Impact of current-induced degradation process on the electro-optical characteristics of InGaN/GaN multiple-quantum-well photodetectors fabricated on sapphire substrate - Dalapati, Pradip; Yamamoto, Kosuke; Egawa, Takashi; Miyoshi, Makoto (Applied Physics Letters, 2021)
Keywords: Applied physics; Carrier density; Current leakage; Defects; Degradation; Gallium nitrides; Indium gallium nitrides; Optical measurement; Optical properties; Photometers; Quantum efficiency; Quantum wells; Sapphire; Substrates