Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films
Capacitance‐voltage (CV) spectroscopy of classic metal‐insulator‐semiconductors (MIS) using insulating oxides as well as highly passivating intrinsic and hydrogenated amorphous silicon ((i) a‐Si:H) has been discussed extensively in literature, particularly with regard to photovoltaic applications. I...
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Published in | Physica status solidi. C Vol. 13; no. 10-12; pp. 724 - 728 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Berlin
WILEY-VCH Verlag
01.12.2016
WILEY‐VCH Verlag Wiley Subscription Services, Inc |
Subjects | |
Online Access | Get full text |
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