Detecting signals of new technological opportunities using semantic patent analysis and outlier detection

• Published in: Scientometrics Vol. 90; no. 2; pp. 445 - 461
• Main Authors: Yoon, Janghyeok, Kim, Kwangsoo
• Format: Journal Article
• Language: English
• Published: Dordrecht Springer Netherlands 01.02.2012; Springer
• Subjects: Bibliometrics. Scientometrics; Bibliometrics. Scientometrics. Evaluation; Computer Science; Data mining; Exact sciences and technology; Information and communication sciences; Information science. Documentation; Information Storage and Retrieval; Library and information science. General aspects; Library Science; Research and development; Sciences and techniques of general use; Scientometrics; Semantic analysis; Subject–action–object (SAO) structure; C63; Technological opportunity; Research and development (R&D) planning; Patent mining; Outlier detection; Semantic patent similarity; C82; Multidimensional scaling (MDS); Patents; Correlation analysis; Semantic analysis; Scientific research; Research and development

In the competitive business environment, early identification of technological opportunities is crucial for technology strategy formulation and research and development planning. There exist previous studies that identify technological directions or areas from a broad view for technological opportun...