Bridgman-Grown (Cd,Mn)Te and (Cd,Mn)(Te,Se): A Comparison of Suitability for X and Gamma Detectors

• Published in: Sensors (Basel, Switzerland) Vol. 24; no. 2; p. 345
• Main Authors: Masłowska, Aneta, Kochanowska, Dominika M, Sulich, Adrian, Domagala, Jaroslaw Z, Dopierała, Marcin, Kochański, Michał, Szot, Michał, Chromiński, Witold, Mycielski, Andrzej
• Format: Journal Article
• Language: English
• Published: Switzerland MDPI AG 06.01.2024; MDPI
• Subjects: annealing; Bridgman method; crystal growth; Crystals; Energy; Gamma rays; Grain boundaries; Investigations; Microscopy; photoluminescence; Radiation; Selenium; Sensors; X-ray and gamma-ray detectors; X-ray diffraction; XRD; X-ray diffraction; photoluminescence; XRD; crystal growth; annealing; X-ray and gamma-ray detectors

This study explores the suitability of (Cd,Mn)Te and (Cd,Mn)(Te,Se) as room-temperature X-ray and gamma-ray detector materials, grown using the Bridgman method. The investigation compares their crystal structure, mechanical and optical properties, and radiation detection capabilities. Both crystals...