APA (7th ed.) Citation

Banerjee, W., Liu, Q., & Hwang, H. (2020). Engineering of defects in resistive random access memory devices. Journal of applied physics, 127(5), . https://doi.org/10.1063/1.5136264

Chicago Style (17th ed.) Citation

Banerjee, Writam, Qi Liu, and Hyunsang Hwang. "Engineering of Defects in Resistive Random Access Memory Devices." Journal of Applied Physics 127, no. 5 (2020). https://doi.org/10.1063/1.5136264.

MLA (9th ed.) Citation

Banerjee, Writam, et al. "Engineering of Defects in Resistive Random Access Memory Devices." Journal of Applied Physics, vol. 127, no. 5, 2020, https://doi.org/10.1063/1.5136264.