Certification of Standard Reference Material 660c for powder diffraction - Black, David R.; Mendenhall, Marcus H.; Brown, Craig M.; Henins, Albert; Filliben, James; Cline, James P. (Powder diffraction, 2020)
Keywords: Certification; Confidence; Crystal defects; Crystallites; Crystallography; Data analysis; Data collection; Diffractometers; Laboratories; Lanthanum; Line shape; Neutron diffraction; Parameters; Particle size; Raw materials; Reference materials; Sensors; Standard reference materials; United States--US; X-ray diffraction; Standard Reference Material; diffractometer; lattice parameter; certification