Measuring the dielectric constant of materials from valence EELS
Valence EELS combined with STEM provides an approach to determine the dielectric constant of materials in the optical range of frequencies. The paper describes the experimental procedure and discusses the critical aspects of valence electron energy-loss spectroscopy (VEELS) treatment. In particular,...
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Published in | Micron (Oxford, England : 1993) Vol. 40; no. 2; pp. 262 - 268 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
England
Elsevier Ltd
01.02.2009
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Subjects | |
Online Access | Get full text |
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