Head-Disk Interface Materials Issues in Heat-Assisted Magnetic Recording

In this paper, some issues concerning the reliability of heat-assisted magnetic recording (HAMR) media are highlighted. The large roughness of the grain structure originates from a surface energy mismatch between the FePt grains and the graphene-like segregant material. A simple roughness model, bas...

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Published inIEEE transactions on magnetics Vol. 50; no. 3; pp. 137 - 143
Main Authors Marchon, Bruno, Xing-Cai Guo, Pathem, Bala Krishna, Rose, Franck, Qing Dai, Feliss, Norbert, Schreck, Erhard, Reiner, James, Mosendz, Oleksandr, Takano, Kentaro, Hoa Do, Burns, John, Saito, Yoko
Format Journal Article Conference Proceeding
LanguageEnglish
Published New York, NY IEEE 01.03.2014
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Abstract In this paper, some issues concerning the reliability of heat-assisted magnetic recording (HAMR) media are highlighted. The large roughness of the grain structure originates from a surface energy mismatch between the FePt grains and the graphene-like segregant material. A simple roughness model, based on interfacial energies, is proposed that can quantitatively predict media grain structure and roughness. The thermal behavior of the disk lubricant is reviewed both experimentally as well as theoretically using molecular dynamics (MD) and density functional theory (DFT). The lubricant film can be subjected to evaporation and oxidation, both of which follow an Arrhenius reaction rate. MD also predicts that the disk carbon overcoat can undergo structural changes under thermal transient exposure in the nanosecond time frame, and Raman imaging performed on a disk zone that was HAMR written shows small but unequivocal changes, consistent with an increase in carbon sp 2 cluster size.
AbstractList In this paper, some issues concerning the reliability of heat-assisted magnetic recording (HAMR) media are highlighted. The large roughness of the grain structure originates from a surface energy mismatch between the FePt grains and the graphene-like segregant material. A simple roughness model, based on interfacial energies, is proposed that can quantitatively predict media grain structure and roughness. The thermal behavior of the disk lubricant is reviewed both experimentally as well as theoretically using molecular dynamics (MD) and density functional theory (DFT). The lubricant film can be subjected to evaporation and oxidation, both of which follow an Arrhenius reaction rate. MD also predicts that the disk carbon overcoat can undergo structural changes under thermal transient exposure in the nanosecond time frame, and Raman imaging performed on a disk zone that was HAMR written shows small but unequivocal changes, consistent with an increase in carbon rmsp 2 cluster size.
In this paper, some issues concerning the reliability of heat-assisted magnetic recording (HAMR) media are highlighted. The large roughness of the grain structure originates from a surface energy mismatch between the FePt grains and the graphene-like segregant material. A simple roughness model, based on interfacial energies, is proposed that can quantitatively predict media grain structure and roughness. The thermal behavior of the disk lubricant is reviewed both experimentally as well as theoretically using molecular dynamics (MD) and density functional theory (DFT). The lubricant film can be subjected to evaporation and oxidation, both of which follow an Arrhenius reaction rate. MD also predicts that the disk carbon overcoat can undergo structural changes under thermal transient exposure in the nanosecond time frame, and Raman imaging performed on a disk zone that was HAMR written shows small but unequivocal changes, consistent with an increase in carbon [Formula Omitted] cluster size.
In this paper, some issues concerning the reliability of heat-assisted magnetic recording (HAMR) media are highlighted. The large roughness of the grain structure originates from a surface energy mismatch between the FePt grains and the graphene-like segregant material. A simple roughness model, based on interfacial energies, is proposed that can quantitatively predict media grain structure and roughness. The thermal behavior of the disk lubricant is reviewed both experimentally as well as theoretically using molecular dynamics (MD) and density functional theory (DFT). The lubricant film can be subjected to evaporation and oxidation, both of which follow an Arrhenius reaction rate. MD also predicts that the disk carbon overcoat can undergo structural changes under thermal transient exposure in the nanosecond time frame, and Raman imaging performed on a disk zone that was HAMR written shows small but unequivocal changes, consistent with an increase in carbon sp 2 cluster size.
Author Marchon, Bruno
Xing-Cai Guo
Qing Dai
Burns, John
Mosendz, Oleksandr
Pathem, Bala Krishna
Feliss, Norbert
Saito, Yoko
Rose, Franck
Schreck, Erhard
Takano, Kentaro
Hoa Do
Reiner, James
Author_xml – sequence: 1
  givenname: Bruno
  surname: Marchon
  fullname: Marchon, Bruno
  email: bruno.marchon@hgst.com
  organization: HGST, Western Digital Co., San Jose, CA, USA
– sequence: 2
  surname: Xing-Cai Guo
  fullname: Xing-Cai Guo
  organization: HGST, Western Digital Co., San Jose, CA, USA
– sequence: 3
  givenname: Bala Krishna
  surname: Pathem
  fullname: Pathem, Bala Krishna
  organization: HGST, Western Digital Co., San Jose, CA, USA
– sequence: 4
  givenname: Franck
  surname: Rose
  fullname: Rose, Franck
  organization: HGST, Western Digital Co., San Jose, CA, USA
– sequence: 5
  surname: Qing Dai
  fullname: Qing Dai
  organization: HGST, Western Digital Co., San Jose, CA, USA
– sequence: 6
  givenname: Norbert
  surname: Feliss
  fullname: Feliss, Norbert
  organization: HGST, Western Digital Co., San Jose, CA, USA
– sequence: 7
  givenname: Erhard
  surname: Schreck
  fullname: Schreck, Erhard
  organization: HGST, Western Digital Co., San Jose, CA, USA
– sequence: 8
  givenname: James
  surname: Reiner
  fullname: Reiner, James
  organization: HGST, Western Digital Co., San Jose, CA, USA
– sequence: 9
  givenname: Oleksandr
  surname: Mosendz
  fullname: Mosendz, Oleksandr
  organization: HGST, Western Digital Co., San Jose, CA, USA
– sequence: 10
  givenname: Kentaro
  surname: Takano
  fullname: Takano, Kentaro
  organization: HGST, Western Digital Co., San Jose, CA, USA
– sequence: 11
  surname: Hoa Do
  fullname: Hoa Do
  organization: HGST, Western Digital Co., San Jose, CA, USA
– sequence: 12
  givenname: John
  surname: Burns
  fullname: Burns, John
  organization: HGST, Western Digital Co., San Jose, CA, USA
– sequence: 13
  givenname: Yoko
  surname: Saito
  fullname: Saito, Yoko
  organization: HGST, Hiratsuka, Japan
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=28481814$$DView record in Pascal Francis
BookMark eNpdkE1LAzEQhoMoWD9-gHhZEMHL1kw-dpNj8aMtWASp55AmsxKtWU22B_-9KS0ePM0M87zDO-8JOYx9REIugI4BqL5dLibTMaPAx4wpTht1QEagBdSUNvqQjCgFVWvRiGNykvN7GYUEOiKzGVpf34f8Uc3jgKmzDquFLV2w61zNc95grkKsCjfUk5xDHtAX4i3iEFz1gq5PPsS3M3LUFQWe7-speX18WN7N6qfn6fxu8lQ7wdhQO9kx6ZEpEI3icuU0cmv1SmnnGXrutJXUy0byxvtWrCi1rpEKwQq2kqLjp-Rmd_cr9d_F22A-Q3a4XtuI_SYbaNpWc6aFKOjVP_S936RY3BmQVEOrWwWFgh3lUp9zws58pfBp048BarbZmm22Zput2WdbNNf7yzY7u-6SjS7kPyFTQkH5sHCXOy4g4t-6OBRaaP4LxG6CWQ
CODEN IEMGAQ
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ContentType Journal Article
Conference Proceeding
Copyright 2015 INIST-CNRS
Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Mar 2014
Copyright_xml – notice: 2015 INIST-CNRS
– notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Mar 2014
DBID 97E
RIA
RIE
IQODW
AAYXX
CITATION
7SP
7U5
8BQ
8FD
JG9
L7M
F28
FR3
DOI 10.1109/TMAG.2013.2283068
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005-present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library Online
Pascal-Francis
CrossRef
Electronics & Communications Abstracts
Solid State and Superconductivity Abstracts
METADEX
Technology Research Database
Materials Research Database
Advanced Technologies Database with Aerospace
ANTE: Abstracts in New Technology & Engineering
Engineering Research Database
DatabaseTitle CrossRef
Materials Research Database
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
METADEX
Electronics & Communications Abstracts
Engineering Research Database
ANTE: Abstracts in New Technology & Engineering
DatabaseTitleList Materials Research Database
Materials Research Database

Database_xml – sequence: 1
  dbid: RIE
  name: IEEE
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1941-0069
EndPage 143
ExternalDocumentID 3252918161
10_1109_TMAG_2013_2283068
28481814
6774949
Genre orig-research
GroupedDBID -~X
0R~
29I
4.4
5GY
5VS
6IK
97E
AAJGR
AASAJ
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
ACNCT
AENEX
AETIX
AI.
AIBXA
AKJIK
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
H~9
IAAWW
IBMZZ
ICLAB
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
MS~
O9-
OCL
P2P
RIA
RIE
RIG
RNS
TN5
TWZ
VH1
VJK
XFK
XXG
ABPTK
IQODW
AAYXX
CITATION
7SP
7U5
8BQ
8FD
JG9
L7M
F28
FR3
ID FETCH-LOGICAL-c422t-c5f25de28146835bc9e3aa9b89cd2ed3c9a50d56536dd74b00ac658e1a42b54f3
IEDL.DBID RIE
ISSN 0018-9464
IngestDate Fri Aug 16 07:57:38 EDT 2024
Thu Oct 10 18:32:06 EDT 2024
Fri Aug 23 03:15:46 EDT 2024
Sun Oct 22 16:05:27 EDT 2023
Wed Jun 26 19:28:03 EDT 2024
IsPeerReviewed false
IsScholarly true
Issue 3
Keywords Head disk interface
heat-assisted magnetic recording (HAMR)
Lubricants
Head-disk interface (HDI)
Disks
lubricant
Magnetic recording
Magnetic properties
Tribology
Language English
License CC BY 4.0
LinkModel DirectLink
MeetingName SELECTED PAPERS FROM THE 24TH MAGNETIC RECORDING CONFERENCE (TMRC 2013), Tokyo, Japan, August 20-22, 2013
MergedId FETCHMERGED-LOGICAL-c422t-c5f25de28146835bc9e3aa9b89cd2ed3c9a50d56536dd74b00ac658e1a42b54f3
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
PQID 1509179781
PQPubID 85461
PageCount 7
ParticipantIDs pascalfrancis_primary_28481814
crossref_primary_10_1109_TMAG_2013_2283068
proquest_miscellaneous_1677932944
proquest_journals_1509179781
ieee_primary_6774949
PublicationCentury 2000
PublicationDate 2014-03-01
PublicationDateYYYYMMDD 2014-03-01
PublicationDate_xml – month: 03
  year: 2014
  text: 2014-03-01
  day: 01
PublicationDecade 2010
PublicationPlace New York, NY
PublicationPlace_xml – name: New York, NY
– name: New York
PublicationTitle IEEE transactions on magnetics
PublicationTitleAbbrev TMAG
PublicationYear 2014
Publisher IEEE
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: Institute of Electrical and Electronics Engineers
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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– ident: ref30
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SSID ssj0014510
Score 2.2787411
Snippet In this paper, some issues concerning the reliability of heat-assisted magnetic recording (HAMR) media are highlighted. The large roughness of the grain...
SourceID proquest
crossref
pascalfrancis
ieee
SourceType Aggregation Database
Index Database
Publisher
StartPage 137
SubjectTerms Carbon
Cross-disciplinary physics: materials science; rheology
Disks
Exact sciences and technology
Grain structure
Head-disk interface (HDI)
Heat-assisted magnetic recording
heat-assisted magnetic recording (HAMR)
lubricant
Lubricants
Magnetic recording
Magnetism
Materials science
Mathematical models
Media
Nanostructure
Other topics in materials science
Physics
Rough surfaces
Roughness
Surface roughness
Temperature measurement
tribology
Title Head-Disk Interface Materials Issues in Heat-Assisted Magnetic Recording
URI https://ieeexplore.ieee.org/document/6774949
https://www.proquest.com/docview/1509179781
https://search.proquest.com/docview/1677932944
Volume 50
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT9wwEB7BSkj00JaXGgoolTghvCSO8_ARlcIKaXsCiVvkxxghpCzqZi_99YztbERbDr1FshU7_mbiz54XwGmBNst0gQxNWTPSRMd0rSqmUTpOUt1YFbJ9_qxm9-L2oXzYgPMxFgYRg_MZTv1jsOXbhVn5q7KLiriKFHITNmspY6zWaDEQZR7DTfLGl40XgwUzz-TF3fzyxjtxFdOQ7spnVX2zB4WiKt4lUi1pVVwsZ_HPnzlsN9efYL6eaPQyeZ6uej01v__K4fi_X_IZPg68M72MgrIDG9jtwoc32Qh3YSt4g5rlHsxmhDy7elo-p-HG0CmD6Vz1UVrTWLEvfepS6tczQtjLiqUej52PiUzjmZZeug_31z_uvs_YUHKBGcF5z0zpeGmR-4tB4mbaSCyUkrqRxnK0hZGqzCyRwKKythaks8oQh8FcCa5L4YoDmHSLDr9AKipdZ41TpRC1wCaTja7ofKmcyzlXrkngbA1C-xIza7ThRJLJ1iPWesTaAbEE9vwijh2H9Uvg5A_YxnbuqwTQRyRwtMaxHZRz2eaeJNU-2VcC38ZmUitvK1EdLlbUh0YgaiuFOHx_6K-wTRMU0R3tCCb9rxUeEz_p9UkQzFdR1uEN
link.rule.ids 310,311,315,783,787,792,793,799,23942,23943,25152,27936,27937,55086
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Lb9QwEB6VIkR74NFSESglSJwQ3iaO8_CxAkqAbk9bqbfIjzGqKmWrbvbCr-_YzkblceAWyVbs-JuJP3teAO8LtFmmC2RoypqRJjqma1UxjdJxkurGqpDt87xqL8T3y_JyCz5OsTCIGJzPcOYfgy3fLs3aX5UdV8RVpJAP4CHx6qaK0VqTzUCUeQw4yRtfOF6MNsw8k8eL-clX78ZVzELCK59X9d4uFMqqeKdItaJ1cbGgxV__5rDhnD6F-Waq0c_kerYe9Mz8-iOL4_9-yzN4MjLP9CSKynPYwn4Pdu_lI9yDR8Ef1Kz2oW0Je_b5anWdhjtDpwymczVEeU1jzb70qk-p38AIYy8tlnr87H1UZBpPtfTSF3Bx-mXxqWVj0QVmBOcDM6XjpUXurwaJnWkjsVBK6kYay9EWRqoys0QDi8raWpDWKkMsBnMluC6FKw5gu1_2-BJSUek6a5wqhagFNplsdEUnTOVczrlyTQIfNiB0NzG3RhfOJJnsPGKdR6wbEUtg3y_i1HFcvwSOfoNtaue-TgB9RAKHGxy7UT1XXe5pUu3TfSXwbmomxfLWEtXjck19aAQit1KIV_8e-i08bhfzs-7s2_mP17BDkxXROe0QtofbNb4htjLooyCkdz2w5Fg
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=IEEE+transactions+on+magnetics&rft.atitle=Head-Disk+Interface+Materials+Issues+in+Heat-Assisted+Magnetic+Recording&rft.au=MARCHON%2C+Bruno&rft.au=GUO%2C+Xing-Cai&rft.au=HOA+DO&rft.au=BURNS%2C+John&rft.date=2014-03-01&rft.pub=Institute+of+Electrical+and+Electronics+Engineers&rft.issn=0018-9464&rft.eissn=1941-0069&rft.volume=50&rft.issue=3&rft_id=info:doi/10.1109%2FTMAG.2013.2283068&rft.externalDBID=n%2Fa&rft.externalDocID=28481814
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9464&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9464&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9464&client=summon