Deep LAC: Deep localization, alignment and classification for fine-grained recognition

We propose a fine-grained recognition system that incorporates part localization, alignment, and classification in one deep neural network. This is a nontrivial process, as the input to the classification module should be functions that enable back-propagation in constructing the solver. Our major c...

Full description

Saved in:
Bibliographic Details
Published in2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) pp. 1666 - 1674
Main Authors Di Lin, Xiaoyong Shen, Cewu Lu, Jiaya Jia
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.06.2015
Subjects
Online AccessGet full text

Cover

Loading…