Cobalt Hexacyanoferrate as Cathode Material for Na+ Secondary Battery
We investigated structural and electrochemical properties of thin film electrodes of cobalt hexacyanoferrate, Na x Co[Fe(CN) 6 ] 0.90 2.9H 2 O, against $x$. The compound exhibits a high capacity of 135 mAh/g and an average operating voltage of 3.6 V against Na, with a good cyclability. The discharge...
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Published in | Applied physics express Vol. 6; no. 2; pp. 025802 - 025802-3 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
The Japan Society of Applied Physics
01.02.2013
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Online Access | Get full text |
ISSN | 1882-0778 1882-0786 |
DOI | 10.7567/APEX.6.025802 |
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Abstract | We investigated structural and electrochemical properties of thin film electrodes of cobalt hexacyanoferrate, Na x Co[Fe(CN) 6 ] 0.90 2.9H 2 O, against $x$. The compound exhibits a high capacity of 135 mAh/g and an average operating voltage of 3.6 V against Na, with a good cyclability. The discharge curve exhibits two plateaus at ${\approx}3.8$ and ${\approx}3.4$ V, which are ascribed to the reduction processes of Fe 3+ and Co 3+ , respectively. The ex situ X-ray diffraction (XRD) profiles reveal the robust nature of the host framework against Na + intercalation/deintercalation. Thus, cobalt hexacyanoferrate is a promising candidate for the cathode material of sodium-ion secondary battery (SIB). |
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AbstractList | We investigated structural and electrochemical properties of thin film electrodes of cobalt hexacyanoferrate, Na x Co[Fe(CN) 6 ] 0.90 2.9H 2 O, against $x$. The compound exhibits a high capacity of 135 mAh/g and an average operating voltage of 3.6 V against Na, with a good cyclability. The discharge curve exhibits two plateaus at ${\approx}3.8$ and ${\approx}3.4$ V, which are ascribed to the reduction processes of Fe 3+ and Co 3+ , respectively. The ex situ X-ray diffraction (XRD) profiles reveal the robust nature of the host framework against Na + intercalation/deintercalation. Thus, cobalt hexacyanoferrate is a promising candidate for the cathode material of sodium-ion secondary battery (SIB). |
Author | Takachi, Masamitsu Moritomo, Yutaka Matsuda, Tomoyuki |
Author_xml | – sequence: 1 givenname: Masamitsu surname: Takachi fullname: Takachi, Masamitsu organization: Graduate School of Pure and Applied Science, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan – sequence: 2 givenname: Tomoyuki surname: Matsuda fullname: Matsuda, Tomoyuki organization: Graduate School of Pure and Applied Science, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan – sequence: 3 givenname: Yutaka surname: Moritomo fullname: Moritomo, Yutaka organization: Graduate School of Pure and Applied Science, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan |
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Notes | Discharge curves of thin-film electrode of Na x Co[Fe(CN) 6 ] 0.90 2.9H 2 O measured at 0.6, 6, 40, and 60 C. The film thickness is 1.1 μm. The inset shows the jungle-gym-type host framework of Prussian blue analogues. Small spheres represent Co and Fe, while bars represent CN - . XRD pattern of Na x Co[Fe(CN) 6 ] 0.90 2.9H 2 O against $x$. Values in parentheses represent indexes in the face-centered cubic setting. (a) Discharge curves of thin-film electrode of Na x Co[Fe(CN) 6 ] 0.90 2.9H 2 O against $x$. (b) Lattice constant ($a$) of Na x Co[Fe(CN) 6 ] 0.90 2.9H 2 O against $x$. Open and closed circles denote data points obtained in the charge and discharge processes, respectively. Solid and broken lines in (b) indicate the results of the least-squares fittings in plateaus I and II, respectively. Cycle number dependence of charge (closed circles) and discharge (open circles) capacities ($Q$) of thin-film electrode of Na x Co[Fe(CN) 6 ] 0.90 2.9H 2 O. The charge rate is at 0.6 C. The film thickness is 1.1 μm. The inset shows charge/discharge curves of the thin-film electrode of Na x Co[Fe(CN) 6 ] 0.90 2.9H 2 O. |
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References_xml | – reference: K. Igarashi, F. Nakada, and Y. Moritomo: Phys. Rev. B 78 (2008) 235106. – reference: T. Matsuda and Y. Moritomo: J. Nanotechnol. 2012 (2012) 568147. – reference: M. Pasta, C. D. Wessellas, R. A. Huggings, and Y. Cui: Nat. Commun. 3 (2012) 1149. – reference: Y. Kurihara, H. Funashima, M. Ishida, N. Hamada, T. Matsuda, K. Igarashi, H. Tanida, T. Uruga, and Y. Moritomo: J. Phys. Soc. Jpn. 79 (2010) 044710. – reference: T. Matsuda and Y. Moritomo: Appl. Phys. Express 4 (2011) 047101. – reference: S. Komaba, W. Murata, T. Ishikawa, N. Yabuuchi, T. Ozeki, T. Nakayama, A. Ogata, K. Gotoh, and K. Fujiwara: Adv. Energy Mater. 21 (2011) 3859. – reference: Y. Lu, L. Wang, J. Cheng, and J. B. Goodenough: Chem. Commun. 48 (2012) 6544. – reference: T. Matsuda, J. E. Kim, and Y. Moritomo: Phys. Rev. B 79 (2009) 172302. – reference: Y. Moritomo, H. Kamioka, T. Shibata, S. Nozawa, T. Sato, and S. Adachi: to be published in J. Phys. Soc. Jpn. – reference: Y. Moritomo, M. Takachi, Y. Kurihara, and T. Matsuda: Appl. Phys. Express 5 (2012) 041801. – reference: J. E. Kim, H. Tanaka, K. Kato, M. Takata, and Y. Moritomo: Appl. Phys. Express 4 (2011) 0258021. – reference: S.-P. Ong, V.-L. Chevrier, G. Hautier, A. Jain, C. Moore, S. Kim, X. Ma, and G. Ceder: Energy Environ. Sci. 4 (2011) 3680. – reference: F. Izumi and K. Momma: Solid State Phenom. 130 (2007) 15. – reference: N. Imanishi, T. Morikawa, J. Kondo, R. Yamane, Y. Takeda, O. Yamamoto, H. Sakaebe, and M. Tabuchi: J. Power Sources 81--82 (1999) 530. – reference: N. Shimamoto, S. Ohkoshi, O. Sato, and K. Hashimoto: Inorg. Chem. 41 (2002) 678. – reference: C. D. Wessells, R. A. Huggings, and Y. Cui: Nat. Commun. 2 (2011) 550. – reference: S.-W. Kim, D.-H. Seo, X. Ma, G. Ceder, and K. Kang: Adv. Energy Mater. 2 (2012) 710. – reference: M. Okubo, D. Asakura, Y. Mizuno, J.-D. Kim, T. Mizokawa, T. Kudo, and I. Honnma: J. Phys. Chem. Lett. 1 (2010) 2063. – reference: N. Imanishi, T. Morikawa, J. Kondo, Y. Takeda, O. Yamamoto, N. Kinugasa, and T. Yamagishi: J. Power Sources 79 (1999) 215. – reference: M. Takachi, Y. Kurihara, and Y. Moritomo: J. Mater. Sci. Eng. B 2 (2012) 452. – ident: 7 doi: 10.1016/S0378-7753(99)00061-0 – volume: 4 start-page: 047101 issn: 1882-0786 year: 2011 ident: 10 publication-title: Appl. Phys. Express doi: 10.1143/APEX.4.047101 – volume: 21 start-page: 3859 year: 2011 ident: 3 publication-title: Adv. Energy Mater. – ident: 4 doi: 10.1103/PhysRevB.79.172302 – ident: 19 publication-title: J. Phys. Soc. Jpn. – ident: 2 doi: 10.1039/c1ee01782a – ident: 15 doi: 10.1103/PhysRevB.78.235106 – ident: 9 doi: 10.1021/jz100708b – ident: 1 doi: 10.1002/aenm.201200026 – ident: 6 doi: 10.1038/ncomms1563 – volume: 2 start-page: 452 year: 2012 ident: 13 publication-title: J. Mater. Sci. Eng. B – ident: 5 doi: 10.1038/ncomms2139 – ident: 17 doi: 10.1143/APEX.4.0258021 – volume: 5 start-page: 041801 issn: 1882-0786 year: 2012 ident: 11 publication-title: Appl. Phys. Express doi: 10.1143/APEX.5.041801 – ident: 14 doi: 10.1039/c2cc31777j – ident: 20 doi: 10.1143/JPSJ.79.044710 – ident: 8 doi: 10.1016/S0378-7753(98)00228-6 – volume: 2012 start-page: 568147 year: 2012 ident: 12 publication-title: J. Nanotechnol. doi: 10.1155/2012/568147 – ident: 18 doi: 10.1021/ic010915u – ident: 16 doi: 10.4028/www.scientific.net/SSP.130.15 |
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