Electrostatic-free piezoresponse force microscopy

• Published in: Scientific reports Vol. 7; no. 1; p. 41657
• Main Authors: Kim, Sungho, Seol, Daehee, Lu, Xiaoli, Alexe, Marin, Kim, Yunseok
• Format: Journal Article
• Language: English
• Published: London Nature Publishing Group UK 31.01.2017; Nature Publishing Group
• Subjects: 639/301/119; 639/925; Atomic force microscopy; Electrostatic properties; Humanities and Social Sciences; Microscopes; Microscopy; multidisciplinary; Science; Surface properties

Contact and non-contact based atomic force microscopy (AFM) approaches have been extensively utilized to explore various nanoscale surface properties. In most AFM-based measurements, a concurrent electrostatic effect between the AFM tip/cantilever and sample surface can occur. This electrostatic eff...