Understanding Interlayer Contact Conductance in Twisted Bilayer Graphene - Yu, Zhiwei; Song, Aisheng; Sun, Luzhao; Li, Yanglizhi; Gao, Lei; Peng, Hailin; Ma, Tianbao; Liu, Zhongfan; Luo, Jianbin (Small (Weinheim an der Bergstrasse, Germany), 2020)
Keywords: Atomic force microscopes; Atomic force microscopy; Bilayers; Carrier density; Chemical vapor deposition; Contact angle; C‐AFM; Decoupling; Density functional theory; Electric contacts; Electrical properties; Electronic devices; Graphene; interlayer contact conductance; Interlayers; Nanotechnology; Resistance; Stacking; Superlattices; twist angle; Two dimensional materials; interlayer contact conductance; C-AFM; graphene; twist angle