Ion Migration and Space‐Charge Zones in Metal Halide Perovskites Through Short‐Circuit Transient Current and Numerical Simulations
The inherent ion migration in metal halide perovskite materials is known to induce deleterious and highly unstable dark currents in X‐ and γ‐ray detectors based on those compounds upon bias application. Dark current slow drift with time is identified as one of the major drawbacks for these devices t...
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Published in | Advanced electronic materials Vol. 10; no. 11 |
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Main Authors | , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Wiley
01.11.2024
Wiley-VCH |
Subjects | |
Online Access | Get full text |
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