Characterizing, modeling, and analyzing soft error propagation in asynchronous and synchronous digital circuits

• Published in: Microelectronics and reliability Vol. 55; no. 1; pp. 238 - 250
• Main Authors: Bany Hamad, Ghaith, Hasan, Syed Rafay, Ait Mohamed, Otmane, Savaria, Yvon
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01.01.2015
• Subjects: Asynchronous; Circuit design; Circuits; Digital circuits; Estimates; Higher abstraction level; MDG; Methodology; Radiation tolerance; SEGP-Finder; SER; Soft errors; State of the art; Synchronous; MDG; SER; SEGP-Finder; Asynchronous; Higher abstraction level; Soft errors

•Analysis of soft error propagation in asynchronous and synchronous digital designs.•Modeling electrical and logical masking at gate level by utilizing MDG and GP sets.•Identification of soft error propagation critical inputs sequences.•Faster, efficient, and more accurate estimation of the soft err...