Measuring the dielectric constant of materials from valence EELS
Valence EELS combined with STEM provides an approach to determine the dielectric constant of materials in the optical range of frequencies. The paper describes the experimental procedure and discusses the critical aspects of valence electron energy-loss spectroscopy (VEELS) treatment. In particular,...
Saved in:
| Published in | Micron (Oxford, England : 1993) Vol. 40; no. 2; pp. 262 - 268 |
|---|---|
| Main Authors | , , , |
| Format | Journal Article |
| Language | English |
| Published |
England
Elsevier Ltd
01.02.2009
|
| Subjects | |
| Online Access | Get full text |
Cover
Loading…
| Abstract | Valence EELS combined with STEM provides an approach to determine the dielectric constant of materials in the optical range of frequencies. The paper describes the experimental procedure and discusses the critical aspects of valence electron energy-loss spectroscopy (VEELS) treatment. In particular, the relativistic losses might affect strongly the results, and therefore they have to be subtracted from the spectra prior the analysis. The normalization of the energy-loss function is performed assuming an uniform thickness of the investigated area, which is reasonably fulfilled for carefully prepared FIB samples. This procedure requires the presence of at least one reference material with known dielectric properties to determine the absolute thickness. Examples of measuring the dielectric constant for several materials and structures are presented. |
|---|---|
| AbstractList | Valence EELS combined with STEM provides an approach to determine the dielectric constant of materials in the optical range of frequencies. The paper describes the experimental procedure and discusses the critical aspects of valence electron energy-loss spectroscopy (VEELS) treatment. In particular, the relativistic losses might affect strongly the results, and therefore they have to be subtracted from the spectra prior the analysis. The normalization of the energy-loss function is performed assuming an uniform thickness of the investigated area, which is reasonably fulfilled for carefully prepared FIB samples. This procedure requires the presence of at least one reference material with known dielectric properties to determine the absolute thickness. Examples of measuring the dielectric constant for several materials and structures are presented. |
| Author | Engelmann, H.-J. Zschech, E. Potapov, P.L. Stöger-Pollach, M. |
| Author_xml | – sequence: 1 givenname: P.L. surname: Potapov fullname: Potapov, P.L. email: pavel.potapov@amd.com organization: AMD Saxony Fab36 LLC & Co. KG, Wilschdorfer Landstr. 101, D-01109 Dresden, Germany – sequence: 2 givenname: H.-J. surname: Engelmann fullname: Engelmann, H.-J. organization: AMD Saxony Fab36 LLC & Co. KG, Wilschdorfer Landstr. 101, D-01109 Dresden, Germany – sequence: 3 givenname: E. surname: Zschech fullname: Zschech, E. organization: AMD Saxony Fab36 LLC & Co. KG, Wilschdorfer Landstr. 101, D-01109 Dresden, Germany – sequence: 4 givenname: M. surname: Stöger-Pollach fullname: Stöger-Pollach, M. organization: Institute of Solid State Physics, University Service Centre for TEM (USTEM), Vienna University of Technology, Wiedner Hauptstr. 8-10/138, A-1040 Vienna, Austria |
| BackLink | https://www.ncbi.nlm.nih.gov/pubmed/18755592$$D View this record in MEDLINE/PubMed |
| BookMark | eNp9kE1LxDAQhoOsuB_6D0R68tY6Sds0vYiyrB-w4kE9hzSdaJZ-rEm74L83yy548zQD88wM7zMnk67vkJBLCgkFym82SWu167uEAYgEigSAn5AZFYWIM1bSCZlByUOfMjElc-83AEAzDmdkGqA8z0s2I3cvqPzobPcZDV8Y1RYb1IOzOtJ95wfVDVFvolYN6KxqfGRc30Y71WCnMVqt1m_n5NSEAV4c64J8PKzel0_x-vXxeXm_jnXG-BCnLFdVXilRVXUJQqSoCqUqoGlmWMURDVUGQ7CamrKouQCRMqCAQhWGK54uyPXh7tb13yP6QbbWa2wa1WE_esl5EUKnRQCzAxjkeO_QyK2zrXI_koLcm5MbeTAn9-YkFDKYC2tXx_tj1WL9t3RUFYDbA4Ah5c6ik17bvYbauqBM1r39_8MvEtyC-Q |
| CitedBy_id | crossref_primary_10_1016_j_surfin_2019_100347 crossref_primary_10_1063_1_3056659 crossref_primary_10_1143_JJAP_49_111501 crossref_primary_10_1063_1_4885876 crossref_primary_10_1063_5_0025536 crossref_primary_10_1016_j_mtcomm_2020_101209 crossref_primary_10_1016_j_ultramic_2016_07_003 crossref_primary_10_1017_S1431927616000106 crossref_primary_10_1093_jmicro_dfw023 crossref_primary_10_1016_j_ultramic_2014_05_010 crossref_primary_10_1016_j_micron_2021_103124 crossref_primary_10_1017_S1431927618000302 crossref_primary_10_1021_acsaelm_1c00824 crossref_primary_10_1017_S1431927612001328 crossref_primary_10_1021_acsphyschemau_2c00064 |
| Cites_doi | 10.1007/BF01390952 10.1016/j.micron.2006.02.007 10.1103/PhysRevLett.31.1487 10.1103/PhysRevLett.100.217402 10.1103/PhysRevB.56.6774 10.1016/j.ultramic.2006.04.024 10.1016/j.ultramic.2005.03.009 10.1016/j.ultramic.2007.03.005 10.1103/PhysRevB.12.64 10.1103/PhysRevB.76.165131 10.1016/j.micron.2008.01.023 10.1016/j.micron.2006.01.001 10.1093/oxfordjournals.jmicro.a023838 10.1016/0304-3991(95)00029-Z 10.1515/pm-2003-400403 |
| ContentType | Journal Article |
| Copyright | 2008 Elsevier Ltd |
| Copyright_xml | – notice: 2008 Elsevier Ltd |
| DBID | NPM AAYXX CITATION 7X8 |
| DOI | 10.1016/j.micron.2008.07.006 |
| DatabaseName | PubMed CrossRef MEDLINE - Academic |
| DatabaseTitle | PubMed CrossRef MEDLINE - Academic |
| DatabaseTitleList | MEDLINE - Academic PubMed |
| Database_xml | – sequence: 1 dbid: NPM name: PubMed url: https://proxy.k.utb.cz/login?url=http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed sourceTypes: Index Database |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Biology Physics |
| EISSN | 1878-4291 |
| EndPage | 268 |
| ExternalDocumentID | 10_1016_j_micron_2008_07_006 18755592 S0968432808001698 |
| Genre | Journal Article |
| GroupedDBID | --- --K --M .~1 0R~ 123 1B1 1RT 1~. 1~5 29M 4.4 457 4G. 53G 5VS 7-5 71M 8P~ 9JM 9JN AABXZ AACTN AAEDT AAEDW AAEPC AAIAV AAIKJ AAKOC AALRI AAOAW AAQFI AAQXK AAXUO ABFNM ABFRF ABGSF ABJNI ABMAC ABNEU ABUDA ABXDB ABXRA ABYKQ ACDAQ ACFVG ACGFO ACGFS ACNNM ACRLP ADBBV ADEZE ADMUD ADUVX AEBSH AEFWE AEHWI AEKER AENEX AEZYN AFKWA AFRZQ AFTJW AFXIZ AGHFR AGRDE AGUBO AGYEJ AHHHB AIEXJ AIKHN AITUG AIVDX AJBFU AJOXV ALMA_UNASSIGNED_HOLDINGS AMFUW AMRAJ ASPBG AVWKF AXJTR AZFZN BBWZM BKOJK BLXMC CS3 DOVZS DU5 EBS EFJIC EFLBG EJD EO8 EO9 EP2 EP3 F5P FDB FEDTE FGOYB FIRID FNPLU FYGXN G-Q GBLVA HMV HVGLF HZ~ IHE J1W KOM M38 M41 MAGPM MO0 N9A NDZJH O-L O9- OAUVE OGIMB OZT P-8 P-9 P2P PC. Q38 R2- RIG RNS ROL RPZ SDF SDG SDP SES SEW SPC SPCBC SPD SPG SSM SSQ SSU SSZ T5K UNMZH WUQ ~G- AAHBH AAXKI AFJKZ AKRWK NPM AAYXX CITATION 7X8 |
| ID | FETCH-LOGICAL-c426t-325ab5ba8bbd90883ea7aab0134f2b6eef1afe101d1f97d680832010e8a7f6a63 |
| IEDL.DBID | AIKHN |
| ISSN | 0968-4328 |
| IngestDate | Fri Aug 16 10:38:50 EDT 2024 Thu Sep 26 15:53:57 EDT 2024 Sat Sep 28 07:49:15 EDT 2024 Fri Feb 23 02:26:42 EST 2024 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 2 |
| Keywords | Kramers–Kronig transformation VEELS Cherenkov effect Dielectric constant Relativistic losses Dielectric properties Optical properties Valence EELS High-resolution EELS |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c426t-325ab5ba8bbd90883ea7aab0134f2b6eef1afe101d1f97d680832010e8a7f6a63 |
| Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
| PMID | 18755592 |
| PQID | 66729137 |
| PQPubID | 23479 |
| PageCount | 7 |
| ParticipantIDs | proquest_miscellaneous_66729137 crossref_primary_10_1016_j_micron_2008_07_006 pubmed_primary_18755592 elsevier_sciencedirect_doi_10_1016_j_micron_2008_07_006 |
| PublicationCentury | 2000 |
| PublicationDate | 2009-02-01 |
| PublicationDateYYYYMMDD | 2009-02-01 |
| PublicationDate_xml | – month: 02 year: 2009 text: 2009-02-01 day: 01 |
| PublicationDecade | 2000 |
| PublicationPlace | England |
| PublicationPlace_xml | – name: England |
| PublicationTitle | Micron (Oxford, England : 1993) |
| PublicationTitleAlternate | Micron |
| PublicationYear | 2009 |
| Publisher | Elsevier Ltd |
| Publisher_xml | – name: Elsevier Ltd |
| References | Gouillard, Kociak, Stephan, Botton, Colliex (bib8) 2007; 76 Vincent, Silcox (bib20) 1973; 31 Stöger-Pollach, Franco, Schattschneider, Lazar, Schaffer, Grogger, Zandbergen (bib16) 2006; 37 Erni, Browning (bib6) 2008; 108 Rafferty, Pennycook, Brown (bib14) 2000; 49 Engelmann (bib4) 2003; 40 Ioffe Physico-Technical Inst., 2007. New Semiconductor Materials: Characteristic and Properties. Yurtsever, Couillard, Muller (bib22) 2008; 100 De Abajo, F.J.G., 2007. Optical Data for Different Materials. Stöger-Pollach (bib15) 2008; 39 Giannuzzi, Kempshall, Schwarz, Lomness, Prenitzer, Stevie (bib7) 2005 Stöger-Pollach, Galek (bib17) 2006; 37 Stöger-Pollach, M., Laister, A., Schattschneider, P., Potapov, P.L., Engelmann, H.J., 2007. Removing relativistic effects for the determination of optical properties using EELS. In: Microscopy of Semiconducting Materials MSM XV, 2–5 April 2007, IoP Conf. Ser. XXX, in print. . Moreau, Brun, Walsch, Colliex, Howie (bib12) 1997; 56 Kröger (bib10) 1968; 216 Chen, Silcox, Vincent (bib1) 1975; 12 Muller, Silcox (bib13) 1995; 59 Erni, Browning (bib5) 2005; 104 Lazar, Botton, Zandbergen (bib11) 2006; 106 optical data. Personal communication. Egerton (bib3) 1996 Sze (bib19) 1981 Weisheit, M., 2007, HfO Egerton (10.1016/j.micron.2008.07.006_bib3) 1996 10.1016/j.micron.2008.07.006_bib21 Kröger (10.1016/j.micron.2008.07.006_bib10) 1968; 216 Lazar (10.1016/j.micron.2008.07.006_bib11) 2006; 106 Giannuzzi (10.1016/j.micron.2008.07.006_bib7) 2005 Sze (10.1016/j.micron.2008.07.006_bib19) 1981 Stöger-Pollach (10.1016/j.micron.2008.07.006_bib16) 2006; 37 Erni (10.1016/j.micron.2008.07.006_bib6) 2008; 108 Stöger-Pollach (10.1016/j.micron.2008.07.006_bib15) 2008; 39 Engelmann (10.1016/j.micron.2008.07.006_bib4) 2003; 40 Gouillard (10.1016/j.micron.2008.07.006_bib8) 2007; 76 Rafferty (10.1016/j.micron.2008.07.006_bib14) 2000; 49 Vincent (10.1016/j.micron.2008.07.006_bib20) 1973; 31 10.1016/j.micron.2008.07.006_bib2 Chen (10.1016/j.micron.2008.07.006_bib1) 1975; 12 Erni (10.1016/j.micron.2008.07.006_bib5) 2005; 104 Yurtsever (10.1016/j.micron.2008.07.006_bib22) 2008; 100 Stöger-Pollach (10.1016/j.micron.2008.07.006_bib17) 2006; 37 Moreau (10.1016/j.micron.2008.07.006_bib12) 1997; 56 10.1016/j.micron.2008.07.006_bib18 Muller (10.1016/j.micron.2008.07.006_bib13) 1995; 59 10.1016/j.micron.2008.07.006_bib9 |
| References_xml | – volume: 39 start-page: 1092 year: 2008 end-page: 1110 ident: bib15 article-title: Optical properties and bandgaps from low loss EELS: pitfalls and solutions publication-title: Micron contributor: fullname: Stöger-Pollach – volume: 59 start-page: 195 year: 1995 end-page: 213 ident: bib13 article-title: Delocalization in inelastic scattering publication-title: Ultramicroscopy contributor: fullname: Silcox – volume: 37 start-page: 396 year: 2006 end-page: 402 ident: bib16 article-title: Čherenkov losses: a limit for bandgap determination and Kramers–Kronig analysis publication-title: Micron contributor: fullname: Zandbergen – volume: 12 start-page: 64 year: 1975 end-page: 71 ident: bib1 article-title: Electron-energy losses in silicon: bulk and surface plasmons and Čherenkov radiation publication-title: Phys. Rev. B contributor: fullname: Vincent – volume: 56 start-page: 6774 year: 1997 end-page: 6781 ident: bib12 article-title: Relativistic effects in electron-energy-loss-spectroscopy observations of the Si/SiO publication-title: Phys. Rev. B contributor: fullname: Howie – volume: 31 start-page: 1487 year: 1973 end-page: 1490 ident: bib20 article-title: Dispersion of radiative surface plasmons in aluminum films by electron scattering publication-title: Phys. Rev. Lett. contributor: fullname: Silcox – volume: 216 start-page: 115 year: 1968 end-page: 135 ident: bib10 article-title: Berechnung der Energieverluste schneller Elektronen in dünnen Schichten mit Retardierung publication-title: Zeitschrift für Physik contributor: fullname: Kröger – volume: 100 start-page: 217402 year: 2008 ident: bib22 article-title: Formation of guided Cherenkov radiation in silicon-based nanocomposites publication-title: Phys. Rev. Lett. contributor: fullname: Muller – volume: 108 start-page: 84 year: 2008 end-page: 99 ident: bib6 article-title: The impact of surface and retardation losses on valence electron energy-loss spectroscopy publication-title: Ultramicroscopy contributor: fullname: Browning – volume: 76 start-page: 165131 year: 2007 ident: bib8 publication-title: Phys. Rev. B contributor: fullname: Colliex – volume: 40 start-page: 163 year: 2003 end-page: 174 ident: bib4 article-title: Advantages and disadvantages of TEM sample preparation using the FIB technique publication-title: Pract. Metallogr. contributor: fullname: Engelmann – volume: 104 start-page: 176 year: 2005 end-page: 192 ident: bib5 article-title: Valence electron energy-loss spectroscopy in monochromated scanning transmission electron microscopy publication-title: Ultramicroscopy contributor: fullname: Browning – volume: 106 start-page: 1091 year: 2006 end-page: 1103 ident: bib11 article-title: Enhancement of resolution in core-loss and low-loss spectroscopy in a monochromated microscope publication-title: Ultramicroscopy contributor: fullname: Zandbergen – start-page: 201 year: 2005 end-page: 228 ident: bib7 article-title: FIB lift-out specimen preparation techniques publication-title: Introduction to Focused Ion Beam contributor: fullname: Stevie – volume: 49 start-page: 517 year: 2000 end-page: 524 ident: bib14 article-title: Zero loss peak deconvolution for bandgap EEL spectra publication-title: J. Electron Microsc. contributor: fullname: Brown – year: 1981 ident: bib19 article-title: Physics of Semiconductor Devices contributor: fullname: Sze – year: 1996 ident: bib3 article-title: Electron Energy-Loss Spectroscopy in the Electron Microscope contributor: fullname: Egerton – volume: 37 start-page: 748 year: 2006 end-page: 750 ident: bib17 article-title: Comment on “Investigation on optical properties of ZnO nanowires by electron energy-loss spectroscopy” publication-title: Micron contributor: fullname: Galek – volume: 216 start-page: 115 year: 1968 ident: 10.1016/j.micron.2008.07.006_bib10 article-title: Berechnung der Energieverluste schneller Elektronen in dünnen Schichten mit Retardierung publication-title: Zeitschrift für Physik doi: 10.1007/BF01390952 contributor: fullname: Kröger – volume: 37 start-page: 748 year: 2006 ident: 10.1016/j.micron.2008.07.006_bib17 article-title: Comment on “Investigation on optical properties of ZnO nanowires by electron energy-loss spectroscopy” publication-title: Micron doi: 10.1016/j.micron.2006.02.007 contributor: fullname: Stöger-Pollach – ident: 10.1016/j.micron.2008.07.006_bib2 – start-page: 201 year: 2005 ident: 10.1016/j.micron.2008.07.006_bib7 article-title: FIB lift-out specimen preparation techniques contributor: fullname: Giannuzzi – volume: 31 start-page: 1487 year: 1973 ident: 10.1016/j.micron.2008.07.006_bib20 article-title: Dispersion of radiative surface plasmons in aluminum films by electron scattering publication-title: Phys. Rev. Lett. doi: 10.1103/PhysRevLett.31.1487 contributor: fullname: Vincent – volume: 100 start-page: 217402 year: 2008 ident: 10.1016/j.micron.2008.07.006_bib22 article-title: Formation of guided Cherenkov radiation in silicon-based nanocomposites publication-title: Phys. Rev. Lett. doi: 10.1103/PhysRevLett.100.217402 contributor: fullname: Yurtsever – volume: 56 start-page: 6774 year: 1997 ident: 10.1016/j.micron.2008.07.006_bib12 article-title: Relativistic effects in electron-energy-loss-spectroscopy observations of the Si/SiO2 interface plasmon peak publication-title: Phys. Rev. B doi: 10.1103/PhysRevB.56.6774 contributor: fullname: Moreau – volume: 106 start-page: 1091 year: 2006 ident: 10.1016/j.micron.2008.07.006_bib11 article-title: Enhancement of resolution in core-loss and low-loss spectroscopy in a monochromated microscope publication-title: Ultramicroscopy doi: 10.1016/j.ultramic.2006.04.024 contributor: fullname: Lazar – volume: 104 start-page: 176 year: 2005 ident: 10.1016/j.micron.2008.07.006_bib5 article-title: Valence electron energy-loss spectroscopy in monochromated scanning transmission electron microscopy publication-title: Ultramicroscopy doi: 10.1016/j.ultramic.2005.03.009 contributor: fullname: Erni – volume: 108 start-page: 84 year: 2008 ident: 10.1016/j.micron.2008.07.006_bib6 article-title: The impact of surface and retardation losses on valence electron energy-loss spectroscopy publication-title: Ultramicroscopy doi: 10.1016/j.ultramic.2007.03.005 contributor: fullname: Erni – volume: 12 start-page: 64 year: 1975 ident: 10.1016/j.micron.2008.07.006_bib1 article-title: Electron-energy losses in silicon: bulk and surface plasmons and Čherenkov radiation publication-title: Phys. Rev. B doi: 10.1103/PhysRevB.12.64 contributor: fullname: Chen – volume: 76 start-page: 165131 year: 2007 ident: 10.1016/j.micron.2008.07.006_bib8 publication-title: Phys. Rev. B doi: 10.1103/PhysRevB.76.165131 contributor: fullname: Gouillard – volume: 39 start-page: 1092 year: 2008 ident: 10.1016/j.micron.2008.07.006_bib15 article-title: Optical properties and bandgaps from low loss EELS: pitfalls and solutions publication-title: Micron doi: 10.1016/j.micron.2008.01.023 contributor: fullname: Stöger-Pollach – volume: 37 start-page: 396 year: 2006 ident: 10.1016/j.micron.2008.07.006_bib16 article-title: Čherenkov losses: a limit for bandgap determination and Kramers–Kronig analysis publication-title: Micron doi: 10.1016/j.micron.2006.01.001 contributor: fullname: Stöger-Pollach – ident: 10.1016/j.micron.2008.07.006_bib21 – volume: 49 start-page: 517 year: 2000 ident: 10.1016/j.micron.2008.07.006_bib14 article-title: Zero loss peak deconvolution for bandgap EEL spectra publication-title: J. Electron Microsc. doi: 10.1093/oxfordjournals.jmicro.a023838 contributor: fullname: Rafferty – ident: 10.1016/j.micron.2008.07.006_bib18 – year: 1981 ident: 10.1016/j.micron.2008.07.006_bib19 contributor: fullname: Sze – year: 1996 ident: 10.1016/j.micron.2008.07.006_bib3 contributor: fullname: Egerton – volume: 59 start-page: 195 year: 1995 ident: 10.1016/j.micron.2008.07.006_bib13 article-title: Delocalization in inelastic scattering publication-title: Ultramicroscopy doi: 10.1016/0304-3991(95)00029-Z contributor: fullname: Muller – volume: 40 start-page: 163 year: 2003 ident: 10.1016/j.micron.2008.07.006_bib4 article-title: Advantages and disadvantages of TEM sample preparation using the FIB technique publication-title: Pract. Metallogr. doi: 10.1515/pm-2003-400403 contributor: fullname: Engelmann – ident: 10.1016/j.micron.2008.07.006_bib9 |
| SSID | ssj0001460 |
| Score | 1.9782842 |
| Snippet | Valence EELS combined with STEM provides an approach to determine the dielectric constant of materials in the optical range of frequencies. The paper describes... |
| SourceID | proquest crossref pubmed elsevier |
| SourceType | Aggregation Database Index Database Publisher |
| StartPage | 262 |
| SubjectTerms | Cherenkov effect Dielectric constant Dielectric properties High-resolution EELS Kramers–Kronig transformation Optical properties Relativistic losses Valence EELS VEELS |
| Title | Measuring the dielectric constant of materials from valence EELS |
| URI | https://dx.doi.org/10.1016/j.micron.2008.07.006 https://www.ncbi.nlm.nih.gov/pubmed/18755592 https://search.proquest.com/docview/66729137 |
| Volume | 40 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LS8NAEB5sRfAivq3PPXiNJa9NclNKpT7aSy30FiabXahgWmx68OJvdyabKB6K4C0kWbKZXWa-nflmBuDaN65RCbvAyAA4gQ4zB3OMnFB5nouSjJTkbOThSA4mweM0nG5Ar8mFYVplrfutTq-0dX2nW0uzu5jNumMC33Hge1wYkUuKxC3YJHMUBG3YvHt4Goy-FTIpg8rVQu87PKDJoKtoXm_MeytqUiWXM5TrLNQ6BFpZovtd2KkhpLizs9yDDV3sw5ZtKvlBVxWpUy0P4HZYOQDJOAmCeSKf2Z43MyWURYWlmBtBkNXuQsGpJoJ2HgtB9PvP40OY3PdfegOn7pjgKLK0peN7IWZhhnGW5Uxg8jVGiOzqDIyXSa2Ni0bTn-euSaKc2274HA7XMUZGovSPoF3MC30CAvMkDhBzLyIAkPhhpjBRJlcRA7jExQ44jZTShS2MkTaMsdfUSrXucckRbtmBqBFl-muBU9Ldf4y8aiRPT5cc0MBCz1fLVEo6Grh-1IFjuyA_M6FjGJ2VvNN_f_UMtm3giJkr59Au31f6gvBHmV1C6-bTvax32RfYQNjO |
| link.rule.ids | 315,786,790,4521,24144,27955,27956,45618,45712 |
| linkProvider | Elsevier |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LT8MwDLYGCMEF8WY8c-Aapr7S9gZCmwZsXDYkbpWbJtKQ6CZWDlz47dhNK8QBIXGr2lRNncj-Yn-2AS4D61mdsguMDIAMTZRLLDCWkfZ9DxUZKcXZyONHNXwK75-j5w7ctrkwTKtsdL_T6bW2bu70Gmn2FrNZb0LgOwkDnwsjckmRZAXWGA0wr-vq85vnQaqgdrTQaMnD2_y5muT1yqy3sqFUcjFD9Zt9-g1_1nZosA1bDYAUN26OO9Ax5S6su5aSH3RVUzr1cg-ux7X7j0yTIJAnipnreDPTQjtMWIm5FQRY3R4UnGgiaN-xCES_P5rsw9OgP70dyqZfgtRkZysZ-BHmUY5JnhdMXwoMxojs6AytnytjrIfW0J8Xnk3jgptuBBwMNwnGVqEKDmC1nJfmCAQWaRIiFn5M5j8Nolxjqm2hY4ZvqYddkK2UsoUri5G1fLGXzEm16XDJ8W3VhbgVZfZjeTPS3H-8edFKnp4uOZyBpZm_LzOl6GDgBXEXDt2CfM-EDmF0UvKP__3VC9gYTsejbHT3-HACmy6ExByWU1it3t7NGSGRKj-vd9oXwPrZow |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Measuring+the+dielectric+constant+of+materials+from+valence+EELS&rft.jtitle=Micron+%28Oxford%2C+England+%3A+1993%29&rft.au=Potapov%2C+P+L&rft.au=Engelmann%2C+H-J&rft.au=Zschech%2C+E&rft.au=St%C3%B6ger-Pollach%2C+M&rft.date=2009-02-01&rft.issn=0968-4328&rft.volume=40&rft.issue=2&rft.spage=262&rft_id=info:doi/10.1016%2Fj.micron.2008.07.006&rft_id=info%3Apmid%2F18755592&rft.externalDocID=18755592 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0968-4328&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0968-4328&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0968-4328&client=summon |