Ultra-low-energy electron scattering cross section measurements of Ar, Kr and Xe employing the threshold photoelectron source

• Published in: The European physical journal. D, Atomic, molecular, and optical physics Vol. 66; no. 5
• Main Authors: Kitajima, M., Kurokawa, M., Kishino, T., Toyoshima, K., Odagiri, T., Kato, H., Anzai, K., Hoshino, M., Tanaka, H., Ito, K.
• Format: Journal Article
• Language: English
• Published: Berlin/Heidelberg Springer-Verlag 01.05.2012; EDP Sciences
• Subjects: Applications of Nonlinear Dynamics and Chaos Theory; Atomic; Atomic and molecular collision processes and interactions; Atomic and molecular physics; Elastic scattering of electrons by atoms and molecules; Electron scattering; Exact sciences and technology; Molecular; Optical and Plasma Physics; Physical Chemistry; Physics; Physics and Astronomy; Quantum Information Technology; Quantum Physics; Regular Article; Spectroscopy/Spectrometry; Spintronics; Topical issue: Electron/Positron Collision; Topical issue: Electron/Positron Collision. Guest editors: Michael Brunger, Anne Lafosse, Gaetana Laricchia, Paulo Limao-Vieira and Nigel Mason; Photoelectron; Momentum transfer; MeV range; Measuring methods; Momentum; Total cross sections; Electron-atom collisions; Rare gases Atoms

A new experimental technique for the measurements of the total cross section for electron scattering from atoms and molecules at very low energy is described. Momentum transfer cross sections for scattering from Ar, Kr and Xe at very low energies were carefully derived using the modified effective r...