APA (7th ed.) Citation

Kaji, S., Fujimoto, D., Kinugawa, M., & Hayashi, Y. (2023). Echo TEMPEST: EM Information Leakage Induced by IEMI for Electronic Devices. IEEE transactions on electromagnetic compatibility, 65(3), 655-666. https://doi.org/10.1109/TEMC.2023.3252636

Chicago Style (17th ed.) Citation

Kaji, Shugo, Daisuke Fujimoto, Masahiro Kinugawa, and Yuichi Hayashi. "Echo TEMPEST: EM Information Leakage Induced by IEMI for Electronic Devices." IEEE Transactions on Electromagnetic Compatibility 65, no. 3 (2023): 655-666. https://doi.org/10.1109/TEMC.2023.3252636.

MLA (9th ed.) Citation

Kaji, Shugo, et al. "Echo TEMPEST: EM Information Leakage Induced by IEMI for Electronic Devices." IEEE Transactions on Electromagnetic Compatibility, vol. 65, no. 3, 2023, pp. 655-666, https://doi.org/10.1109/TEMC.2023.3252636.