A Design Methodology for Fault-Tolerant Neuromorphic Computing Using Bayesian Neural Network - Gao, Di; Xie, Xiaoru; Wei, Dongxu (Micromachines (Basel), 2023)
Keywords: Analysis; Arrays; Bayesian analysis; Bayesian neural network; Design; Design engineering; Expected values; Fault tolerance; memristor crossbar array; Memristors; Methods; Neural networks; Neuromorphic computing; process variation; Statistical inference; variational inference