Integrated Optical Six-Port Reflectometer in Silicon on Insulator

The six-port reflectometer technique enables simple and accurate measurement of optical reflection coefficients in both magnitude and phase. The reflection coefficient is computed from four power measurements of linear combinations of the waves incident and reflected from the device under test. Whil...

Full description

Saved in:
Bibliographic Details
Published inJournal of lightwave technology Vol. 27; no. 23; pp. 5405 - 5409
Main Authors Halir, R., Ortega-Moux, A., Molina-Fernandez, I., Wanguemert-Perez, J.G., Cheben, P., Dan-Xia Xu, Lamontagne, B., Janz, S.
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.12.2009
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Online AccessGet full text

Cover

Loading…