In-situ two-step Raman thermometry for thermal characterization of monolayer graphene interface material

• Published in: Applied thermal engineering Vol. 113; pp. 481 - 489
• Main Authors: Zhao, Wenqiang, Chen, Wen, Yue, Yanan, Wu, Shijing
• Format: Journal Article
• Language: English
• Published: Oxford Elsevier Ltd 25.02.2017; Elsevier BV
• Subjects: Graphene; Graphite; Heat conductivity; Heat transfer; Interfacial thermal conductance; Laser beam heating; Phonons; Raman thermometry; Resistance; Scattering; Silicon dioxide; Thermal conductivity; Thermodynamic properties; Thermometry; Transport; Raman thermometry; Thermal conductivity; Interfacial thermal conductance; Graphene

An in-situ two-step Raman thermometry is developed to measure both interfacial thermal conductance between graphene and substrate, and in-plane thermal conductivity of graphene. [Display omitted] •In-situ two-step Raman method is developed for interfacial thermal characterization.•Both in-plane ther...