A Framework for Validation of Computer Models - Bayarri, Maria J; Berger, James O; Paulo, Rui; Sacks, Jerry; Cafeo, John A; Cavendish, James; Lin, Chin-Hsu; Tu, Jian (Technometrics, 2007)
Keywords: Accuracy; Applied sciences; Approximation; Bayesian analysis; Bias; Calibration; Computer analysis; Computer based modeling; Computer modeling; Computer science; control theory; systems; Data models; Data processing. List processing. Character string processing; Exact sciences and technology; Identifiability; Mathematics; Maximum likelihood estimation; Memory organisation. Data processing; Model discrepancy; Modeling; Motivation; Parametric models; Prediction; Probability and statistics; Sciences and techniques of general use; Software; Statistics; Studies; Validity; Welding; Bayes estimation; Multimodel; Information validation; Identifiability; Model discrepancy; Information source; Multiplicity; Prediction; Spot welding; Updating; Modeling; Bayesian analysis