Measuring the dielectric constant of materials from valence EELS

• Published in: Micron (Oxford, England : 1993) Vol. 40; no. 2; pp. 262 - 268
• Main Authors: Potapov, P.L., Engelmann, H.-J., Zschech, E., Stöger-Pollach, M.
• Format: Journal Article
• Language: English
• Published: England Elsevier Ltd 01.02.2009
• Subjects: Cherenkov effect; Dielectric constant; Dielectric properties; High-resolution EELS; Kramers–Kronig transformation; Optical properties; Relativistic losses; Valence EELS; VEELS; Kramers–Kronig transformation; VEELS; Cherenkov effect; Dielectric constant; Relativistic losses; Dielectric properties; Optical properties; Valence EELS; High-resolution EELS

Valence EELS combined with STEM provides an approach to determine the dielectric constant of materials in the optical range of frequencies. The paper describes the experimental procedure and discusses the critical aspects of valence electron energy-loss spectroscopy (VEELS) treatment. In particular,...