Composition Analysis by STEM-EDX of Ternary Semiconductors by Internal References

A practical method to determine the composition within ternary heterostructured semiconductor compounds using energy-dispersive X-ray spectroscopy in scanning transmission electron microscopy is presented. The method requires minimal external input factors such as user-determined or calculated sensi...

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 28; no. 1; pp. 61 - 69
Main Authors Nilsen, Julie Stene, van Helvoort, Antonius T. J.
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.02.2022
Oxford University Press
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