Path-Integral Calculation of the Second Dielectric and Refractivity Virial Coefficients of Helium, Neon, and Argon
We present a method to calculate dielectric and refractivity virial coefficients using the path-integral Monte Carlo formulation of quantum statistical mechanics and validate it by comparing our results with equivalent calculations in the literature and with more traditional quantum calculations bas...
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Published in | Journal of research of the National Institute of Standards and Technology Vol. 125; pp. 125022 - 24 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
United States
Superintendent of Documents
06.08.2020
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
Subjects | |
Online Access | Get full text |
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Summary: | We present a method to calculate dielectric and refractivity virial coefficients
using the path-integral Monte Carlo formulation of quantum statistical mechanics and
validate it by comparing our results with equivalent calculations in the literature and
with more traditional quantum calculations based on wavefunctions. We use
state-of-the-art pair potentials and polarizabilities to calculate the second dielectric
and refractivity virial coefficients of helium (both 3He and 4He), neon (both 20Ne and
22Ne), and argon. Our calculations extend to temperatures as low as 1 K for helium, 4 K
for neon, and 50 K for argon. We estimate the contributions to the uncertainty of the
calculated dielectric virial coefficients for helium and argon, finding that the
uncertainty of the pair polarizability is by far the greatest contribution. Agreement
with the limited experimental data available is generally good, but our results have
smaller uncertainties, especially for helium. Our approach can be generalized in a
straightforward manner to higher-order coefficients. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 content type line 23 |
ISSN: | 2165-7254 1044-677X 2165-7254 |
DOI: | 10.6028/jres.125.022 |