Echo TEMPEST: EM Information Leakage Induced by IEMI for Electronic Devices - Kaji, Shugo; Fujimoto, Daisuke; Kinugawa, Masahiro; Hayashi, Yuichi (IEEE transactions on electromagnetic compatibility, 2023)
Keywords: Antenna measurements; Eavesdrop; electromagnetic emanations; electromagnetic information leakage; Frequency measurement; hardware security; Impedance; Impedance measurement; information security; Input impedance; Integrated circuits; intentional electromagnetic interference; Inverters; Keyboards; Leakage; Sensors; TEMPEST