An improved image processing algorithm for automatic defect inspection in TFT-LCD TCON - Yan, Liyuan; Cengiz, Korhan; Sharma, Amit (Nonlinear engineering, 2021)
Keywords: Algorithms; contrast; Crystal defects; Design defects; eror diffusion; Hardware; Image contrast; Image processing; Inspection; Liquid crystal displays; MATLAB; Medical imaging; RGB color model; Semiconductor devices; Thin film transistors; timing control