The Positive and Negative Affect Schedule: Psychometric Properties of the Korean Version

• Published in: Psychiatry investigation Vol. 7; no. 3; pp. 163 - 169
• Main Authors: Lim, Young-Jin, Yu, Bum-Hee, Kim, Doh-Kwan, Kim, Ji-Hae
• Format: Journal Article
• Language: English
• Published: Korea (South) Korean Neuropsychiatric Association 01.09.2010; 대한신경정신의학회
• Subjects: Original; 정신과학; Positive affect; The Positive and Negative Affect Schedule; Negative affect
• ISSN: 1738-3684; 1976-3026; 1976-3026
• DOI: 10.4306/pi.2010.7.3.163

The Positive and Negative Affect Schedule (PANAS) was developed as a measure of positive affect (PA) and negative affect (NA). The aim here is to examine the factor structure and concurrent validity of the Korean version of the Positive and Negative Affect Schedule (K-PANAS) in a clinical sample in Korea. K-PANAS was administered to a clinical sample in Korea. Internal consistency, test-retest reliability, and confirmatory factor analysis (CFA) were undertaken to examine the factorial structure and reliability of the K-PANAS. The reliability of K-PANAS is satisfactory. CFA showed that several of the models commonly used in Western populations provided an insufficient fit. The modified model provided a more adequate fit to the data. The authors demonstrate that the K-PANAS has adequate psychometric properties, and that findings obtained in the West using PANAS were partially replicated.