Electromechanical reliability of flexible transparent electrodes during and after exposure to acrylic acid

The effect of deposition temperature on pulsed laser deposition (PLD) fabricated flexible transparent electrodes subjected to mechanical loading, after exposure to acrylic acid, and the combined effect of fatigue and corrosion on sputter-deposited polyester-based indium tin oxide (ITO) films are bot...

Full description

Saved in:
Bibliographic Details
Published inThin solid films Vol. 528; pp. 229 - 236
Main Authors Bejitual, T.S., Compton, D., Sierros, K.A., Cairns, D.R., Kukureka, S.N.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Amsterdam Elsevier B.V 15.01.2013
Elsevier
Subjects
Online AccessGet full text

Cover

Loading…
Abstract The effect of deposition temperature on pulsed laser deposition (PLD) fabricated flexible transparent electrodes subjected to mechanical loading, after exposure to acrylic acid, and the combined effect of fatigue and corrosion on sputter-deposited polyester-based indium tin oxide (ITO) films are both investigated in this study. Acrylic acid containing pressure sensitive adhesives, which are commonly used in various flexible device stacks, can corrode the ITO film. In addition, fatigue due to cyclic loading can lead to film cracking. The combined effect of fatigue and corrosion can lead to catastrophic failure of the system. We found that PLD-produced ITO on polyethylene naphthalate samples deposited at 150°C performs better than samples deposited at 50°C under uniaxial mechanical loading. They were found to exhibit higher crack onset strain than their 50°C counterparts. However, they were observed to be more sensitive to increasing acid concentrations. Scanning electron microscopy images show a larger number of adhesive cracks on the surfaces of the 150°C-deposited samples than the 50°C-deposited samples. Atomic force microscopy results reveal that the increased temperature causes a significant increase in surface roughness which may affect the corrosion behavior of the ITO film. Furthermore, in situ electrical resistance measurements and crack density analysis suggest that the combination of fatigue and corrosion can cause film failure at low strains, less than those needed for failure with no corrosion. For example, at 0.9% applied strain and 500,000cycles, the crack density under fatigue–corrosion is 1.7 times that of the fatigue-only case. ► ITO films were deposited on polymers with PLD or magnetron sputtering. ► The combination of fatigue and corrosion was investigated using a custom apparatus. ► Adhesion and film roughness played roles in the fatigue-corrosion behavior.
AbstractList The effect of deposition temperature on pulsed laser deposition (PLD) fabricated flexible transparent electrodes subjected to mechanical loading, after exposure to acrylic acid, and the combined effect of fatigue and corrosion on sputter-deposited polyester-based indium tin oxide (ITO) films are both investigated in this study. Acrylic acid containing pressure sensitive adhesives, which are commonly used in various flexible device stacks, can corrode the ITO film. In addition, fatigue due to cyclic loading can lead to film cracking. The combined effect of fatigue and corrosion can lead to catastrophic failure of the system. We found that PLD-produced ITO on polyethylene naphthalate samples deposited at 150°C performs better than samples deposited at 50°C under uniaxial mechanical loading. They were found to exhibit higher crack onset strain than their 50°C counterparts. However, they were observed to be more sensitive to increasing acid concentrations. Scanning electron microscopy images show a larger number of adhesive cracks on the surfaces of the 150°C-deposited samples than the 50°C-deposited samples. Atomic force microscopy results reveal that the increased temperature causes a significant increase in surface roughness which may affect the corrosion behavior of the ITO film. Furthermore, in situ electrical resistance measurements and crack density analysis suggest that the combination of fatigue and corrosion can cause film failure at low strains, less than those needed for failure with no corrosion. For example, at 0.9% applied strain and 500,000cycles, the crack density under fatigue–corrosion is 1.7 times that of the fatigue-only case. ► ITO films were deposited on polymers with PLD or magnetron sputtering. ► The combination of fatigue and corrosion was investigated using a custom apparatus. ► Adhesion and film roughness played roles in the fatigue-corrosion behavior.
The effect of deposition temperature on pulsed laser deposition (PLD) fabricated flexible transparent electrodes subjected to mechanical loading, after exposure to acrylic acid, and the combined effect of fatigue and corrosion on sputter-deposited polyester-based indium tin oxide (ITO) films are both investigated in this study. Acrylic acid containing pressure sensitive adhesives, which are commonly used in various flexible device stacks, can corrode the ITO film. In addition, fatigue due to cyclic loading can lead to film cracking. The combined effect of fatigue and corrosion can lead to catastrophic failure of the system. We found that PLD-produced ITO on polyethylene naphthalate samples deposited at 150 degree C performs better than samples deposited at 50 degree C under uniaxial mechanical loading. They were found to exhibit higher crack onset strain than their 50 degree C counterparts. However, they were observed to be more sensitive to increasing acid concentrations. Scanning electron microscopy images show a larger number of adhesive cracks on the surfaces of the 150 degree C-deposited samples than the 50 degree C-deposited samples. Atomic force microscopy results reveal that the increased temperature causes a significant increase in surface roughness which may affect the corrosion behavior of the ITO film. Furthermore, in situ electrical resistance measurements and crack density analysis suggest that the combination of fatigue and corrosion can cause film failure at low strains, less than those needed for failure with no corrosion. For example, at 0.9% applied strain and 500,000cycles, the crack density under fatigue-corrosion is 1.7 times that of the fatigue-only case.
Author Cairns, D.R.
Kukureka, S.N.
Compton, D.
Bejitual, T.S.
Sierros, K.A.
Author_xml – sequence: 1
  givenname: T.S.
  surname: Bejitual
  fullname: Bejitual, T.S.
  organization: West Virginia University, Department of Mechanical & Aerospace Engineering, Evansdale Campus, Morgantown, WV 26506, USA
– sequence: 2
  givenname: D.
  surname: Compton
  fullname: Compton, D.
  organization: University of Birmingham, Metallurgy & Materials, Edgbaston, Birmingham B15 2TT, UK
– sequence: 3
  givenname: K.A.
  surname: Sierros
  fullname: Sierros, K.A.
  organization: West Virginia University, Department of Mechanical & Aerospace Engineering, Evansdale Campus, Morgantown, WV 26506, USA
– sequence: 4
  givenname: D.R.
  surname: Cairns
  fullname: Cairns, D.R.
  email: darran.cairns@mail.wvu.edu
  organization: West Virginia University, Department of Mechanical & Aerospace Engineering, Evansdale Campus, Morgantown, WV 26506, USA
– sequence: 5
  givenname: S.N.
  surname: Kukureka
  fullname: Kukureka, S.N.
  organization: University of Birmingham, Metallurgy & Materials, Edgbaston, Birmingham B15 2TT, UK
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=27188325$$DView record in Pascal Francis
BookMark eNp9kEFvVCEUhYlpE6etP6A7NiZu3vMCDx4vrkzTqkkTN7omDFwqEwZGeGM6_16aaVy6OpvvnJv7XZGLXDIScstgZMDUx924tjByYHwEPYKc35AN0_My8FmwC7IBmGBQsMBbctXaDqCTXGzI7j6hW2vZo_tlc3Q20Yop2m1McT3REmhI-By3CelabW4HWzGvFM8tj436Y435idrsqQ0rVorPh9KOtRcKta6eUnQ9o78hl8Gmhu9e85r8fLj_cfd1ePz-5dvd58fBTVytw8xRMDc5LoNTiGhnkF75KWy5n9i8aO-UXOyitJtQaBm0FAq9BaH1pDWKa_LhvHuo5fcR22r2sTlMyWYsx2aYYFJpuQDvKDujrpbWKgZzqHFv68kwMC9ezc50r-bFqwFtutfeef86b1vXFboVF9u_Ip-Z1oLLzn06c9h__ROxmuYiZoc-1i7P-BL_c-UvpUyRWA
CODEN THSFAP
CitedBy_id crossref_primary_10_1016_j_tsf_2013_09_044
crossref_primary_10_1380_ejssnt_2021_61
crossref_primary_10_2478_adms_2024_0003
crossref_primary_10_1016_j_surfcoat_2015_11_007
crossref_primary_10_1016_j_mser_2017_05_001
Cites_doi 10.1063/1.371708
10.1016/j.cap.2009.12.028
10.1016/S0079-6425(02)00002-6
10.1016/j.wear.2008.12.042
10.1016/j.surfcoat.2009.07.028
10.1002/ppap.200600047
10.1016/S0040-6090(97)00024-2
10.1088/0022-3727/44/2/025401
10.1063/1.1357470
10.1063/1.126052
10.1016/j.tsf.2004.11.040
10.1889/1.1824238
10.1557/PROC-666-F3.24
10.1002/app.11951
10.1016/j.tsf.2008.10.031
10.1109/JPROC.2005.851515
10.1557/PROC-345-261
10.1007/s10853-006-2372-x
10.1016/S0040-6090(98)00959-6
10.1016/j.tsf.2008.12.057
10.1116/1.579857
10.1016/j.tsf.2009.08.002
10.1016/j.matchemphys.2007.08.015
10.1063/1.1383568
10.1016/S0040-6090(96)09105-5
10.1016/j.tsf.2004.01.052
10.1016/j.matchemphys.2011.11.043
10.1088/0022-3727/41/13/133001
10.1016/j.progpolymsci.2007.11.004
ContentType Journal Article
Conference Proceeding
Copyright 2012 Elsevier B.V.
2014 INIST-CNRS
Copyright_xml – notice: 2012 Elsevier B.V.
– notice: 2014 INIST-CNRS
DBID IQODW
AAYXX
CITATION
7SE
7SR
7U5
8BQ
8FD
JG9
L7M
DOI 10.1016/j.tsf.2012.08.057
DatabaseName Pascal-Francis
CrossRef
Corrosion Abstracts
Engineered Materials Abstracts
Solid State and Superconductivity Abstracts
METADEX
Technology Research Database
Materials Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Materials Research Database
Engineered Materials Abstracts
Technology Research Database
Solid State and Superconductivity Abstracts
Corrosion Abstracts
Advanced Technologies Database with Aerospace
METADEX
DatabaseTitleList
Materials Research Database
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1879-2731
EndPage 236
ExternalDocumentID 10_1016_j_tsf_2012_08_057
27188325
S0040609012013818
GroupedDBID --K
--M
-~X
.DC
.~1
0R~
123
1B1
1RT
1~.
1~5
4.4
457
4G.
5VS
7-5
71M
8P~
9JN
AABNK
AABXZ
AACTN
AAEDT
AAEDW
AAEPC
AAIAV
AAIKJ
AAKOC
AALRI
AAOAW
AAQFI
AAXUO
ABFNM
ABFRF
ABJNI
ABMAC
ABNEU
ABXDB
ABXRA
ABYKQ
ACBEA
ACDAQ
ACFVG
ACGFO
ACGFS
ACRLP
ADBBV
ADEZE
AEBSH
AEFWE
AEKER
AENEX
AEZYN
AFKWA
AFRZQ
AFTJW
AGUBO
AGYEJ
AHHHB
AIEXJ
AIKHN
AITUG
AIVDX
AJBFU
AJOXV
ALMA_UNASSIGNED_HOLDINGS
AMFUW
AMRAJ
AXJTR
BKOJK
BLXMC
CS3
DU5
EBS
EFJIC
EFLBG
EJD
EO8
EO9
EP2
EP3
F5P
FDB
FIRID
FNPLU
FYGXN
G-Q
GBLVA
IHE
J1W
KOM
M24
M38
M41
MAGPM
MO0
N9A
O-L
O9-
OAUVE
OGIMB
OZT
P-8
P-9
P2P
PC.
Q38
RNS
ROL
RPZ
SDF
SDG
SDP
SES
SPC
SPCBC
SPD
SSM
SSQ
SSZ
T5K
TWZ
WH7
ZMT
~G-
29Q
6TJ
AAQXK
AAYJJ
ABPIF
ABPTK
ACNNM
ADMUD
AFFNX
AGHFR
ASPBG
AVWKF
AZFZN
BBWZM
FEDTE
FGOYB
G-2
G8K
HMV
HX~
HZ~
IQODW
NDZJH
R2-
RIG
SEW
SMS
SPG
VOH
WUQ
XFK
AAXKI
AAYXX
AFJKZ
AKRWK
CITATION
HVGLF
7SE
7SR
7U5
8BQ
8FD
JG9
L7M
ID FETCH-LOGICAL-c426t-72e31c4c25fc6eeea705d6d4fb2d41798dc659a968c4e385f8536eda0388488e3
IEDL.DBID .~1
ISSN 0040-6090
IngestDate Fri Oct 25 09:51:33 EDT 2024
Thu Sep 26 16:23:13 EDT 2024
Sun Oct 29 17:09:24 EDT 2023
Fri Feb 23 02:32:51 EST 2024
IsPeerReviewed true
IsScholarly true
Keywords Fatigue
Corrosion
Flexible optoelectronic devices
ITO
PET
Ethylene terephthalate polymer
Atomic force microscopy
Acrylic acid
Roughness
Thin films
Tin oxide
Physical vapor deposition
Uniaxial load
Temperature dependence
Scanning electron microscopy
Cracking
Mechanical properties
Optoelectronic devices
Pulsed laser deposition
Indium oxide
Electrical measurement
Quantity ratio
Electric resistivity
Laser ablation technique
Reliability
Language English
License CC BY 4.0
LinkModel DirectLink
MeetingName Proceedings of the 39th International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2012), San Diego, California (USA), April 23-27, 2012
MergedId FETCHMERGED-LOGICAL-c426t-72e31c4c25fc6eeea705d6d4fb2d41798dc659a968c4e385f8536eda0388488e3
Notes ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
PQID 1315685902
PQPubID 23500
PageCount 8
ParticipantIDs proquest_miscellaneous_1315685902
crossref_primary_10_1016_j_tsf_2012_08_057
pascalfrancis_primary_27188325
elsevier_sciencedirect_doi_10_1016_j_tsf_2012_08_057
PublicationCentury 2000
PublicationDate 2013-01-15
PublicationDateYYYYMMDD 2013-01-15
PublicationDate_xml – month: 01
  year: 2013
  text: 2013-01-15
  day: 15
PublicationDecade 2010
PublicationPlace Amsterdam
PublicationPlace_xml – name: Amsterdam
PublicationTitle Thin solid films
PublicationYear 2013
Publisher Elsevier B.V
Elsevier
Publisher_xml – name: Elsevier B.V
– name: Elsevier
References Sierros, Cairns, Abell, Kukureka (bb0095) 2010; 518
Ramji, Cairns, Sierros, Kukureka (bb0120) 2007
Lechat, Bunsell, Davies, Piant (bb0135) 2006; 41
Kim, Yang, Park (bb0185) 2011; 109
Anguita, Thwaites, Holton, Hockley, Rand, Haughton (bb0150) 2007; 4
Crawford (bb0005) 2005
Cairns, Witte, Sparacin, Sachsman, Paine, Crawford (bb0100) 2000; 76
Cairns, Paine, Crawford (bb0130) 2001; 666
Chen, Xu, Salo, Neto, Freitas (bb0070) 2008
Lee, Lee, Song (bb0170) 2009; 48
Wu, Chiou (bb0195) 1997; 293
Gorkhali, Cairns, Crawford (bb0140) 2004; 12
Kim, Yang, Park (bb0105) 2010; 10
Choi, Kim, Ha (bb0065) 2008; 33
Folcher, Cachet, Froment, Bruneaux (bb0175) 1997; 301
Sierros, Morris, Ramji, Cairns (bb0125) 2009; 517
Eason (bb0165) 2007
Leterrier (bb0180) 2003; 48
Peng, Jia, Bianculli, Li, Lou (bb0205) 2011; 109
Lee, Liu, Wu (bb0010) 2008
Yip, Bhat, Kwok (bb0020) 1994; 345
Guillen, Herrero (bb0055) 2005; 480
Kim, Gilmore, Pique, Horwitz, Mattoussi, Murata, Kafafi, Chrisey (bb0035) 1999; 86
Kwok, Sun, Kim (bb0045) 1998; 335
MacDonald, Rollins, MacKerron, Rakos, Eveson, Hashimoto, Rustin (bb0060) 2005
Greer, Tabat (bb0160) 1995; 13
Ma, Bhushan (bb0050) 2003; 88
Sierros, Morris, Kukureka, Cairns (bb0200) 2009; 267
Bouten, Slikkerveer, Leterrier (bb0090) 2005
Bejitual, Ramji, Kessman, Sierros, Cairns (bb0110) 2012; 132
Cairns, Crawford (bb0075) 2005; 93
Kim, Horwitz, Kushto, Kafafi, Chrisey (bb0030) 2001; 79
Shinar, Shinar (bb0015) 2008; 41
Shin, Shin, Park (bb0025) 2001; 89
You, Kim, Choi, Jang, Lee, Kim (bb0145) 2008; 107
Mohanty, Choi, Choi, Cho (bb0210) 2011; 44
Zhinong, Yuqiong, Fan, Zhiwei, Wei (bb0085) 2009; 517
Leterrier, Medico, Demarco, Manson, Betz, Escola, Olsson, Atamny (bb0080) 2004; 460
Hubler (bb0155) 1994
Paine, Yeom, Yaglioglu (bb0040) 2005
Jones, Ricker (bb0115) 1992
Morris, Sierros, Ramji, Cairns, Kukureka (bb0190) 2008
Sim, Kim, Park, Lee (bb0215) 2009; 204
Sim (10.1016/j.tsf.2012.08.057_bb0215) 2009; 204
Kwok (10.1016/j.tsf.2012.08.057_bb0045) 1998; 335
MacDonald (10.1016/j.tsf.2012.08.057_bb0060) 2005
Anguita (10.1016/j.tsf.2012.08.057_bb0150) 2007; 4
Shinar (10.1016/j.tsf.2012.08.057_bb0015) 2008; 41
Chen (10.1016/j.tsf.2012.08.057_bb0070) 2008
Kim (10.1016/j.tsf.2012.08.057_bb0035) 1999; 86
Shin (10.1016/j.tsf.2012.08.057_bb0025) 2001; 89
Kim (10.1016/j.tsf.2012.08.057_bb0030) 2001; 79
Peng (10.1016/j.tsf.2012.08.057_bb0205) 2011; 109
Lechat (10.1016/j.tsf.2012.08.057_bb0135) 2006; 41
You (10.1016/j.tsf.2012.08.057_bb0145) 2008; 107
Ma (10.1016/j.tsf.2012.08.057_bb0050) 2003; 88
Jones (10.1016/j.tsf.2012.08.057_bb0115) 1992
Cairns (10.1016/j.tsf.2012.08.057_bb0130) 2001; 666
Choi (10.1016/j.tsf.2012.08.057_bb0065) 2008; 33
Ramji (10.1016/j.tsf.2012.08.057_bb0120) 2007
Mohanty (10.1016/j.tsf.2012.08.057_bb0210) 2011; 44
Sierros (10.1016/j.tsf.2012.08.057_bb0095) 2010; 518
Gorkhali (10.1016/j.tsf.2012.08.057_bb0140) 2004; 12
Lee (10.1016/j.tsf.2012.08.057_bb0170) 2009; 48
Leterrier (10.1016/j.tsf.2012.08.057_bb0180) 2003; 48
Paine (10.1016/j.tsf.2012.08.057_bb0040) 2005
Kim (10.1016/j.tsf.2012.08.057_bb0185) 2011; 109
Folcher (10.1016/j.tsf.2012.08.057_bb0175) 1997; 301
Yip (10.1016/j.tsf.2012.08.057_bb0020) 1994; 345
Eason (10.1016/j.tsf.2012.08.057_bb0165) 2007
Zhinong (10.1016/j.tsf.2012.08.057_bb0085) 2009; 517
Morris (10.1016/j.tsf.2012.08.057_bb0190) 2008
Greer (10.1016/j.tsf.2012.08.057_bb0160) 1995; 13
Cairns (10.1016/j.tsf.2012.08.057_bb0075) 2005; 93
Hubler (10.1016/j.tsf.2012.08.057_bb0155) 1994
Sierros (10.1016/j.tsf.2012.08.057_bb0200) 2009; 267
Lee (10.1016/j.tsf.2012.08.057_bb0010) 2008
Cairns (10.1016/j.tsf.2012.08.057_bb0100) 2000; 76
Guillen (10.1016/j.tsf.2012.08.057_bb0055) 2005; 480
Sierros (10.1016/j.tsf.2012.08.057_bb0125) 2009; 517
Bejitual (10.1016/j.tsf.2012.08.057_bb0110) 2012; 132
Leterrier (10.1016/j.tsf.2012.08.057_bb0080) 2004; 460
Wu (10.1016/j.tsf.2012.08.057_bb0195) 1997; 293
Crawford (10.1016/j.tsf.2012.08.057_bb0005) 2005
Kim (10.1016/j.tsf.2012.08.057_bb0105) 2010; 10
Bouten (10.1016/j.tsf.2012.08.057_bb0090) 2005
References_xml – start-page: 1790
  year: 2007
  ident: bb0120
  publication-title: SID Symposium Digest of Technical Papers 38
  contributor:
    fullname: Kukureka
– volume: 86
  start-page: 6451
  year: 1999
  ident: bb0035
  publication-title: J. Appl. Phys.
  contributor:
    fullname: Chrisey
– volume: 89
  start-page: 5199
  year: 2001
  ident: bb0025
  publication-title: J. Appl. Phys.
  contributor:
    fullname: Park
– volume: 293
  start-page: 244
  year: 1997
  ident: bb0195
  publication-title: Thin Solid Films
  contributor:
    fullname: Chiou
– volume: 109
  start-page: 1
  year: 2011
  ident: bb0205
  publication-title: J. Appl. Phys.
  contributor:
    fullname: Lou
– volume: 345
  start-page: 261
  year: 1994
  ident: bb0020
  publication-title: Mater. Res. Soc. Symp. Proc.
  contributor:
    fullname: Kwok
– volume: 518
  start-page: 2623
  year: 2010
  ident: bb0095
  publication-title: Thin Solid Films
  contributor:
    fullname: Kukureka
– volume: 76
  start-page: 1425
  year: 2000
  ident: bb0100
  publication-title: Appl. Phys. Lett.
  contributor:
    fullname: Crawford
– volume: 48
  start-page: 1
  year: 2009
  ident: bb0170
  publication-title: Jpn. J. Appl. Phys.
  contributor:
    fullname: Song
– volume: 13
  start-page: 1175
  year: 1995
  ident: bb0160
  publication-title: J. Vac. Sci. Technol. A
  contributor:
    fullname: Tabat
– start-page: 1
  year: 1992
  ident: bb0115
  publication-title: Stress-corrosion Cracking
  contributor:
    fullname: Ricker
– volume: 44
  start-page: 1
  year: 2011
  ident: bb0210
  publication-title: J. Phys. D: Appl. Phys.
  contributor:
    fullname: Cho
– volume: 517
  start-page: 2590
  year: 2009
  ident: bb0125
  publication-title: Thin Solid Films
  contributor:
    fullname: Cairns
– volume: 41
  start-page: 1745
  year: 2006
  ident: bb0135
  publication-title: J. Mater. Sci.
  contributor:
    fullname: Piant
– volume: 33
  start-page: 518
  year: 2008
  ident: bb0065
  publication-title: Prog. Polym. Sci.
  contributor:
    fullname: Ha
– volume: 10
  start-page: S510
  year: 2010
  ident: bb0105
  publication-title: Curr. Appl. Phys.
  contributor:
    fullname: Park
– volume: 48
  start-page: 1
  year: 2003
  ident: bb0180
  publication-title: Prog. Mater. Sci.
  contributor:
    fullname: Leterrier
– volume: 79
  start-page: 284
  year: 2001
  ident: bb0030
  publication-title: Appl. Phys. Lett.
  contributor:
    fullname: Chrisey
– volume: 109
  start-page: 1
  year: 2011
  ident: bb0185
  publication-title: J. Appl. Phys.
  contributor:
    fullname: Park
– start-page: 1
  year: 2008
  ident: bb0070
  publication-title: ICEPT-HDP
  contributor:
    fullname: Freitas
– start-page: 1
  year: 2008
  ident: bb0010
  publication-title: Introduction to Flat Panel Displays
  contributor:
    fullname: Wu
– volume: 480
  start-page: 129
  year: 2005
  ident: bb0055
  publication-title: Thin Solid Films
  contributor:
    fullname: Herrero
– start-page: 99
  year: 2005
  ident: bb0090
  publication-title: Flexible Flat Panel Displays
  contributor:
    fullname: Leterrier
– volume: 41
  start-page: 1
  year: 2008
  ident: bb0015
  publication-title: J. Phys. D: Appl. Phys.
  contributor:
    fullname: Shinar
– volume: 517
  start-page: 5395
  year: 2009
  ident: bb0085
  publication-title: Thin Solid Films
  contributor:
    fullname: Wei
– volume: 666
  start-page: 1
  year: 2001
  ident: bb0130
  publication-title: Mater. Res. Soc. Symp. Proc.
  contributor:
    fullname: Crawford
– volume: 107
  start-page: 444
  year: 2008
  ident: bb0145
  publication-title: Mater. Chem. Phys.
  contributor:
    fullname: Kim
– volume: 204
  start-page: 309
  year: 2009
  ident: bb0215
  publication-title: Surf. Coat. Technol.
  contributor:
    fullname: Lee
– start-page: 11
  year: 2005
  ident: bb0060
  publication-title: Flexible Flat Panel Displays
  contributor:
    fullname: Rustin
– volume: 12
  start-page: 45
  year: 2004
  ident: bb0140
  publication-title: J. Soc. Inf. Display
  contributor:
    fullname: Crawford
– volume: 4
  start-page: 48
  year: 2007
  ident: bb0150
  publication-title: Plasma Processes Polym.
  contributor:
    fullname: Haughton
– start-page: 327
  year: 1994
  ident: bb0155
  publication-title: Pulsed Laser Deposition of Thin Films
  contributor:
    fullname: Hubler
– start-page: 1
  year: 2005
  ident: bb0005
  publication-title: Flexible Flat Panel Displays
  contributor:
    fullname: Crawford
– volume: 267
  start-page: 625
  year: 2009
  ident: bb0200
  publication-title: Wear
  contributor:
    fullname: Cairns
– start-page: 1461
  year: 2008
  ident: bb0190
  publication-title: SID Symposium Digest of Technical Papers 39
  contributor:
    fullname: Kukureka
– start-page: 79
  year: 2005
  ident: bb0040
  publication-title: Flexible Flat Panel Displays
  contributor:
    fullname: Yaglioglu
– volume: 88
  start-page: 2082
  year: 2003
  ident: bb0050
  publication-title: J. Appl. Polym. Sci.
  contributor:
    fullname: Bhushan
– volume: 93
  start-page: 1451
  year: 2005
  ident: bb0075
  publication-title: Proc. IEEE
  contributor:
    fullname: Crawford
– volume: 132
  start-page: 395
  year: 2012
  ident: bb0110
  publication-title: Mater. Chem. Phys.
  contributor:
    fullname: Cairns
– volume: 460
  start-page: 156
  year: 2004
  ident: bb0080
  publication-title: Thin Solid Films
  contributor:
    fullname: Atamny
– start-page: 1
  year: 2007
  ident: bb0165
  publication-title: Pulsed Laser Deposition of Thin Films
  contributor:
    fullname: Eason
– volume: 335
  start-page: 299
  year: 1998
  ident: bb0045
  publication-title: Thin Solid Films
  contributor:
    fullname: Kim
– volume: 301
  start-page: 242
  year: 1997
  ident: bb0175
  publication-title: Thin Solid Films
  contributor:
    fullname: Bruneaux
– volume: 86
  start-page: 6451
  year: 1999
  ident: 10.1016/j.tsf.2012.08.057_bb0035
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.371708
  contributor:
    fullname: Kim
– volume: 10
  start-page: S510
  year: 2010
  ident: 10.1016/j.tsf.2012.08.057_bb0105
  publication-title: Curr. Appl. Phys.
  doi: 10.1016/j.cap.2009.12.028
  contributor:
    fullname: Kim
– volume: 48
  start-page: 1
  year: 2003
  ident: 10.1016/j.tsf.2012.08.057_bb0180
  publication-title: Prog. Mater. Sci.
  doi: 10.1016/S0079-6425(02)00002-6
  contributor:
    fullname: Leterrier
– volume: 267
  start-page: 625
  year: 2009
  ident: 10.1016/j.tsf.2012.08.057_bb0200
  publication-title: Wear
  doi: 10.1016/j.wear.2008.12.042
  contributor:
    fullname: Sierros
– volume: 204
  start-page: 309
  year: 2009
  ident: 10.1016/j.tsf.2012.08.057_bb0215
  publication-title: Surf. Coat. Technol.
  doi: 10.1016/j.surfcoat.2009.07.028
  contributor:
    fullname: Sim
– start-page: 79
  year: 2005
  ident: 10.1016/j.tsf.2012.08.057_bb0040
  contributor:
    fullname: Paine
– volume: 4
  start-page: 48
  year: 2007
  ident: 10.1016/j.tsf.2012.08.057_bb0150
  publication-title: Plasma Processes Polym.
  doi: 10.1002/ppap.200600047
  contributor:
    fullname: Anguita
– volume: 301
  start-page: 242
  year: 1997
  ident: 10.1016/j.tsf.2012.08.057_bb0175
  publication-title: Thin Solid Films
  doi: 10.1016/S0040-6090(97)00024-2
  contributor:
    fullname: Folcher
– volume: 44
  start-page: 1
  year: 2011
  ident: 10.1016/j.tsf.2012.08.057_bb0210
  publication-title: J. Phys. D: Appl. Phys.
  doi: 10.1088/0022-3727/44/2/025401
  contributor:
    fullname: Mohanty
– volume: 89
  start-page: 5199
  year: 2001
  ident: 10.1016/j.tsf.2012.08.057_bb0025
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.1357470
  contributor:
    fullname: Shin
– volume: 76
  start-page: 1425
  year: 2000
  ident: 10.1016/j.tsf.2012.08.057_bb0100
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.126052
  contributor:
    fullname: Cairns
– volume: 480
  start-page: 129
  year: 2005
  ident: 10.1016/j.tsf.2012.08.057_bb0055
  publication-title: Thin Solid Films
  doi: 10.1016/j.tsf.2004.11.040
  contributor:
    fullname: Guillen
– volume: 12
  start-page: 45
  year: 2004
  ident: 10.1016/j.tsf.2012.08.057_bb0140
  publication-title: J. Soc. Inf. Display
  doi: 10.1889/1.1824238
  contributor:
    fullname: Gorkhali
– start-page: 99
  year: 2005
  ident: 10.1016/j.tsf.2012.08.057_bb0090
  contributor:
    fullname: Bouten
– volume: 666
  start-page: 1
  year: 2001
  ident: 10.1016/j.tsf.2012.08.057_bb0130
  publication-title: Mater. Res. Soc. Symp. Proc.
  doi: 10.1557/PROC-666-F3.24
  contributor:
    fullname: Cairns
– volume: 88
  start-page: 2082
  year: 2003
  ident: 10.1016/j.tsf.2012.08.057_bb0050
  publication-title: J. Appl. Polym. Sci.
  doi: 10.1002/app.11951
  contributor:
    fullname: Ma
– start-page: 11
  year: 2005
  ident: 10.1016/j.tsf.2012.08.057_bb0060
  contributor:
    fullname: MacDonald
– volume: 517
  start-page: 2590
  year: 2009
  ident: 10.1016/j.tsf.2012.08.057_bb0125
  publication-title: Thin Solid Films
  doi: 10.1016/j.tsf.2008.10.031
  contributor:
    fullname: Sierros
– volume: 93
  start-page: 1451
  year: 2005
  ident: 10.1016/j.tsf.2012.08.057_bb0075
  publication-title: Proc. IEEE
  doi: 10.1109/JPROC.2005.851515
  contributor:
    fullname: Cairns
– volume: 109
  start-page: 1
  year: 2011
  ident: 10.1016/j.tsf.2012.08.057_bb0205
  publication-title: J. Appl. Phys.
  contributor:
    fullname: Peng
– volume: 345
  start-page: 261
  year: 1994
  ident: 10.1016/j.tsf.2012.08.057_bb0020
  publication-title: Mater. Res. Soc. Symp. Proc.
  doi: 10.1557/PROC-345-261
  contributor:
    fullname: Yip
– start-page: 1
  year: 2007
  ident: 10.1016/j.tsf.2012.08.057_bb0165
  contributor:
    fullname: Eason
– volume: 48
  start-page: 1
  year: 2009
  ident: 10.1016/j.tsf.2012.08.057_bb0170
  publication-title: Jpn. J. Appl. Phys.
  contributor:
    fullname: Lee
– start-page: 1461
  year: 2008
  ident: 10.1016/j.tsf.2012.08.057_bb0190
  contributor:
    fullname: Morris
– start-page: 1
  year: 2005
  ident: 10.1016/j.tsf.2012.08.057_bb0005
  contributor:
    fullname: Crawford
– start-page: 1790
  year: 2007
  ident: 10.1016/j.tsf.2012.08.057_bb0120
  contributor:
    fullname: Ramji
– volume: 41
  start-page: 1745
  year: 2006
  ident: 10.1016/j.tsf.2012.08.057_bb0135
  publication-title: J. Mater. Sci.
  doi: 10.1007/s10853-006-2372-x
  contributor:
    fullname: Lechat
– volume: 335
  start-page: 299
  year: 1998
  ident: 10.1016/j.tsf.2012.08.057_bb0045
  publication-title: Thin Solid Films
  doi: 10.1016/S0040-6090(98)00959-6
  contributor:
    fullname: Kwok
– start-page: 1
  year: 2008
  ident: 10.1016/j.tsf.2012.08.057_bb0070
  publication-title: ICEPT-HDP
  contributor:
    fullname: Chen
– volume: 109
  start-page: 1
  year: 2011
  ident: 10.1016/j.tsf.2012.08.057_bb0185
  publication-title: J. Appl. Phys.
  contributor:
    fullname: Kim
– volume: 517
  start-page: 5395
  year: 2009
  ident: 10.1016/j.tsf.2012.08.057_bb0085
  publication-title: Thin Solid Films
  doi: 10.1016/j.tsf.2008.12.057
  contributor:
    fullname: Zhinong
– volume: 13
  start-page: 1175
  year: 1995
  ident: 10.1016/j.tsf.2012.08.057_bb0160
  publication-title: J. Vac. Sci. Technol. A
  doi: 10.1116/1.579857
  contributor:
    fullname: Greer
– volume: 518
  start-page: 2623
  year: 2010
  ident: 10.1016/j.tsf.2012.08.057_bb0095
  publication-title: Thin Solid Films
  doi: 10.1016/j.tsf.2009.08.002
  contributor:
    fullname: Sierros
– volume: 107
  start-page: 444
  year: 2008
  ident: 10.1016/j.tsf.2012.08.057_bb0145
  publication-title: Mater. Chem. Phys.
  doi: 10.1016/j.matchemphys.2007.08.015
  contributor:
    fullname: You
– volume: 79
  start-page: 284
  year: 2001
  ident: 10.1016/j.tsf.2012.08.057_bb0030
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.1383568
  contributor:
    fullname: Kim
– volume: 293
  start-page: 244
  year: 1997
  ident: 10.1016/j.tsf.2012.08.057_bb0195
  publication-title: Thin Solid Films
  doi: 10.1016/S0040-6090(96)09105-5
  contributor:
    fullname: Wu
– volume: 460
  start-page: 156
  year: 2004
  ident: 10.1016/j.tsf.2012.08.057_bb0080
  publication-title: Thin Solid Films
  doi: 10.1016/j.tsf.2004.01.052
  contributor:
    fullname: Leterrier
– start-page: 1
  year: 1992
  ident: 10.1016/j.tsf.2012.08.057_bb0115
  contributor:
    fullname: Jones
– volume: 132
  start-page: 395
  year: 2012
  ident: 10.1016/j.tsf.2012.08.057_bb0110
  publication-title: Mater. Chem. Phys.
  doi: 10.1016/j.matchemphys.2011.11.043
  contributor:
    fullname: Bejitual
– volume: 41
  start-page: 1
  year: 2008
  ident: 10.1016/j.tsf.2012.08.057_bb0015
  publication-title: J. Phys. D: Appl. Phys.
  doi: 10.1088/0022-3727/41/13/133001
  contributor:
    fullname: Shinar
– start-page: 1
  year: 2008
  ident: 10.1016/j.tsf.2012.08.057_bb0010
  contributor:
    fullname: Lee
– start-page: 327
  year: 1994
  ident: 10.1016/j.tsf.2012.08.057_bb0155
  contributor:
    fullname: Hubler
– volume: 33
  start-page: 518
  year: 2008
  ident: 10.1016/j.tsf.2012.08.057_bb0065
  publication-title: Prog. Polym. Sci.
  doi: 10.1016/j.progpolymsci.2007.11.004
  contributor:
    fullname: Choi
SSID ssj0001223
Score 2.129128
Snippet The effect of deposition temperature on pulsed laser deposition (PLD) fabricated flexible transparent electrodes subjected to mechanical loading, after...
SourceID proquest
crossref
pascalfrancis
elsevier
SourceType Aggregation Database
Index Database
Publisher
StartPage 229
SubjectTerms Condensed matter: structure, mechanical and thermal properties
Corrosion
Corrosion fatigue
Corrosion tests
Cracks
Cross-disciplinary physics: materials science; rheology
Density
Deposition
Deposition by sputtering
Exact sciences and technology
Fatigue
Fatigue failure
Flexible optoelectronic devices
Indium tin oxide
ITO
Laser deposition
Materials science
Mechanical and acoustical properties
Methods of deposition of films and coatings; film growth and epitaxy
PET
Physical properties of thin films, nonelectronic
Physics
Structure and morphology; thickness
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
Title Electromechanical reliability of flexible transparent electrodes during and after exposure to acrylic acid
URI https://dx.doi.org/10.1016/j.tsf.2012.08.057
https://search.proquest.com/docview/1315685902
Volume 528
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3fa9UwFA5jIigiOhWvPy4RfBLqmrRJ28cxNq5e3IM43FtIkxPouLaX2w7ci3-756TtdCg--NJA6S_OSc6XJud8H2Nvs0rUqhYuSdM6S3IIIbGV8HgobRDeu9TTOuSnM706zz9eqIs9djzXwlBa5RT7x5geo_V05nCy5uG2aajGF8Eoraj6UxDuUAU7wh_26fc_fqV5CClvMufo6nlnM-Z4DX1k8ZSRxZMQ6u_Y9GBre7RYGKUu_ojaEYpOH7GH0xySH42f-ZjtQXvA7v_GLHjA7sbMTtc_YZcno9DNN6AaX3IJ38GmGem5r3kXeCBOzHoDfIhE51QdNvBJHsdDz8dKRm5bz6OiOIfv244WFvnQcet215vGYdv4p-z89OTL8SqZBBYSh8A8JIWETLjcSRWcBgBbpMprn4daelImK73TqrKVLl0OWakCYrsGb4lBBgc-ZM_Yftu18JzxKhPC4vN0Udk8D7IUVlqwVa3TotalXbB3s2nNduTRMHOC2aVBPxjygyFJTFUsWD4b39zqDAbj_L9uW95y1M2LJAIwRi61YG9mzxkcRbQ1YlvornojMvyPLYnK5sX_vfsluyejUIZIhHrF9ofdFbzG6cpQL2N_XLI7Rx_WqzNq15-_rn8C-2ztfA
link.rule.ids 310,311,315,783,787,792,793,4509,23942,23943,24128,25152,27936,27937,45597,45691
linkProvider Elsevier
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1Ra9UwFD7MDVEZolPx6pwRfBLKmrRJm8cxNu7cdp822FtIkxPouLaX2w7cvzdJ24tD2cNeWiikKeck50uTc74P4HsmacUrapI0rbIkR-cSLan1l1I7aq1JbdiHvFyI-XX-84bfbMHxVAsT0irH2D_E9BitxyeHozUPV3Udanw9GKUyVH_SgDvPYMevBqSfnTtHZ-fzxSYgU8Y2yXOhwXS4GdO8-i4SebJI5BlA6v_wtLvSnTeaG9Qu_gncEY1O38DrcRlJjoYvfQtb2OzBq7_IBffgeUzuNN07uD0ZtG5-YSjzDV4ha1zWA0P3PWkdcYEWs1oi6SPXeSgQ68mokGOxI0MxI9GNJVFUnODvVRv2FknfEm3W98va-Htt38P16cnV8TwZNRYS47G5TwqGGTW5YdwZgYi6SLkVNncVs0GcrLRGcKmlKE2OWcmdh3eBVgcSGT_3MfsA203b4EcgMqNU-_eJQuo8d6ykmmnUshJpUYlSz-DHZFq1Gqg01JRjdqu8H1TwgwqqmLyYQT4ZXz0YD8qH-seaHTxw1KYj5jHYBy8-g2-T55SfSOF0RDfY3nWKZv5XtgxsNp-e1vdXeDG_urxQF2eL88_wkkXdDJpQvg_b_foOv_jVS18djKPzD7Ut7o0
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=Thin+solid+films&rft.atitle=Electromechanical+reliability+of+flexible+transparent+electrodes+during+and+after+exposure+to+acrylic+acid&rft.au=BEJITUAL%2C+T.+S&rft.au=COMPTON%2C+D&rft.au=SIERROS%2C+K.+A&rft.au=CAIRNS%2C+D.+R&rft.date=2013-01-15&rft.pub=Elsevier&rft.issn=0040-6090&rft.eissn=1879-2731&rft.volume=528&rft.spage=229&rft.epage=236&rft_id=info:doi/10.1016%2Fj.tsf.2012.08.057&rft.externalDBID=n%2Fa&rft.externalDocID=27188325
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0040-6090&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0040-6090&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0040-6090&client=summon