Measuring Patent Similarity Based on Text Mining and Image Recognition - Lin, Wenguang; Yu, Wenqiang; Xiao, Renbin (Systems (Basel), 2023)
Keywords: Algorithms; Bibliometrics; Clustering; Computational linguistics; Data mining; Deep learning; Globalization; image contour extraction; Infringement; Intellectual property; Language processing; Measurement; Natural language interfaces; Neural networks; Patent applications; Patent infringement; patent similarity; R&D; Research & development; SAO structure; Semantics; Similarity; text mining; Validity; Vector spaces; China; United States--US