Toward Automatic Measurement of the Linewidth-Enhancement Factor Using Optical Feedback Self-Mixing Interferometry With Weak Optical Feedback

This paper proposes an approach for automatically measuring the linewidth-enhancement factor (LEF) of semiconductor lasers using optical feedback self-mixing interferometry (OFSMI), which works in weak optical feedback regime and where the external target is subject to simple harmonic vibration with...

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Published inIEEE journal of quantum electronics Vol. 43; no. 7; pp. 527 - 534
Main Authors Yanguang Yu, Jiangtao Xi, Chicharo, J.F., Bosch, T.
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.07.2007
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Abstract This paper proposes an approach for automatically measuring the linewidth-enhancement factor (LEF) of semiconductor lasers using optical feedback self-mixing interferometry (OFSMI), which works in weak optical feedback regime and where the external target is subject to simple harmonic vibration with unknown vibration frequency and magnitude. According to well-known Lang-Kobayashi theory the waveform of the modulated optical output power from the OFSMI system is influenced by multiple parameters, including the LEF, the optical feedback level factor, and the parameters related to the movement of external target. In order to estimate LEF, other parameters must also be considered and, hence, a multiple parameter estimation strategy is required. We propose a solution for this multiple parameter estimation problem based on the principle of data-to-theoretical model match. In particular, a strategy for minimizing a cost function in order to achieve the best fitting is proposed with which all the unknown parameters can be estimated. The performance of the proposed approach is tested using experimental data in comparison with other two approaches. It is seen that, over different experimental signals, the standard deviation for estimated LEF is less than 4.58% on average, which shows that results have excellent consistency. Moreover, the proposed approach also provides a solution for vibration measurement (that is, vibration frequency and magnitude).
AbstractList This paper proposes an approach for automatically measuring the linewidth-enhancement factor (LEF) of semiconductor lasers using optical feedback self-mixing interferometry (OFSMI), which works in weak optical feedback regime and where the external target is subject to simple harmonic vibration with unknown vibration frequency and magnitude. According to well- known Lang-Kobayashi theory the waveform of the modulated optical output power from the OFSMI system is influenced by multiple parameters, including the LEF, the optical feedback level factor, and the parameters related to the movement of external target. In order to estimate LEF, other parameters must also be considered and, hence, a multiple parameter estimation strategy is required. We propose a solution for this multiple parameter estimation problem based on the principle of data-to-theoretical model match. In particular, a strategy for minimizing a cost function in order to achieve the best fitting is proposed with which all the unknown parameters can be estimated. The performance of the proposed approach is tested using experimental data in comparison with other two approaches. It is seen that, over different experimental signals, the standard deviation for estimated LEF is less than 4.58% on average, which shows that results have excellent consistency. Moreover, the proposed approach also provides a solution for vibration measurement (that is, vibration frequency and magnitude).
According to well-known Lang-Kobayashi theory the waveform of the modulated optical output power from the OFSMI system is influenced by multiple parameters, including the LEF, the optical feedback level factor, and the parameters related to the movement of external target.
Author Bosch, T.
Chicharo, J.F.
Jiangtao Xi
Yanguang Yu
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Issue 7
Keywords self-mixing effect
Output power
semiconductor laser
Vibration measurement
Measuring methods
Fitting algorithm
Line broadening
Algorithms
Semiconductor lasers
Optical feedback
Automatic measurement
linewidth-enhancement factor (LEF)
optical feedback interferometry
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Snippet This paper proposes an approach for automatically measuring the linewidth-enhancement factor (LEF) of semiconductor lasers using optical feedback self-mixing...
According to well-known Lang-Kobayashi theory the waveform of the modulated optical output power from the OFSMI system is influenced by multiple parameters,...
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SubjectTerms Consistency
Exact sciences and technology
Fitting algorithm
Frequency measurement
Fundamental areas of phenomenology (including applications)
Interferometry
Laser feedback
Laser theory
Lasers
linewidth-enhancement factor (LEF)
Mathematical models
Optical feedback
optical feedback interferometry
Optical interferometry
Optical modulation
Optics
Parameter estimation
Physics
Power generation
self-mixing effect
semiconductor laser
Semiconductor lasers
Semiconductor lasers; laser diodes
Standard deviation
Strategy
Studies
Vibration
Vibration measurement
Title Toward Automatic Measurement of the Linewidth-Enhancement Factor Using Optical Feedback Self-Mixing Interferometry With Weak Optical Feedback
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