Ink-jet printing of organic semiconductor for fabricating organic thin-film transistors: Film uniformity control by ink composition
We have investigated the influence of solvent chemistry on ink-jet printed semiconductor patterns. Our research focuses on improving the uniformity of an ink-jet printed single dot semiconductor by adjusting the solvent mixture combination. Use of a solvent mixture with one solvent of a lower boilin...
Saved in:
| Published in | Synthetic metals Vol. 159; no. 13; pp. 1381 - 1385 |
|---|---|
| Main Authors | , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Amsterdam
Elsevier B.V
01.07.2009
Elsevier |
| Subjects | |
| Online Access | Get full text |
Cover
Loading…
| Abstract | We have investigated the influence of solvent chemistry on ink-jet printed semiconductor patterns. Our research focuses on improving the uniformity of an ink-jet printed single dot semiconductor by adjusting the solvent mixture combination. Use of a solvent mixture with one solvent of a lower boiling point and a higher solubility with respect to the semiconductor molecules and another of a higher boiling point and a lower solubility allows us to produce a uniform single dot pattern by ink-jet printing. It was observed that the film uniformity of the semiconductor layer plays an important role in determining the electrical parameters of the transistor. In comparison with uncontrolled ink composition, the OTFT fabricated from the well-controlled ink exhibited better device performance, including a carrier mobility of 8.5
×
10
−3
cm
2
V
−1
s
−1 in the saturation regime, an on/off current ratio of 10
3, and a threshold voltage of 0.39
V with subthreshold slopes of 0.95
V
dec
−1. |
|---|---|
| AbstractList | We have investigated the influence of solvent chemistry on ink-jet printed semiconductor patterns. Our research focuses on improving the uniformity of an ink-jet printed single dot semiconductor by adjusting the solvent mixture combination. Use of a solvent mixture with one solvent of a lower boiling point and a higher solubility with respect to the semiconductor molecules and another of a higher boiling point and a lower solubility allows us to produce a uniform single dot pattern by ink-jet printing. It was observed that the film uniformity of the semiconductor layer plays an important role in determining the electrical parameters of the transistor. In comparison with uncontrolled ink composition, the OTFT fabricated from the well-controlled ink exhibited better device performance, including a carrier mobility of 8.5
×
10
−3
cm
2
V
−1
s
−1 in the saturation regime, an on/off current ratio of 10
3, and a threshold voltage of 0.39
V with subthreshold slopes of 0.95
V
dec
−1. We have investigated the influence of solvent chemistry on ink-jet printed semiconductor patterns. Our research focuses on improving the uniformity of an ink-jet printed single dot semiconductor by adjusting the solvent mixture combination. Use of a solvent mixture with one solvent of a lower boiling point and a higher solubility with respect to the semiconductor molecules and another of a higher boiling point and a lower solubility allows us to produce a uniform single dot pattern by ink-jet printing. It was observed that the film uniformity of the semiconductor layer plays an important role in determining the electrical parameters of the transistor. In comparison with uncontrolled ink composition, the OTFT fabricated from the well-controlled ink exhibited better device performance, including a carrier mobility of 8.5x10(-(3cm(2)V(-(1s(-(1 in the saturation regime, an on/off current ratio of 10(3), and a threshold voltage of 0.39V with subthreshold slopes of 0.95Vdec(-(1. |
| Author | Jeong, Sunho Kim, Dongjo Song, Jun Kwang Lee, Seong Hui Moon, Jooho |
| Author_xml | – sequence: 1 givenname: Dongjo surname: Kim fullname: Kim, Dongjo organization: Department of Materials Science and Engineering, Yonsei University, 134 Shinchon-dong Seodaemun-gu, Seoul 120-749, Republic of Korea – sequence: 2 givenname: Sunho surname: Jeong fullname: Jeong, Sunho organization: Department of Materials Science and Engineering, Yonsei University, 134 Shinchon-dong Seodaemun-gu, Seoul 120-749, Republic of Korea – sequence: 3 givenname: Seong Hui surname: Lee fullname: Lee, Seong Hui organization: Department of Materials Science and Engineering, Yonsei University, 134 Shinchon-dong Seodaemun-gu, Seoul 120-749, Republic of Korea – sequence: 4 givenname: Jooho surname: Moon fullname: Moon, Jooho email: jmoon@yonsei.ac.kr organization: Department of Materials Science and Engineering, Yonsei University, 134 Shinchon-dong Seodaemun-gu, Seoul 120-749, Republic of Korea – sequence: 5 givenname: Jun Kwang surname: Song fullname: Song, Jun Kwang organization: Material Testing Team, Korea Testing Laboratory, 222-13 Guro-dong, Guro-gu, Seoul 152-718, Republic of Korea |
| BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=21723135$$DView record in Pascal Francis |
| BookMark | eNqFkE1v1DAQhi1UJLaFv4B8gVu2thMnNidQ1UKlSlzgbDnOuJ1tYi-2F2nP_HEc7dIr0lj-0PPOyM8luQgxACHvOdtyxvvr3TYfQ3laoGwFY3rLRC35imy4GnTTCs0uyIa19dwPg35DLnPeMca4FnJD_tyH52YHhe4ThoLhkUZPY3q0AR3NsKCLYTq4EhP167JjQmdP4JkqTxgaj_NCS7IhY65w_kTv1pdDwBpbsBxpbVRSnOl4pBie63XZx4wFY3hLXns7Z3h33q_Iz7vbHzffmofvX-9vvjw0rmt1aZTspJd69LZnIGSvlLYTKMUnANYLDVIJ3rFx7HhrBQcnPEimrB4BpPRDe0U-nvruU_x1gFzMgtnBPNsA8ZBN2_XtoASrYH8CXYo5J_Cm2llsOhrOzOrc7Mw_52Z1bpioJWvww3mCzc7OvvpwmF_Sgg-i5e3KfT5xUL_7GyGZ7BCCgwkTuGKmiP8b9RdUC6EH |
| CODEN | SYMEDZ |
| CitedBy_id | crossref_primary_10_1021_jp200972y crossref_primary_10_1108_PRT_05_2019_0043 crossref_primary_10_1016_j_synthmet_2011_08_004 crossref_primary_10_1088_2058_8585_aa8ac3 crossref_primary_10_1002_marc_201900569 crossref_primary_10_3139_146_110260 crossref_primary_10_1002_adma_201001697 crossref_primary_10_1007_s10853_012_6923_z crossref_primary_10_7567_JJAP_52_031601 crossref_primary_10_1143_JJAP_49_05EB06 crossref_primary_10_1039_C5TC02737C crossref_primary_10_1016_j_solener_2010_03_016 |
| Cites_doi | 10.1016/S0379-6779(03)00186-3 10.1021/la053450j 10.1002/1521-4095(20020116)14:2<99::AID-ADMA99>3.0.CO;2-9 10.1002/marc.200500493 10.1063/1.2140586 10.1016/j.susc.2005.08.007 10.1021/cm970627p 10.1016/S0040-6090(02)01295-6 10.1021/jp0118322 10.1016/j.synthmet.2004.08.010 10.1021/la049469o 10.1002/adma.200401672 10.1039/b407478e 10.1038/39827 10.1016/S0167-9317(04)00225-4 10.1063/1.2437684 10.1149/1.2783765 10.1063/1.2424671 10.1002/adma.200400690 10.1063/1.1944224 10.1002/adma.200300385 10.1126/science.290.5499.2123 |
| ContentType | Journal Article |
| Copyright | 2009 Elsevier B.V. 2009 INIST-CNRS |
| Copyright_xml | – notice: 2009 Elsevier B.V. – notice: 2009 INIST-CNRS |
| DBID | IQODW AAYXX CITATION 8BQ 8FD JG9 |
| DOI | 10.1016/j.synthmet.2009.02.025 |
| DatabaseName | Pascal-Francis CrossRef METADEX Technology Research Database Materials Research Database |
| DatabaseTitle | CrossRef Materials Research Database Technology Research Database METADEX |
| DatabaseTitleList | Materials Research Database |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering Chemistry Physics Applied Sciences |
| EISSN | 1879-3290 |
| EndPage | 1385 |
| ExternalDocumentID | 10_1016_j_synthmet_2009_02_025 21723135 S0379677909001209 |
| GroupedDBID | --K --M -~X .~1 0R~ 123 1B1 1~. 1~5 29Q 4.4 457 4G. 53G 5VS 7-5 71M 8P~ 9JN AABNK AABXZ AACTN AAEDT AAEDW AAEPC AAIAV AAIKJ AAKOC AALRI AAOAW AAQFI AAQXK AAXUO ABFNM ABFRF ABJNI ABMAC ABXDB ABXRA ABYKQ ACBEA ACDAQ ACGFO ACGFS ACIWK ACNNM ACRLP ADBBV ADEZE ADMUD AEBSH AEFWE AEKER AENEX AEZYN AFKWA AFRZQ AFTJW AGHFR AGUBO AGYEJ AHHHB AIEXJ AIKHN AITUG AJBFU AJOXV ALMA_UNASSIGNED_HOLDINGS AMFUW AMRAJ ASPBG AVWKF AXJTR AZFZN BKOJK BLXMC CS3 DU5 EBS EFJIC EFLBG EJD EO8 EO9 EP2 EP3 F5P FDB FEDTE FGOYB FIRID FNPLU FYGXN G-2 G-Q GBLVA HVGLF HZ~ IHE J1W KOM M24 M41 MAGPM MO0 N9A O-L O9- OAUVE OZT P-8 P-9 P2P PC. Q38 R2- RIG RNS ROL RPZ SDF SDG SDP SES SEW SMS SPC SPCBC SPD SSM SSZ T5K UNMZH WH7 WUQ XFK XPP ZMT ~G- ABPIF ABPTK IQODW AAXKI AAYXX AFJKZ AKRWK CITATION 8BQ 8FD JG9 |
| ID | FETCH-LOGICAL-c439t-8545f59bfa60e256889ade881dee0629e582140bb413a21ec2fe508a9bee55f73 |
| IEDL.DBID | AIKHN |
| ISSN | 0379-6779 |
| IngestDate | Fri Aug 16 21:26:42 EDT 2024 Thu Sep 26 19:45:37 EDT 2024 Sun Oct 29 17:10:06 EDT 2023 Fri Feb 23 02:20:20 EST 2024 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 13 |
| Keywords | 68.55.am Ink-jet printing Organic thin-film transistor Ink 61.25.he 72.80.Le Organic semiconductor Solvent effect Voltage current curve Surface topography Oligomer Experimental study Property processing relationship Structure processing relationship Conjugated polymer Mixed solvent Tetramer Silicon Thiophene polymer Thin film transistor Ink jet printing Growth from solution |
| Language | English |
| License | CC BY 4.0 |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c439t-8545f59bfa60e256889ade881dee0629e582140bb413a21ec2fe508a9bee55f73 |
| Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
| PQID | 34637820 |
| PQPubID | 23500 |
| PageCount | 5 |
| ParticipantIDs | proquest_miscellaneous_34637820 crossref_primary_10_1016_j_synthmet_2009_02_025 pascalfrancis_primary_21723135 elsevier_sciencedirect_doi_10_1016_j_synthmet_2009_02_025 |
| PublicationCentury | 2000 |
| PublicationDate | 2009-07-01 |
| PublicationDateYYYYMMDD | 2009-07-01 |
| PublicationDate_xml | – month: 07 year: 2009 text: 2009-07-01 day: 01 |
| PublicationDecade | 2000 |
| PublicationPlace | Amsterdam |
| PublicationPlace_xml | – name: Amsterdam |
| PublicationTitle | Synthetic metals |
| PublicationYear | 2009 |
| Publisher | Elsevier B.V Elsevier |
| Publisher_xml | – name: Elsevier B.V – name: Elsevier |
| References | Sirringhaus, Kawase, Friend, Shimoda, Inbasekaran, Wu, Woo (bib2) 2000; 290 Lee, Byun, Koo, Kang, Lyu, Lee, Pu, Lee (bib6) 2005; 17 Dimitrakopoulos, Malenfant (bib1) 2002; 14 Katz, Lovinger, Laquindanum (bib11) 1998; 10 Liu, Varahramyan, Cui (bib5) 2005; 26 Wu, Li, Ong, Liu, Gardner, Chiang (bib3) 2005; 17 de Gans, Schubert (bib14) 2004; 20 Lim, Lee, Lee, Lee, Park, Cho (bib20) 2008; 18 Kim, Jeong, Park, Moon (bib16) 2006; 89 Kam, Seekamp, Solovyev, Clavijo Cedeno, Goldschmidt, Sotomayor Torres (bib18) 2004; 73/74 de Gans, Duineveld, Schubert (bib13) 2004; 16 Kim, Lee, Han, Han, Han (bib19) 2007; 154 Tekin, de Gans, Schubert (bib15) 2004; 14 Deegan, Bakajin, Dupont, Huber, Nagel, Witten (bib22) 1997; 389 Li, Chu, Newsome, Russell, Kugler, Ishida, Shimoda (bib4) 2005; 87 Hu, Larson (bib21) 2002; 106 Muck, Wagner, Bass, Leufgen, Geurts, Molenkamp (bib9) 2004; 146 Liu, Knupfer, Huisman (bib10) 2005; 595 Muck, Fritz, Wagner (bib7) 2005; 86 Park, Moon (bib23) 2006; 22 Breiby, Samuelsen, Konovalov (bib17) 2003; 139 Song, Choi, Kim, Jang, Kirchmeyer (bib12) 2007; 90 Amundson, Katz, Lovinger (bib8) 2003; 426 Amundson (10.1016/j.synthmet.2009.02.025_bib8) 2003; 426 Muck (10.1016/j.synthmet.2009.02.025_bib7) 2005; 86 Deegan (10.1016/j.synthmet.2009.02.025_bib22) 1997; 389 Muck (10.1016/j.synthmet.2009.02.025_bib9) 2004; 146 Liu (10.1016/j.synthmet.2009.02.025_bib5) 2005; 26 Lee (10.1016/j.synthmet.2009.02.025_bib6) 2005; 17 Breiby (10.1016/j.synthmet.2009.02.025_bib17) 2003; 139 Kim (10.1016/j.synthmet.2009.02.025_bib16) 2006; 89 Dimitrakopoulos (10.1016/j.synthmet.2009.02.025_bib1) 2002; 14 Kam (10.1016/j.synthmet.2009.02.025_bib18) 2004; 73/74 Sirringhaus (10.1016/j.synthmet.2009.02.025_bib2) 2000; 290 Hu (10.1016/j.synthmet.2009.02.025_bib21) 2002; 106 Li (10.1016/j.synthmet.2009.02.025_bib4) 2005; 87 Park (10.1016/j.synthmet.2009.02.025_bib23) 2006; 22 Wu (10.1016/j.synthmet.2009.02.025_bib3) 2005; 17 Lim (10.1016/j.synthmet.2009.02.025_bib20) 2008; 18 Kim (10.1016/j.synthmet.2009.02.025_bib19) 2007; 154 Katz (10.1016/j.synthmet.2009.02.025_bib11) 1998; 10 de Gans (10.1016/j.synthmet.2009.02.025_bib14) 2004; 20 Liu (10.1016/j.synthmet.2009.02.025_bib10) 2005; 595 Tekin (10.1016/j.synthmet.2009.02.025_bib15) 2004; 14 de Gans (10.1016/j.synthmet.2009.02.025_bib13) 2004; 16 Song (10.1016/j.synthmet.2009.02.025_bib12) 2007; 90 |
| References_xml | – volume: 426 start-page: 140 year: 2003 ident: bib8 publication-title: Thin Solid Films contributor: fullname: Lovinger – volume: 154 start-page: H995 year: 2007 ident: bib19 publication-title: J. Electrochem. Soc. contributor: fullname: Han – volume: 26 start-page: 1955 year: 2005 ident: bib5 publication-title: Macromol. Rapid Commun. contributor: fullname: Cui – volume: 20 start-page: 7789 year: 2004 ident: bib14 publication-title: Langmuir contributor: fullname: Schubert – volume: 17 start-page: 2180 year: 2005 ident: bib6 publication-title: Adv. Mater. contributor: fullname: Lee – volume: 139 start-page: 361 year: 2003 ident: bib17 publication-title: Synth. Met. contributor: fullname: Konovalov – volume: 87 start-page: 232111 year: 2005 ident: bib4 publication-title: Appl. Phys. Lett. contributor: fullname: Shimoda – volume: 595 start-page: 165 year: 2005 ident: bib10 publication-title: Surf. Sci. contributor: fullname: Huisman – volume: 146 start-page: 317 year: 2004 ident: bib9 publication-title: Synth. Met. contributor: fullname: Molenkamp – volume: 73/74 start-page: 809 year: 2004 ident: bib18 publication-title: Microelectron. Eng. contributor: fullname: Sotomayor Torres – volume: 17 start-page: 184 year: 2005 ident: bib3 publication-title: Adv. Mater. contributor: fullname: Chiang – volume: 10 start-page: 457 year: 1998 ident: bib11 publication-title: Chem. Mater. contributor: fullname: Laquindanum – volume: 22 start-page: 3506 year: 2006 ident: bib23 publication-title: Langmuir contributor: fullname: Moon – volume: 90 start-page: 053504 year: 2007 ident: bib12 publication-title: Appl. Phys. Lett. contributor: fullname: Kirchmeyer – volume: 86 start-page: 232101 year: 2005 ident: bib7 publication-title: Appl. Phys. Lett. contributor: fullname: Wagner – volume: 14 start-page: 2627 year: 2004 ident: bib15 publication-title: J. Mater. Chem. contributor: fullname: Schubert – volume: 290 start-page: 2123 year: 2000 ident: bib2 publication-title: Science contributor: fullname: Woo – volume: 18 start-page: 229 year: 2008 ident: bib20 publication-title: Adv. Mater. contributor: fullname: Cho – volume: 16 start-page: 203 year: 2004 ident: bib13 publication-title: Adv. Mater. contributor: fullname: Schubert – volume: 89 start-page: 264101 year: 2006 ident: bib16 publication-title: Appl. Phys. Lett. contributor: fullname: Moon – volume: 106 start-page: 1334 year: 2002 ident: bib21 publication-title: J. Phys. Chem. B contributor: fullname: Larson – volume: 14 start-page: 99 year: 2002 ident: bib1 publication-title: Adv. Mater. contributor: fullname: Malenfant – volume: 389 start-page: 827 year: 1997 ident: bib22 publication-title: Nature contributor: fullname: Witten – volume: 139 start-page: 361 year: 2003 ident: 10.1016/j.synthmet.2009.02.025_bib17 publication-title: Synth. Met. doi: 10.1016/S0379-6779(03)00186-3 contributor: fullname: Breiby – volume: 18 start-page: 229 year: 2008 ident: 10.1016/j.synthmet.2009.02.025_bib20 publication-title: Adv. Mater. contributor: fullname: Lim – volume: 22 start-page: 3506 year: 2006 ident: 10.1016/j.synthmet.2009.02.025_bib23 publication-title: Langmuir doi: 10.1021/la053450j contributor: fullname: Park – volume: 14 start-page: 99 year: 2002 ident: 10.1016/j.synthmet.2009.02.025_bib1 publication-title: Adv. Mater. doi: 10.1002/1521-4095(20020116)14:2<99::AID-ADMA99>3.0.CO;2-9 contributor: fullname: Dimitrakopoulos – volume: 26 start-page: 1955 year: 2005 ident: 10.1016/j.synthmet.2009.02.025_bib5 publication-title: Macromol. Rapid Commun. doi: 10.1002/marc.200500493 contributor: fullname: Liu – volume: 87 start-page: 232111 year: 2005 ident: 10.1016/j.synthmet.2009.02.025_bib4 publication-title: Appl. Phys. Lett. doi: 10.1063/1.2140586 contributor: fullname: Li – volume: 595 start-page: 165 year: 2005 ident: 10.1016/j.synthmet.2009.02.025_bib10 publication-title: Surf. Sci. doi: 10.1016/j.susc.2005.08.007 contributor: fullname: Liu – volume: 10 start-page: 457 year: 1998 ident: 10.1016/j.synthmet.2009.02.025_bib11 publication-title: Chem. Mater. doi: 10.1021/cm970627p contributor: fullname: Katz – volume: 426 start-page: 140 year: 2003 ident: 10.1016/j.synthmet.2009.02.025_bib8 publication-title: Thin Solid Films doi: 10.1016/S0040-6090(02)01295-6 contributor: fullname: Amundson – volume: 106 start-page: 1334 year: 2002 ident: 10.1016/j.synthmet.2009.02.025_bib21 publication-title: J. Phys. Chem. B doi: 10.1021/jp0118322 contributor: fullname: Hu – volume: 146 start-page: 317 year: 2004 ident: 10.1016/j.synthmet.2009.02.025_bib9 publication-title: Synth. Met. doi: 10.1016/j.synthmet.2004.08.010 contributor: fullname: Muck – volume: 20 start-page: 7789 year: 2004 ident: 10.1016/j.synthmet.2009.02.025_bib14 publication-title: Langmuir doi: 10.1021/la049469o contributor: fullname: de Gans – volume: 17 start-page: 2180 year: 2005 ident: 10.1016/j.synthmet.2009.02.025_bib6 publication-title: Adv. Mater. doi: 10.1002/adma.200401672 contributor: fullname: Lee – volume: 14 start-page: 2627 year: 2004 ident: 10.1016/j.synthmet.2009.02.025_bib15 publication-title: J. Mater. Chem. doi: 10.1039/b407478e contributor: fullname: Tekin – volume: 389 start-page: 827 year: 1997 ident: 10.1016/j.synthmet.2009.02.025_bib22 publication-title: Nature doi: 10.1038/39827 contributor: fullname: Deegan – volume: 73/74 start-page: 809 year: 2004 ident: 10.1016/j.synthmet.2009.02.025_bib18 publication-title: Microelectron. Eng. doi: 10.1016/S0167-9317(04)00225-4 contributor: fullname: Kam – volume: 90 start-page: 053504 year: 2007 ident: 10.1016/j.synthmet.2009.02.025_bib12 publication-title: Appl. Phys. Lett. doi: 10.1063/1.2437684 contributor: fullname: Song – volume: 154 start-page: H995 year: 2007 ident: 10.1016/j.synthmet.2009.02.025_bib19 publication-title: J. Electrochem. Soc. doi: 10.1149/1.2783765 contributor: fullname: Kim – volume: 89 start-page: 264101 year: 2006 ident: 10.1016/j.synthmet.2009.02.025_bib16 publication-title: Appl. Phys. Lett. doi: 10.1063/1.2424671 contributor: fullname: Kim – volume: 17 start-page: 184 year: 2005 ident: 10.1016/j.synthmet.2009.02.025_bib3 publication-title: Adv. Mater. doi: 10.1002/adma.200400690 contributor: fullname: Wu – volume: 86 start-page: 232101 year: 2005 ident: 10.1016/j.synthmet.2009.02.025_bib7 publication-title: Appl. Phys. Lett. doi: 10.1063/1.1944224 contributor: fullname: Muck – volume: 16 start-page: 203 year: 2004 ident: 10.1016/j.synthmet.2009.02.025_bib13 publication-title: Adv. Mater. doi: 10.1002/adma.200300385 contributor: fullname: de Gans – volume: 290 start-page: 2123 year: 2000 ident: 10.1016/j.synthmet.2009.02.025_bib2 publication-title: Science doi: 10.1126/science.290.5499.2123 contributor: fullname: Sirringhaus |
| SSID | ssj0001925 |
| Score | 2.0391774 |
| Snippet | We have investigated the influence of solvent chemistry on ink-jet printed semiconductor patterns. Our research focuses on improving the uniformity of an... |
| SourceID | proquest crossref pascalfrancis elsevier |
| SourceType | Aggregation Database Index Database Publisher |
| StartPage | 1381 |
| SubjectTerms | Application fields Applied sciences Electronics Exact sciences and technology Ink Ink-jet printing Organic semiconductor Organic thin-film transistor Polymer industry, paints, wood Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Technology of polymers Transistors |
| Title | Ink-jet printing of organic semiconductor for fabricating organic thin-film transistors: Film uniformity control by ink composition |
| URI | https://dx.doi.org/10.1016/j.synthmet.2009.02.025 https://search.proquest.com/docview/34637820 |
| Volume | 159 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1Lb9QwEB61WyFACMECojwWH7i6683T5latWG1B9AKVeotsx1F3YZ1Vkz300kv_ODOJU7VCiANSkoM1liPPaOZL_M0MwEcjtDWyTHkprORJhA-ZW8OrBC0os0LnXe3Ob6fZ8iz5cp6e78F8yIUhWmXw_b1P77x1GJmG3ZxuV6vpdxHnKqNyearPAN2HAwxHSTKCg-OTr8vTW4eMIKZjMqI8pwl3EoXXR82Vby82rg2lKyO80r_FqCdb3eDOVX3Liz-8dxeSFs_gacCS7Lh_3eew5_wYHs6HFm5jeHyn2uAYHnRsT9u8gJsT_5OvXcvorx7xnlldsb6_k2UN0eVrT3Vg60tW0a1N30yIBINUe7HyvFr92rCWol1XbKT5xBY0svOU7rVBfM8CE56ZK4YfvYwI7IEl9hLOFp9_zJc8dGPgFkFLyyVirSpVptKZcAiUpFS6dBLxrnMii5SjlNtEGINhUUczZ6PKIfrTyjiXplUev4KRr717DSyXQqLlyKiUCIgE-n5lyiRPnS3jbGbKQ5gO-19s-6IbxcBGWxeDxqiDpipEhFd6CGpQU3HPfAqMDP-cO7mn19slqXdXPItR4MOg6AIVSCcq2rt61xRxksVUcPDNfyz_Fh71J1REAX4Ho_Zy594j0GnNBPaPrmeTYM6_AbTFAns |
| link.rule.ids | 315,786,790,4521,24144,27955,27956,45618,45712 |
| linkProvider | Elsevier |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1Lb9QwELZKESoIIVhALY_WB67uevO0uaEVqy20vdBKvVm2Y6u7ZZ1Vkz300gt_nJnEgVYIcUBycrAmcuQZzXyJv5kh5IPh2hpR5aziVrAsgZsorWE-AwsqLNdlV7vz5LSYn2dfLvKLLTIdcmGQVhl9f-_TO28dZ8ZxN8frxWL8jaelLLBcnuwzQB-Qh4gGkNd1ePub5wEQpuMxgjRD8TtpwsvD5ia0lyvXxsKVCYz8bxHq6Vo3sG--b3jxh-_uAtLsOXkWkST91L_sC7LlwojsTIcGbiPy5E6twRF51HE9bfOS_DgKV2zpWor_9JD1TGtP--5OljZIlq8DVoGtr6nHS5u-lRAKRqn2chGYX3xf0RZjXVdqpPlIZzizCZjstQJ0TyMPnpobCp-8FOnrkSP2ipzPPp9N5yz2YmAWIEvLBCAtn0vjdcEdwCQhpK6cALTrHC8S6TDhNuPGQFDUycTZxDvAfloa5_Lcl-lrsh3q4HYJLQUXYDciqQTAIQ6eX5oqK3Nnq7SYmGqPjIf9V-u-5IYauGhLNWgM-2dKxRMY-R6Rg5rUPeNREBf--ez-Pb3-WhI7d6WTFAQOBkUrUCCep-jg6k2j0qxIsdzgm_9Y_oDszM9OjtXx0enXt-Rxf1aFZOB3ZLu93rj3AHlas9-Z9E8LrwNQ |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Ink-jet+printing+of+organic+semiconductor+for+fabricating+organic+thin-film+transistors%3A+Film+uniformity+control+by+ink+composition&rft.jtitle=Synthetic+metals&rft.au=Kim%2C+Dongjo&rft.au=Jeong%2C+Sunho&rft.au=Lee%2C+Seong+Hui&rft.au=Moon%2C+Jooho&rft.date=2009-07-01&rft.issn=0379-6779&rft.volume=159&rft.issue=13&rft.spage=1381&rft.epage=1385&rft_id=info:doi/10.1016%2Fj.synthmet.2009.02.025&rft.externalDBID=n%2Fa&rft.externalDocID=10_1016_j_synthmet_2009_02_025 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0379-6779&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0379-6779&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0379-6779&client=summon |