Certification of Standard Reference Material 660c for powder diffraction

• Published in: Powder diffraction Vol. 35; no. 1; pp. 17 - 22
• Main Authors: Black, David R., Mendenhall, Marcus H., Brown, Craig M., Henins, Albert, Filliben, James, Cline, James P.
• Format: Journal Article
• Language: English
• Published: United States Cambridge University Press 01.03.2020
• Subjects: Certification; Confidence; Crystal defects; Crystallites; Crystallography; Data analysis; Data collection; Diffractometers; Laboratories; Lanthanum; Line shape; Neutron diffraction; Parameters; Particle size; Raw materials; Reference materials; Sensors; Standard reference materials; United States > US; X-ray diffraction; Standard Reference Material; diffractometer; lattice parameter; certification

The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to evaluate specific aspects of instrument performance of both X-ray and neutron powder diffractometers. This report describes SRM 660c, the fourth generation of this powder diffraction...