Face Recognition Using Dense SIFT Feature Alignment
This paper addresses face recognition problem in a more challenging scenario where the training and test samples are both subject to the visual variations of poses, expressions and misalignments. We employ dense Scale-invariant feature transform(SIFT) feature matching as a generic transformation to...
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Published in | Chinese Journal of Electronics Vol. 25; no. 6; pp. 1034 - 1039 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
Published by the IET on behalf of the CIE
01.11.2016
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Subjects | |
Online Access | Get full text |
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