Optical characterization of lithium fluoride thin-film imaging detectors for monochromatic hard X-rays

Abstract Lithium fluoride (LiF) crystals and thin films have been successfully investigated as X-ray imaging detectors based on optical reading of visible photoluminescence emitted by stable radiation-induced F 2 and F + 3 colour centres. In this work, the visible photoluminescence response of optic...

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Published inJournal of instrumentation Vol. 18; no. 4; p. C04012
Main Authors Vincenti, M.A., Montereali, R.M., Nichelatti, E., Nigro, V., Piccinini, M., Koenig, M., Mabey, P., Rigon, G., Dabrowski, H.J., Benkadoum, Y., Mercere, P., Da Silva, P., Pikuz, T., Ozaki, N., Makarov, S., Pikuz, S., Albertazzi, B.
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Published Bristol IOP Publishing 01.04.2023
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Abstract Abstract Lithium fluoride (LiF) crystals and thin films have been successfully investigated as X-ray imaging detectors based on optical reading of visible photoluminescence emitted by stable radiation-induced F 2 and F + 3 colour centres. In this work, the visible photoluminescence response of optically-transparent LiF film detectors of three different thicknesses, grown by thermal evaporation on Si(100) substrates and irradiated with monochromatic 7 keV X-rays at several doses in the range between 13 and 4.5 × 10 3 Gy, was carefully investigated by fluorescence optical microscopy. For all the film thicknesses, the photoluminescence response linearly depends on the irradiation dose in the investigated dose range. The lowest detected dose, delivered to the thinnest LiF film, only 0.5 μm thick, is estimated 13 Gy. Edge-enhancement imaging experiments, conducted by irradiating LiF film detectors at the same energy placing an Au mesh in front of them at a distance of 15 mm, allowed estimating a spatial resolution of (0.38 ± 0.05) μm, which is comparable to the microscope one. This very high spatial resolution in LiF film radiation detectors based on colour centres photoluminescence is combined with the availability of a wide field of view on large areas.
AbstractList Lithium fluoride (LiF) crystals and thin films have been successfully investigated as X-ray imaging detectors based on optical reading of visible photoluminescence emitted by stable radiation-induced F2 and F+3 colour centres. In this work, the visible photoluminescence response of optically-transparent LiF film detectors of three different thicknesses, grown by thermal evaporation on Si(100) substrates and irradiated with monochromatic 7 keV X-rays at several doses in the range between 13 and 4.5 × 103 Gy, was carefully investigated by fluorescence optical microscopy. For all the film thicknesses, the photoluminescence response linearly depends on the irradiation dose in the investigated dose range. The lowest detected dose, delivered to the thinnest LiF film, only 0.5 μm thick, is estimated 13 Gy. Edge-enhancement imaging experiments, conducted by irradiating LiF film detectors at the same energy placing an Au mesh in front of them at a distance of 15 mm, allowed estimating a spatial resolution of (0.38 ± 0.05) μm, which is comparable to the microscope one. This very high spatial resolution in LiF film radiation detectors based on colour centres photoluminescence is combined with the availability of a wide field of view on large areas.
Lithium fluoride (LiF) crystals and thin films have been successfully investigated as X-ray imaging detectors based on optical reading of visible photoluminescence emitted by stable radiation-induced F$_2$ and F$^+$$_3$ colour centres. In this work, the visible photoluminescence response of optically-transparent LiF film detectors of three different thicknesses, grown by thermal evaporation on Si(100) substrates and irradiated with monochromatic 7 keV X-rays at several doses in the range between 13 and 4.5 × 10$^3$ Gy, was carefully investigated by fluorescence optical microscopy. For all the film thicknesses, the photoluminescence response linearly depends on the irradiation dose in the investigated dose range. The lowest detected dose, delivered to the thinnest LiF film, only 0.5 μm thick, is estimated 13 Gy. Edge-enhancement imaging experiments, conducted by irradiating LiF film detectors at the same energy placing an Au mesh in front of them at a distance of 15 mm, allowed estimating a spatial resolution of (0.38 ± 0.05) μm, which is comparable to the microscope one. This very high spatial resolution in LiF film radiation detectors based on colour centres photoluminescence is combined with the availability of a wide field of view on large areas.
Abstract Lithium fluoride (LiF) crystals and thin films have been successfully investigated as X-ray imaging detectors based on optical reading of visible photoluminescence emitted by stable radiation-induced F 2 and F + 3 colour centres. In this work, the visible photoluminescence response of optically-transparent LiF film detectors of three different thicknesses, grown by thermal evaporation on Si(100) substrates and irradiated with monochromatic 7 keV X-rays at several doses in the range between 13 and 4.5 × 10 3 Gy, was carefully investigated by fluorescence optical microscopy. For all the film thicknesses, the photoluminescence response linearly depends on the irradiation dose in the investigated dose range. The lowest detected dose, delivered to the thinnest LiF film, only 0.5 μm thick, is estimated 13 Gy. Edge-enhancement imaging experiments, conducted by irradiating LiF film detectors at the same energy placing an Au mesh in front of them at a distance of 15 mm, allowed estimating a spatial resolution of (0.38 ± 0.05) μm, which is comparable to the microscope one. This very high spatial resolution in LiF film radiation detectors based on colour centres photoluminescence is combined with the availability of a wide field of view on large areas.
Author Koenig, M.
Piccinini, M.
Nigro, V.
Albertazzi, B.
Da Silva, P.
Benkadoum, Y.
Pikuz, S.
Pikuz, T.
Montereali, R.M.
Vincenti, M.A.
Mercere, P.
Makarov, S.
Nichelatti, E.
Ozaki, N.
Mabey, P.
Dabrowski, H.J.
Rigon, G.
Author_xml – sequence: 1
  givenname: M.A.
  surname: Vincenti
  fullname: Vincenti, M.A.
  organization: ENEA C.R. Frascati, Fusion and Technologies for Nuclear Safety and Security Department, Via E. Fermi 45, 00044 Frascati (RM), Italy
– sequence: 2
  givenname: R.M.
  surname: Montereali
  fullname: Montereali, R.M.
  organization: ENEA C.R. Frascati, Fusion and Technologies for Nuclear Safety and Security Department, Via E. Fermi 45, 00044 Frascati (RM), Italy
– sequence: 3
  givenname: E.
  surname: Nichelatti
  fullname: Nichelatti, E.
  organization: ENEA C.R. Casaccia, Fusion and Technologies for Nuclear Safety and Security Department, Via Anguillarese 301, 00123 S. Maria di Galeria (RM), Italy
– sequence: 4
  givenname: V.
  surname: Nigro
  fullname: Nigro, V.
  organization: ENEA C.R. Frascati, Fusion and Technologies for Nuclear Safety and Security Department, Via E. Fermi 45, 00044 Frascati (RM), Italy
– sequence: 5
  givenname: M.
  surname: Piccinini
  fullname: Piccinini, M.
  organization: ENEA C.R. Frascati, Fusion and Technologies for Nuclear Safety and Security Department, Via E. Fermi 45, 00044 Frascati (RM), Italy
– sequence: 6
  givenname: M.
  surname: Koenig
  fullname: Koenig, M.
  organization: LULI-CNRS, Ecole Polytechnique, CEA, Universitè Paris-Saclay, F-91128 Palaiseau Cedex, France
– sequence: 7
  givenname: P.
  surname: Mabey
  fullname: Mabey, P.
  organization: Department of Physics, Freie Universität Berlin, Arnimallee 14, 14195 Berlin, Germany
– sequence: 8
  givenname: G.
  surname: Rigon
  fullname: Rigon, G.
  organization: LULI-CNRS, Ecole Polytechnique, CEA, Universitè Paris-Saclay, F-91128 Palaiseau Cedex, France
– sequence: 9
  givenname: H.J.
  surname: Dabrowski
  fullname: Dabrowski, H.J.
  organization: LULI-CNRS, Ecole Polytechnique, CEA, Universitè Paris-Saclay, F-91128 Palaiseau Cedex, France
– sequence: 10
  givenname: Y.
  surname: Benkadoum
  fullname: Benkadoum, Y.
  organization: LULI-CNRS, Ecole Polytechnique, CEA, Universitè Paris-Saclay, F-91128 Palaiseau Cedex, France
– sequence: 11
  givenname: P.
  surname: Mercere
  fullname: Mercere, P.
  organization: SOLEIL synchrotron, L'Orme des Merisiers, Départementale 128, 91190 Saint Aubin, France
– sequence: 12
  givenname: P.
  surname: Da Silva
  fullname: Da Silva, P.
  organization: SOLEIL synchrotron, L'Orme des Merisiers, Départementale 128, 91190 Saint Aubin, France
– sequence: 13
  givenname: T.
  surname: Pikuz
  fullname: Pikuz, T.
  organization: Institute for Open and Transdisciplinary Research Initiatives, Osaka University, Suita, Osaka 565-0871, Japan
– sequence: 14
  givenname: N.
  surname: Ozaki
  fullname: Ozaki, N.
  organization: Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
– sequence: 15
  givenname: S.
  surname: Makarov
  fullname: Makarov, S.
  organization: Joint Institute for High Temperature RAS, Moscov 125412, Russia
– sequence: 16
  givenname: S.
  surname: Pikuz
  fullname: Pikuz, S.
  organization: Joint Institute for High Temperature RAS, Moscov 125412, Russia
– sequence: 17
  givenname: B.
  surname: Albertazzi
  fullname: Albertazzi, B.
  organization: LULI-CNRS, Ecole Polytechnique, CEA, Universitè Paris-Saclay, F-91128 Palaiseau Cedex, France
BackLink https://hal.science/hal-04287326$$DView record in HAL
BookMark eNqFkFFLwzAUhYNMcJv-BQn4pFB3k2Zt-jiGOmGwFwXfQpomW0bb1LQT5q83pTJ9EHy69ybnfBzOBI1qV2uErgncE-B8RlLGI6CUzAifAZstgQGhZ2h8-hj92i_QpG33APNszmCMzKbprJIlVjvppeq0t5-ys67GzuDSdjt7qLApD87bQuNw1pGxZYVtJbe23uJCd1p1zrfYOI8rVzu1864KCIUDscBvkZfH9hKdG1m2-up7TtHr48PLchWtN0_Py8U6UozFXaRMnuY0jZMsN0VuKORJxgxLU6bmREngOpdsTkFyTrWK4yJjMsu5ASpBkTyOp-h24O5kKRofUvqjcNKK1WIt-jdglKcxTT5I0N4M2sa794NuO7F3B1-HeILy0CHLWAJBlQwq5V3bem1OWAKi71_01Yq-WkHCZGLoPxjpYLSu-SH_a7r7w7S3dUj3WyiawsRfDWKYCQ
CitedBy_id crossref_primary_10_1149_2162_8777_acdd9b
crossref_primary_10_1088_1361_648X_ad2796
Cites_doi 10.1038/s41598-018-34717-9
10.1002/jemt.20523
10.7567/JJAP.53.02BD14
10.1166/jnn.2003.023
10.1016/j.nima.2017.07.036
10.1016/j.nima.2012.12.023
10.1088/1748-0221/14/10/c10006
10.1063/1.5092265
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– notice: Attribution
DBID O3W
TSCCA
AAYXX
CITATION
7U5
8FD
L7M
1XC
VOOES
DOI 10.1088/1748-0221/18/04/C04012
DatabaseName Institute of Physics Open Access Journal Titles
IOPscience (Open Access)
CrossRef
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
Hyper Article en Ligne (HAL)
Hyper Article en Ligne (HAL) (Open Access)
DatabaseTitle CrossRef
Technology Research Database
Advanced Technologies Database with Aerospace
Solid State and Superconductivity Abstracts
DatabaseTitleList Technology Research Database

CrossRef
Database_xml – sequence: 1
  dbid: O3W
  name: Institute of Physics Open Access Journal Titles
  url: http://iopscience.iop.org/
  sourceTypes:
    Enrichment Source
    Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1748-0221
ExternalDocumentID oai_HAL_hal_04287326v1
10_1088_1748_0221_18_04_C04012
JINST_068P_0123
GroupedDBID 1JI
5B3
5GY
5PX
5VS
5ZH
7.M
7.Q
AAGCD
AAGID
AAJIO
AAJKP
AATNI
ABCXL
ABJNI
ABQJV
ABVAM
ACAFW
ACGFO
ACGFS
ACHIP
ADWVK
AEFHF
AENEX
AFYNE
AKPSB
ALMA_UNASSIGNED_HOLDINGS
AOAED
ASPBG
ATQHT
AVWKF
AZFZN
CBCFC
CEBXE
CJUJL
CRLBU
CS3
DU5
EBS
EDWGO
EMSAF
EPQRW
EQZZN
HAK
IJHAN
IOP
IZVLO
KOT
LAP
MV1
N5L
N9A
O3W
PJBAE
RIN
RNS
ROL
RPA
SY9
TSCCA
VSI
W28
ZMT
AAYXX
CITATION
7U5
8FD
L7M
1XC
VOOES
ID FETCH-LOGICAL-c443t-cfb7b27369bfdbf20b694f4774c51ca08eba4520a882ec33d94a9b8f02a0c1b33
IEDL.DBID IOP
ISSN 1748-0221
IngestDate Thu Oct 31 07:26:46 EDT 2024
Thu Oct 10 17:06:38 EDT 2024
Fri Aug 23 01:26:07 EDT 2024
Wed Aug 21 03:30:48 EDT 2024
Wed Jul 19 06:37:29 EDT 2023
IsDoiOpenAccess true
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Issue 4
Language English
License Published by IOP Publishing Ltd on behalf of Sissa Medialab. Original content from this work may be used under the terms of the Creative Commons Attribution 4.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
Attribution: http://creativecommons.org/licenses/by
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c443t-cfb7b27369bfdbf20b694f4774c51ca08eba4520a882ec33d94a9b8f02a0c1b33
OpenAccessLink https://proxy.k.utb.cz/login?url=https://iopscience.iop.org/article/10.1088/1748-0221/18/04/C04012
PQID 2804049460
PQPubID 4562433
PageCount 5
ParticipantIDs iop_journals_10_1088_1748_0221_18_04_C04012
hal_primary_oai_HAL_hal_04287326v1
proquest_journals_2804049460
crossref_primary_10_1088_1748_0221_18_04_C04012
PublicationCentury 2000
PublicationDate 2023-04-01
PublicationDateYYYYMMDD 2023-04-01
PublicationDate_xml – month: 04
  year: 2023
  text: 2023-04-01
  day: 01
PublicationDecade 2020
PublicationPlace Bristol
PublicationPlace_xml – name: Bristol
PublicationTitle Journal of instrumentation
PublicationTitleAlternate J. Instrum
PublicationYear 2023
Publisher IOP Publishing
Publisher_xml – name: IOP Publishing
References b736c5daa8d0962aeda1623b73b7504a5
b3a4d1eec62803bdb4f8d9c1954e86e16
b1ff7a8e23a9cca65ad3ee2d667b03723
bceffa19d6495c7262f93ffc778c0503c
b59678dcd93d5a81cbe6fb9fa59112e91
b397732d826a51f8e4c0f2c9c154aaba4
ba9ca51b5600ef4bee9169b4c30c8ad94
bf5812eeef7b9e79d8229a561711c9f71
bf5d06d2779f046ee5ef823b447a50ea3
bacc1040779cc02968b8350d79c4d553e
b0cc160f517e6e710d28b415ebe572f03
References_xml – ident: bceffa19d6495c7262f93ffc778c0503c
  doi: 10.1038/s41598-018-34717-9
– ident: bf5812eeef7b9e79d8229a561711c9f71
  doi: 10.1002/jemt.20523
– ident: b397732d826a51f8e4c0f2c9c154aaba4
  doi: 10.7567/JJAP.53.02BD14
– ident: bacc1040779cc02968b8350d79c4d553e
  doi: 10.1166/jnn.2003.023
– ident: b3a4d1eec62803bdb4f8d9c1954e86e16
  doi: 10.1016/j.nima.2017.07.036
– ident: b59678dcd93d5a81cbe6fb9fa59112e91
  doi: 10.1016/j.nima.2012.12.023
– ident: b1ff7a8e23a9cca65ad3ee2d667b03723
  doi: 10.1088/1748-0221/14/10/c10006
– ident: b736c5daa8d0962aeda1623b73b7504a5
  doi: 10.1063/1.5092265
– ident: b0cc160f517e6e710d28b415ebe572f03
  doi: 10.3390/ma5050937
– ident: bf5d06d2779f046ee5ef823b447a50ea3
  doi: 10.1103/PhysRev.158.814
– ident: ba9ca51b5600ef4bee9169b4c30c8ad94
  doi: 10.1016/j.optmat.2021.111376
SSID ssj0059540
Score 2.3646038
Snippet Abstract Lithium fluoride (LiF) crystals and thin films have been successfully investigated as X-ray imaging detectors based on optical reading of visible...
Lithium fluoride (LiF) crystals and thin films have been successfully investigated as X-ray imaging detectors based on optical reading of visible...
SourceID hal
proquest
crossref
iop
SourceType Open Access Repository
Aggregation Database
Enrichment Source
Publisher
StartPage C04012
SubjectTerms Color centers
Fluorides
Lithium
Lithium fluoride
Materials for solid-state detectors
Optical microscopy
Optical properties
Photoluminescence
Physics
Radiation
Radiation detectors
Radiation dosage
Radiation effects
Sensors
Silicon substrates
Solid state detectors
Spatial resolution
Thickness
Thin films
X ray imagery
X-ray detectors
X-rays
Title Optical characterization of lithium fluoride thin-film imaging detectors for monochromatic hard X-rays
URI https://iopscience.iop.org/article/10.1088/1748-0221/18/04/C04012
https://www.proquest.com/docview/2804049460
https://hal.science/hal-04287326
Volume 18
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1Lb9QwELZoucCB8hTbFmQBN-RNHDupc6wqqgUBy4GK3iyPY2sD3c1qN1up_fWMnaSwIIQQlzztOLHH9jfxzDeEvAIc8HwOionS5kzmvmIgjWU251AiROXchRXdDx-LyZl8d54P1oTRF6ZZ9kP_GA87ouCuCnuDOJUghlYMpx6ecJWkMjlBOQxxhm8L7DBB_3o7_TQMxnmJiGRwDP5j3q05aWcWLCJ3sPTfhuc455zuERjetjM1-TbetDC2178QOf7X59wn93pESo-7DA_ILbd4SO7-xFP4iPjpMv7ypvaG3rnz3qSNp4jjZ_VmTv3FplnVlaN4umC-vpjTeh5jINHKtXFxYE0RIlMU_MbOVk0ki6XB64ues5W5Wj8mZ6dvPp9MWB-ggVkpRcushyNA_FOU4CvwWQpFKb1ERIlNbU2qHBiZZ6lBGO-sEFUpTQnKp5lJLQchnpDdRbNwTwl1qBDjHFBwOPLSQG6EQtU0C1RAgVPQjEgyNJFedjwcOq6fK6VDDepQg5rjXuquBkfkBbbkTeJAoz05fq_DtagnIm695CPyGttF9_12_ddHvtxK_bVGCL-VQi8rPyKHg9j8SJopvC9LWaT7_1TkAbkTAtx3tkKHZLddbdwzhEEtPI-Cjtup-PIdvmj7aA
link.rule.ids 230,315,783,787,888,27936,27937,38877,38902,53854,53880
linkProvider IOP Publishing
linkToPdf http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3db9MwED-tQ0LsYeJjaB0DLOANeYkTO3Mep9GqQGl5YKJvlu3Yaqa1qfqBtP-ec5IWKoQQT_m6ONb5cvfzx_0M8M6gw_PCSJrmVlAufEEN15ZawUyOEJUxF2Z0v4yywQ3_NBGTA-jtcmGqRev6L_C0IQpuVNguiJMRYmhJMfSwiMko5tE12iFLokXhO_BABHITNOtx-n3rkEWOqGSbHPzX9_fiUmcaVkV2sAZ_uOg67vQfw3ELGMlVU70ncODmT-HoNxrBZ-DHi3pEmtgd-3KTXEkqTxBmT8vNjPi7TbUsC0fwck59eTcj5azeoogUbl2P3a8IIliCdlnZ6bKquVxJSMoiE7rU96sTuOn3vl0PaLt_ArWcp2tqvbk0CE-y3PjC-CQ2Wc49R8CHLWF1LJ3RXCSxRpTtbJoWOde5kT5OdGyZSdPncDiv5u4UiMP-KrrojJlLz7UROpXYc0wCU0-g_NNdiLbaU4uGJkPV09tSqqBvFfStGB65avTdhTeo5J1wYLkeXA1VuFd34xBW_mBdeI9toNrfavXPIt_uSd-WiLD3JBQaSRfOty36SzSR-JznPIvP_uuTr-Hh1w99Nfw4-vwCHoWt6JtVPedwuF5u3EsELGvzqjbHnxUx3os
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Optical+characterization+of+lithium+fluoride+thin-film+imaging+detectors+for+monochromatic+hard+X-rays&rft.jtitle=Journal+of+instrumentation&rft.au=Vincenti%2C+M.A.&rft.au=Montereali%2C+R.M.&rft.au=Nichelatti%2C+E.&rft.au=Nigro%2C+V.&rft.date=2023-04-01&rft.pub=IOP+Publishing&rft.eissn=1748-0221&rft.volume=18&rft.issue=4&rft_id=info:doi/10.1088%2F1748-0221%2F18%2F04%2FC04012&rft.externalDocID=JINST_068P_0123
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1748-0221&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1748-0221&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1748-0221&client=summon