Understanding Interlayer Contact Conductance in Twisted Bilayer Graphene

• Published in: Small (Weinheim an der Bergstrasse, Germany) Vol. 16; no. 15; pp. e1902844 - n/a
• Main Authors: Yu, Zhiwei, Song, Aisheng, Sun, Luzhao, Li, Yanglizhi, Gao, Lei, Peng, Hailin, Ma, Tianbao, Liu, Zhongfan, Luo, Jianbin
• Format: Journal Article
• Language: English
• Published: Germany Wiley Subscription Services, Inc 01.04.2020
• Subjects: Atomic force microscopes; Atomic force microscopy; Bilayers; Carrier density; Chemical vapor deposition; Contact angle; C‐AFM; Decoupling; Density functional theory; Electric contacts; Electrical properties; Electronic devices; Graphene; interlayer contact conductance; Interlayers; Nanotechnology; Resistance; Stacking; Superlattices; twist angle; Two dimensional materials; interlayer contact conductance; C-AFM; graphene; twist angle

Bilayer or few‐layer 2D materials showing novel electrical properties in electronic device applications have aroused increasing interest in recent years. Obtaining a comprehensive understanding of interlayer contact conductance still remains a challenge, but is significant for improving the performa...