Echo TEMPEST: EM Information Leakage Induced by IEMI for Electronic Devices

• Published in: IEEE transactions on electromagnetic compatibility Vol. 65; no. 3; pp. 655 - 666
• Main Authors: Kaji, Shugo, Fujimoto, Daisuke, Kinugawa, Masahiro, Hayashi, Yuichi
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.06.2023; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Antenna measurements; Eavesdrop; electromagnetic emanations; electromagnetic information leakage; Frequency measurement; hardware security; Impedance; Impedance measurement; information security; Input impedance; Integrated circuits; intentional electromagnetic interference; Inverters; Keyboards; Leakage; Sensors; TEMPEST

Electromagnetic (EM) information leakage encourages attacks, wherein the attackers passively capture and analyze EM waves that are unintentionally generated by devices. Generally, devices with weak EM emission intensities are not targeted. However, even these devices would be subject to attacks if i...