APA (7th ed.) Citation

Dalapati, P., Yamamoto, K., Egawa, T., & Miyoshi, M. (2021). Impact of current-induced degradation process on the electro-optical characteristics of InGaN/GaN multiple-quantum-well photodetectors fabricated on sapphire substrate. Applied Physics Letters, 118(2), . https://doi.org/10.1063/5.0027127

Chicago Style (17th ed.) Citation

Dalapati, Pradip, Kosuke Yamamoto, Takashi Egawa, and Makoto Miyoshi. "Impact of Current-induced Degradation Process on the Electro-optical Characteristics of InGaN/GaN Multiple-quantum-well Photodetectors Fabricated on Sapphire Substrate." Applied Physics Letters 118, no. 2 (2021). https://doi.org/10.1063/5.0027127.

MLA (9th ed.) Citation

Dalapati, Pradip, et al. "Impact of Current-induced Degradation Process on the Electro-optical Characteristics of InGaN/GaN Multiple-quantum-well Photodetectors Fabricated on Sapphire Substrate." Applied Physics Letters, vol. 118, no. 2, 2021, https://doi.org/10.1063/5.0027127.