Radiation testing of low cost, commercial off the shelf microcontroller board
The impact of gamma radiation on a commercial off the shelf microcontroller board has been investigated. Three different tests have been performed to ascertain the radiation tolerance of the device from a nuclear decommissioning deployment perspective. The first test analyses the effect of radiation...
Saved in:
| Published in | Nuclear engineering and technology Vol. 53; no. 10; pp. 3335 - 3343 |
|---|---|
| Main Authors | , , , , , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Elsevier B.V
01.10.2021
Elsevier 한국원자력학회 |
| Subjects | |
| Online Access | Get full text |
| ISSN | 1738-5733 2234-358X |
| DOI | 10.1016/j.net.2021.05.005 |
Cover
Loading…
| Abstract | The impact of gamma radiation on a commercial off the shelf microcontroller board has been investigated. Three different tests have been performed to ascertain the radiation tolerance of the device from a nuclear decommissioning deployment perspective. The first test analyses the effect of radiation on the output voltage of the on-board voltage regulator during irradiation. The second test evaluated the effect of gamma radiation on the voltage characteristics of analogue and digital inputs and outputs. The final test analyses the functionality of the microcontroller when using an external, shielded voltage regulator instead of the on-board voltage regulator. The results suggest that a series of latch-ups occurs in the microcontroller during irradiation, causing increased current drain which can damage the voltage regulator if it does not have short-circuit protection. The analogue to digital conversion functionality appears to be more sensitive to gamma radiation than digital and analogue output functionality. Using an external, shielded voltage regulator can prove beneficial when used for certain applications. The collected data suggests that detaching the voltage regulator can extend the lifespan of the platform up to approximately 350 Gy. |
|---|---|
| AbstractList | The impact of gamma radiation on a commercial off the shelf microcontroller board has been investigated. Three different tests have been performed to ascertain the radiation tolerance of the device from a nuclear decommissioning deployment perspective. The first test analyses the effect of radiation on the output voltage of the on-board voltage regulator during irradiation. The second test evaluated the effect of gamma radiation on the voltage characteristics of analogue and digital inputs and outputs. The final test analyses the functionality of the microcontroller when using an external, shielded voltage regulator instead of the on-board voltage regulator. The results suggest that a series of latch-ups occurs in the microcontroller during irradiation, causing increased current drain which can damage the voltage regulator if it does not have short-circuit protection. The analogue to digital conversion functionality appears to be more sensitive to gamma radiation than digital and analogue output functionality. Using an external, shielded voltage regulator can prove beneficial when used for certain applications. The collected data suggests that detaching the voltage regulator can extend the lifespan of the platform up to approximately 350 Gy. The impact of gamma radiation on a commercial off the shelf microcontroller board has been investigated. Three different tests have been performed to ascertain the radiation tolerance of the device from anuclear decommissioning deployment perspective. The first test analyses the effect of radiation on theoutput voltage of the on-board voltage regulator during irradiation. The second test evaluated the effectof gamma radiation on the voltage characteristics of analogue and digital inputs and outputs. The finaltest analyses the functionality of the microcontroller when using an external, shielded voltage regulatorinstead of the on-board voltage regulator. The results suggest that a series of latch-ups occurs in themicrocontroller during irradiation, causing increased current drain which can damage the voltageregulator if it does not have short-circuit protection. The analogue to digital conversion functionalityappears to be more sensitive to gamma radiation than digital and analogue output functionality. Using anexternal, shielded voltage regulator can prove beneficial when used for certain applications. Thecollected data suggests that detaching the voltage regulator can extend the lifespan of the platform up toapproximately 350 Gy KCI Citation Count: 0 |
| Author | Cockbain, Neil Lennox, Barry Fried, Tomas Green, Peter R. Monk, Stephen D. Dodds, Jonathan M. Taylor, C. James Di Buono, Antonio Cheneler, David |
| Author_xml | – sequence: 1 givenname: Tomas orcidid: 0000-0002-7454-6511 surname: Fried fullname: Fried, Tomas email: t.fried@lancaster.ac.uk organization: Engineering Department, Lancaster University, LA1 4YW, UK – sequence: 2 givenname: Antonio orcidid: 0000-0001-5406-9909 surname: Di Buono fullname: Di Buono, Antonio organization: Department of Electrical and Electronic Engineering, The University of Manchester, Manchester, M13 9PL, UK – sequence: 3 givenname: David surname: Cheneler fullname: Cheneler, David organization: Engineering Department, Lancaster University, LA1 4YW, UK – sequence: 4 givenname: Neil surname: Cockbain fullname: Cockbain, Neil organization: National Nuclear Laboratory, Workington, CA14 3YQ, UK – sequence: 5 givenname: Jonathan M. surname: Dodds fullname: Dodds, Jonathan M. organization: National Nuclear Laboratory, Workington, CA14 3YQ, UK – sequence: 6 givenname: Peter R. surname: Green fullname: Green, Peter R. organization: Department of Electrical and Electronic Engineering, The University of Manchester, Manchester, M13 9PL, UK – sequence: 7 givenname: Barry surname: Lennox fullname: Lennox, Barry organization: Department of Electrical and Electronic Engineering, The University of Manchester, Manchester, M13 9PL, UK – sequence: 8 givenname: C. James orcidid: 0000-0002-5247-5193 surname: Taylor fullname: Taylor, C. James organization: Engineering Department, Lancaster University, LA1 4YW, UK – sequence: 9 givenname: Stephen D. surname: Monk fullname: Monk, Stephen D. organization: Engineering Department, Lancaster University, LA1 4YW, UK |
| BackLink | https://www.kci.go.kr/kciportal/ci/sereArticleSearch/ciSereArtiView.kci?sereArticleSearchBean.artiId=ART002756094$$DAccess content in National Research Foundation of Korea (NRF) |
| BookMark | eNp9kU1rGzEQhkVJoLaTH9DbXgvdjb61S0_BtKkhJRASyE3oY9aRs14VSbTk30e2Sw895DIDwzwvM--7RGdznAGhTwR3BBN5tetmKB3FlHRYdBiLD2hBKeMtE_3TGVoQxfpWKMY-omXOO4wl5wov0M9744MpIc5NgVzCvG3i2EzxT-NiLl9q3e8huWCmOh-b8gxNfoZpbPbBpejiXFKcJkiNjSb5C3Q-minD5d--Qo_fvz2sf7S3dzeb9fVt6zjHpSXCS0sJMYxzS8ggBadYSTMaqcA7ZSmzDCvbD1IJMN56Ab0YBqfcgNnI2Ap9PunOadQvLuhowrFvo35J-vr-YaOHXlLOSd3dnHZ9NDv9K4W9Sa9H4DiIaatNKsFNoIlyvTd-cMxzLqzvq2GDxIrb3ktDfdUiJ636e84Jxn96BOtDDnqnaw76kIPGQtccKqP-Y1woR8dLMmF6l_x6IqFa-TtA0tkFmB34kMCVen94h34DXEmj0g |
| CitedBy_id | crossref_primary_10_1016_j_net_2022_06_028 crossref_primary_10_1145_3695247 crossref_primary_10_1016_j_net_2023_07_041 crossref_primary_10_1016_j_net_2022_08_021 |
| Cites_doi | 10.1016/j.envpol.2017.10.098 10.1016/j.net.2020.01.017 10.1016/j.net.2017.09.002 10.1016/j.pnucene.2018.10.023 10.1109/TNS.2006.885377 10.1108/01439911111106327 10.1109/23.340597 10.1016/j.net.2018.07.010 |
| ContentType | Journal Article |
| Copyright | 2021 Korean Nuclear Society |
| Copyright_xml | – notice: 2021 Korean Nuclear Society |
| DBID | 6I. AAFTH AAYXX CITATION DOA ACYCR |
| DOI | 10.1016/j.net.2021.05.005 |
| DatabaseName | ScienceDirect Open Access Titles Elsevier:ScienceDirect:Open Access CrossRef DOAJ Directory of Open Access Journals Korean Citation Index |
| DatabaseTitle | CrossRef |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: DOA name: Directory of Open Access Journals url: https://www.doaj.org/ sourceTypes: Open Website |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| EISSN | 2234-358X |
| EndPage | 3343 |
| ExternalDocumentID | oai_kci_go_kr_ARTI_9862441 oai_doaj_org_article_17c8dad9c3d445bd857396074b8d6a2d 10_1016_j_net_2021_05_005 S1738573321002564 |
| GroupedDBID | .UV 0R~ 0SF 123 4.4 457 5VS 6I. 9ZL AACTN AAEDW AAFTH AALRI AAXUO ABMAC ACGFS ACYCR ADBBV ADEZE AENEX AEXQZ AFTJW AGHFR AITUG ALMA_UNASSIGNED_HOLDINGS AMRAJ BCNDV EBS EJD FDB GROUPED_DOAJ IPNFZ JDI KQ8 KVFHK M41 NCXOZ O9- OK1 RIG ROL SSZ AAYWO AAYXX ACVFH ADCNI ADVLN AEUPX AFPUW AIGII AKBMS AKRWK AKYEP CITATION |
| ID | FETCH-LOGICAL-c440t-15d6b211a344b1196542076afa67edc7b23b307b89675eadbd5e8599c7c903f33 |
| IEDL.DBID | DOA |
| ISSN | 1738-5733 |
| IngestDate | Tue Nov 21 21:05:07 EST 2023 Wed Aug 27 01:03:38 EDT 2025 Thu Apr 24 23:07:39 EDT 2025 Tue Jul 01 01:28:30 EDT 2025 Wed May 17 00:02:56 EDT 2023 |
| IsDoiOpenAccess | true |
| IsOpenAccess | true |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 10 |
| Keywords | Radiation effects Nuclear decommissioning Total ionizing dose Microcontroller |
| Language | English |
| License | This is an open access article under the CC BY license. |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c440t-15d6b211a344b1196542076afa67edc7b23b307b89675eadbd5e8599c7c903f33 |
| ORCID | 0000-0001-5406-9909 0000-0002-7454-6511 0000-0002-5247-5193 |
| OpenAccessLink | https://doaj.org/article/17c8dad9c3d445bd857396074b8d6a2d |
| PageCount | 9 |
| ParticipantIDs | nrf_kci_oai_kci_go_kr_ARTI_9862441 doaj_primary_oai_doaj_org_article_17c8dad9c3d445bd857396074b8d6a2d crossref_primary_10_1016_j_net_2021_05_005 crossref_citationtrail_10_1016_j_net_2021_05_005 elsevier_sciencedirect_doi_10_1016_j_net_2021_05_005 |
| ProviderPackageCode | CITATION AAYXX |
| PublicationCentury | 2000 |
| PublicationDate | October 2021 2021-10-00 2021-10-01 2021-10 |
| PublicationDateYYYYMMDD | 2021-10-01 |
| PublicationDate_xml | – month: 10 year: 2021 text: October 2021 |
| PublicationDecade | 2020 |
| PublicationTitle | Nuclear engineering and technology |
| PublicationYear | 2021 |
| Publisher | Elsevier B.V Elsevier 한국원자력학회 |
| Publisher_xml | – name: Elsevier B.V – name: Elsevier – name: 한국원자력학회 |
| References | VORAGO Technologies (bib25) Wilson, Von Thun, Baranski, Anderson, Turnbull (bib18) 2018 Quinn, Fairbanks, Tripp, Duran, Lopez (bib16) 2014 Di Mascio, Menicucci, Furano, Szewczyk, Campajola, Di Capua, Lucaroni, Ottavi (bib19) 2018; 50 Beaucour, Carriere, Gach, Laxague (bib8) 1994; 41 PJRC (bib21) 2020 Bogue (bib6) 2011; 38 Xiaoming, Qiang, Chao, Shanchao, Ruibin, Xiaoyan, Yan, Guizhen, Dongsheng, Wei, Lili (bib15) 2013 Tsitsimpelis, Taylor, Lennox, Joyce (bib5) 2019; 111 Nancekievill, Watson, Green, Lennox (bib13) 2016 Abare, Brueggeman, Pease, Krieg, Simons (bib10) 2002 Boetti, Jarron, Kisielewski, Faccio (bib12) 2002 (bib2) 2018 NIRAB (bib1) 2017 Guertin, Amrbar, Vartanian (bib17) 2015 Department of Defense (bib20) 2017 Ibrahim, Abd El-Azeem, El-Ghanam, Soliman (bib9) 2020; 52 Microchip Technology Inc (bib24) 2020 (bib22) 2017 Nancekievill, Espinosa, Watson, Lennox, Jones, Joyce, Katakura, Okumura, Kamada, Katoh, Nishimura (bib7) 2019 Connor, Martin, Smith, Payne, Hutson, Payton, Yamashiki, Scott (bib4) 2018; 234 Huntingdon (bib3) 2020 Microchip Technology Inc (bib23) 2020 Ramachandran, Narasimham, Fleetwood, Schrimpf, Holman, Witulski, Pease, Dunham, Seiler, Platteter (bib11) 2006; 53 Nidhin, Bhattacharyya, Behera, Jayanthi, Velusamy (bib14) 2017; 49 Microchip Technology Inc (10.1016/j.net.2021.05.005_bib23) Xiaoming (10.1016/j.net.2021.05.005_bib15) 2013 Bogue (10.1016/j.net.2021.05.005_bib6) 2011; 38 Microchip Technology Inc (10.1016/j.net.2021.05.005_bib24) VORAGO Technologies (10.1016/j.net.2021.05.005_bib25) Connor (10.1016/j.net.2021.05.005_bib4) 2018; 234 Abare (10.1016/j.net.2021.05.005_bib10) 2002 Ibrahim (10.1016/j.net.2021.05.005_bib9) 2020; 52 NIRAB (10.1016/j.net.2021.05.005_bib1) Tsitsimpelis (10.1016/j.net.2021.05.005_bib5) 2019; 111 Nidhin (10.1016/j.net.2021.05.005_bib14) 2017; 49 Nancekievill (10.1016/j.net.2021.05.005_bib7) 2019 Ramachandran (10.1016/j.net.2021.05.005_bib11) 2006; 53 (10.1016/j.net.2021.05.005_bib2) 2018 Nancekievill (10.1016/j.net.2021.05.005_bib13) 2016 Wilson (10.1016/j.net.2021.05.005_bib18) 2018 Department of Defense (10.1016/j.net.2021.05.005_bib20) PJRC (10.1016/j.net.2021.05.005_bib21) Boetti (10.1016/j.net.2021.05.005_bib12) 2002 Guertin (10.1016/j.net.2021.05.005_bib17) 2015 Beaucour (10.1016/j.net.2021.05.005_bib8) 1994; 41 Huntingdon (10.1016/j.net.2021.05.005_bib3) 2020 Quinn (10.1016/j.net.2021.05.005_bib16) 2014 Di Mascio (10.1016/j.net.2021.05.005_bib19) 2018; 50 |
| References_xml | – start-page: 177 year: 2002 end-page: 180 ident: bib10 article-title: Comparative analysis of low dose-rate, accelerated, and standard cobalt-60 radiation response data for a low-dropout voltage regulator and a voltage reference publication-title: IEEE Radiat. Eff. Data Work. – start-page: 1 year: 2013 end-page: 4 ident: bib15 article-title: Radiation effect in CMOS microprocessor exposed to intense mixed neutron and gamma radiation field publication-title: Proc. Eur. Conf. Radiat. Its Eff. Components Syst. RADECS – year: 2020 ident: bib3 article-title: The NDA's ‘Grand Challenges’ for Technical Innovation - Cleaning up Our Nuclear Past: Faster, Safer and Sooner – year: 2017 ident: bib22 article-title: NXP semiconductors, kinetis K66 sub-family 180 MHz ARM® cortex®-M4F microcontroller – year: 2018 ident: bib2 publication-title: Department for Business Energy and Industrial Strategy, Industrial Strategy Nuclear Sector Deal – start-page: 1 year: 2018 end-page: 7 ident: bib18 article-title: Radiation effects characterization of an arm®-based 32-bit microcontroller publication-title: IEEE Nucl. Sp. Radiat. Eff. Conf. NSREC – volume: 41 start-page: 2420 year: 1994 end-page: 2426 ident: bib8 article-title: Total dose effects on negative voltage regulator publication-title: IEEE Trans. Nucl. Sci. – volume: 50 start-page: 1298 year: 2018 end-page: 1305 ident: bib19 article-title: Towards defining a simplified procedure for COTS system-on-chip TID testing publication-title: Nucl. Eng. Technol. – ident: bib25 article-title: VORAGO Products - VORAGO Technologies, (n.d.) – volume: 49 start-page: 1589 year: 2017 end-page: 1599 ident: bib14 article-title: Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plants publication-title: Nucl. Eng. Technol. – volume: 111 start-page: 109 year: 2019 end-page: 124 ident: bib5 article-title: A review of ground-based robotic systems for the characterization of nuclear environments publication-title: Prog. Nucl. Energy – year: 2020 ident: bib24 article-title: SAM3X8ERT - tolerant devices – volume: 53 start-page: 3223 year: 2006 end-page: 3231 ident: bib11 article-title: Modeling total-dose effects for a low-dropout voltage regulator publication-title: IEEE Trans. Nucl. Sci. – start-page: 115 year: 2002 end-page: 119 ident: bib12 article-title: Radiation performance of the L4913 voltage regulator publication-title: IEEE Radiat. Eff. Data Work. – start-page: 1 year: 2014 end-page: 9 ident: bib16 article-title: Single-event effects in low-cost, low-power microprocessors publication-title: IEEE Radiat. Eff. Data Work. – year: 2020 ident: bib23 article-title: SAMV71Q21RT - tolerant devices – year: 2017 ident: bib20 article-title: MIL-STD-883K w/CHANGE 2 – year: 2020 ident: bib21 article-title: Electronic projects, Teensy and Teensy++ schematic diagrams – start-page: 19 year: 2019 ident: bib7 article-title: Detection of simulated fukushima daichii fuel debris using a remotely operated vehicle at the naraha test facility publication-title: Sensors – start-page: 1 year: 2015 end-page: 9 ident: bib17 article-title: Radiation test results for common CubeSat microcontrollers and microprocessors publication-title: IEEE Radiat. Eff. Data Work. – volume: 52 start-page: 1764 year: 2020 end-page: 1770 ident: bib9 article-title: Studying the operation of MOSFET RC-phase shift oscillator under different environmental conditions publication-title: Nucl. Eng. Technol. – volume: 234 start-page: 610 year: 2018 end-page: 619 ident: bib4 article-title: Application of airborne photogrammetry for the visualisation and assessment of contamination migration arising from a Fukushima waste storage facility publication-title: Environ. Pollut. – start-page: 1 year: 2016 end-page: 5 ident: bib13 article-title: Radiation Tolerance of Commercial-Off-The-Shelf Components Deployed in an Underground Nuclear Decommissioning Embedded System – year: 2017 ident: bib1 article-title: The UK civil nuclear R&D landscape survey (february 2017) – volume: 38 start-page: 113 year: 2011 end-page: 118 ident: bib6 article-title: Robots in the nuclear industry: a review of technologies and applications publication-title: Ind. Robot – year: 2020 ident: 10.1016/j.net.2021.05.005_bib3 – start-page: 1 year: 2018 ident: 10.1016/j.net.2021.05.005_bib18 article-title: Radiation effects characterization of an arm®-based 32-bit microcontroller publication-title: IEEE Nucl. Sp. Radiat. Eff. Conf. NSREC – ident: 10.1016/j.net.2021.05.005_bib20 – ident: 10.1016/j.net.2021.05.005_bib1 – volume: 234 start-page: 610 year: 2018 ident: 10.1016/j.net.2021.05.005_bib4 article-title: Application of airborne photogrammetry for the visualisation and assessment of contamination migration arising from a Fukushima waste storage facility publication-title: Environ. Pollut. doi: 10.1016/j.envpol.2017.10.098 – volume: 52 start-page: 1764 year: 2020 ident: 10.1016/j.net.2021.05.005_bib9 article-title: Studying the operation of MOSFET RC-phase shift oscillator under different environmental conditions publication-title: Nucl. Eng. Technol. doi: 10.1016/j.net.2020.01.017 – volume: 49 start-page: 1589 year: 2017 ident: 10.1016/j.net.2021.05.005_bib14 article-title: Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plants publication-title: Nucl. Eng. Technol. doi: 10.1016/j.net.2017.09.002 – start-page: 177 year: 2002 ident: 10.1016/j.net.2021.05.005_bib10 article-title: Comparative analysis of low dose-rate, accelerated, and standard cobalt-60 radiation response data for a low-dropout voltage regulator and a voltage reference – start-page: 1 year: 2014 ident: 10.1016/j.net.2021.05.005_bib16 article-title: Single-event effects in low-cost, low-power microprocessors – start-page: 1 year: 2016 ident: 10.1016/j.net.2021.05.005_bib13 – volume: 111 start-page: 109 year: 2019 ident: 10.1016/j.net.2021.05.005_bib5 article-title: A review of ground-based robotic systems for the characterization of nuclear environments publication-title: Prog. Nucl. Energy doi: 10.1016/j.pnucene.2018.10.023 – ident: 10.1016/j.net.2021.05.005_bib21 – volume: 53 start-page: 3223 year: 2006 ident: 10.1016/j.net.2021.05.005_bib11 article-title: Modeling total-dose effects for a low-dropout voltage regulator publication-title: IEEE Trans. Nucl. Sci. doi: 10.1109/TNS.2006.885377 – volume: 38 start-page: 113 year: 2011 ident: 10.1016/j.net.2021.05.005_bib6 article-title: Robots in the nuclear industry: a review of technologies and applications publication-title: Ind. Robot doi: 10.1108/01439911111106327 – start-page: 1 year: 2013 ident: 10.1016/j.net.2021.05.005_bib15 article-title: Radiation effect in CMOS microprocessor exposed to intense mixed neutron and gamma radiation field publication-title: Proc. Eur. Conf. Radiat. Its Eff. Components Syst. RADECS – start-page: 1 year: 2015 ident: 10.1016/j.net.2021.05.005_bib17 article-title: Radiation test results for common CubeSat microcontrollers and microprocessors – ident: 10.1016/j.net.2021.05.005_bib24 – start-page: 19 year: 2019 ident: 10.1016/j.net.2021.05.005_bib7 article-title: Detection of simulated fukushima daichii fuel debris using a remotely operated vehicle at the naraha test facility publication-title: Sensors – start-page: 115 year: 2002 ident: 10.1016/j.net.2021.05.005_bib12 article-title: Radiation performance of the L4913 voltage regulator – ident: 10.1016/j.net.2021.05.005_bib23 – year: 2018 ident: 10.1016/j.net.2021.05.005_bib2 – volume: 41 start-page: 2420 year: 1994 ident: 10.1016/j.net.2021.05.005_bib8 article-title: Total dose effects on negative voltage regulator publication-title: IEEE Trans. Nucl. Sci. doi: 10.1109/23.340597 – volume: 50 start-page: 1298 year: 2018 ident: 10.1016/j.net.2021.05.005_bib19 article-title: Towards defining a simplified procedure for COTS system-on-chip TID testing publication-title: Nucl. Eng. Technol. doi: 10.1016/j.net.2018.07.010 – ident: 10.1016/j.net.2021.05.005_bib25 |
| SSID | ssj0064470 |
| Score | 2.2543583 |
| Snippet | The impact of gamma radiation on a commercial off the shelf microcontroller board has been investigated. Three different tests have been performed to ascertain... |
| SourceID | nrf doaj crossref elsevier |
| SourceType | Open Website Enrichment Source Index Database Publisher |
| StartPage | 3335 |
| SubjectTerms | Microcontroller Nuclear decommissioning Radiation effects Total ionizing dose 원자력공학 |
| Title | Radiation testing of low cost, commercial off the shelf microcontroller board |
| URI | https://dx.doi.org/10.1016/j.net.2021.05.005 https://doaj.org/article/17c8dad9c3d445bd857396074b8d6a2d https://www.kci.go.kr/kciportal/ci/sereArticleSearch/ciSereArtiView.kci?sereArticleSearchBean.artiId=ART002756094 |
| Volume | 53 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| ispartofPNX | Nuclear Engineering and Technology, 2021, 53(10), , pp.3335-3343 |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwrV1LT9wwELbKnsoBQR9ieVQW6gk1ahKPE-cICESpqAQCiZsVvxbYJUG7Qfz9zuSBtpfthYsjWU5sjWc8M87MN4x9J7yTBEwZJZkPEQhAmVMUI4beSGpQxIqUkpMv_2Tnt3BxJ--WSn1RTFgHD9wR7meSW-VKV1jhAKRxSuYCre4cjHJZmTo6fVHnDc5Udwajks-7VEgUZ0L8G_5ntpFd6POjY5gmLWQn1a1b0kgtcP8_immtmocllXO2yTZ6W5EfdWvcYh989YmtLyEIfmaX14QtQMTlDeFlVBNeBz6rX7mtF80PbOlimq7FsT9wtPb44t7PAn-iQLw-Tn3m59zUyCpf2O3Z6c3JedRXSIgsQNxEiXSZQReuFAAmIXBASOM8K0OZ5d7Z3KTCoBAbVaBfgDxjnPRKFoXNbRGLIMRXNqrqym8zngUZBATnpbdgIBiVFg7PvhKsc2DVmMUDlbTt4cOpisVMD3FijxoJq4mwOpYaCTtmh2-vPHfYGasGHxPp3wYS7HXbgcyge2bQ_2OGMYNh43RvQXSWAX7qYdXcB7jJemof2mnpOan1dK7Rp_ilC8qhgWTnPRa4yz7SvF004B4bNfMXv49WTWO-tQyM7e8r9RdhTfLS |
| linkProvider | Directory of Open Access Journals |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Radiation+testing+of+low+cost%2C+commercial+off+the+shelf+microcontroller+board&rft.jtitle=Nuclear+engineering+and+technology&rft.au=Tomas+Fried&rft.au=Antonio+Di+Buono&rft.au=David+Cheneler&rft.au=Neil+Cockbain&rft.date=2021-10-01&rft.pub=Elsevier&rft.issn=1738-5733&rft.volume=53&rft.issue=10&rft.spage=3335&rft.epage=3343&rft_id=info:doi/10.1016%2Fj.net.2021.05.005&rft.externalDBID=DOA&rft.externalDocID=oai_doaj_org_article_17c8dad9c3d445bd857396074b8d6a2d |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1738-5733&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1738-5733&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1738-5733&client=summon |