzgYLZg71hFM-Qc4zIwpT1MgsZfgGNTQ_ICzOE83f7UZB8-f_S9uDNZD6bZtPzq8sd2GiDSlyg2ldYq-5r8w0tl0rtNhv2H8wn6PQ |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Analysis+and+Optimization+of+Switched-Capacitor+DC-DC+Converters&rft.jtitle=IEEE+transactions+on+power+electronics&rft.au=Seeman%2C+M+D&rft.au=Sanders%2C+S+R&rft.date=2008-03-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=0885-8993&rft.eissn=1941-0107&rft.volume=23&rft.issue=2&rft.spage=841&rft_id=info:doi/10.1109%2FTPEL.2007.915182&rft.externalDBID=NO_FULL_TEXT&rft.externalDocID=1444957691 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0885-8993&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0885-8993&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0885-8993&client=summon |