Lee, J., Moon, G., Ka, S., Toh, K., & Kim, D. (2023). Deep Learning Approach for the Localization and Analysis of Surface Plasmon Scattering. Sensors (Basel, Switzerland), 23(19), 8100. https://doi.org/10.3390/s23198100
Chicago Style (17th ed.) CitationLee, Jongha, Gwiyeong Moon, Sukhyeon Ka, Kar-Ann Toh, and Donghyun Kim. "Deep Learning Approach for the Localization and Analysis of Surface Plasmon Scattering." Sensors (Basel, Switzerland) 23, no. 19 (2023): 8100. https://doi.org/10.3390/s23198100.
MLA (9th ed.) CitationLee, Jongha, et al. "Deep Learning Approach for the Localization and Analysis of Surface Plasmon Scattering." Sensors (Basel, Switzerland), vol. 23, no. 19, 2023, p. 8100, https://doi.org/10.3390/s23198100.
Warning: These citations may not always be 100% accurate.