Face Recognition Using Dense SIFT Feature Alignment

This paper addresses face recognition problem in a more challenging scenario where the training and test samples are both subject to the visual variations of poses, expressions and misalignments. We employ dense Scale-invariant feature transform(SIFT) feature matching as a generic transformation to...

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Bibliographic Details
Published inChinese Journal of Electronics Vol. 25; no. 6; pp. 1034 - 1039
Main Authors Zhou, Quan, Shafiq, ur Rehman, Zhou, Yu, Wei, Xin, Wang, Lei, Zheng, Baoyu
Format Journal Article
LanguageEnglish
Published Published by the IET on behalf of the CIE 01.11.2016
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