Deep LAC: Deep localization, alignment and classification for fine-grained recognition
We propose a fine-grained recognition system that incorporates part localization, alignment, and classification in one deep neural network. This is a nontrivial process, as the input to the classification module should be functions that enable back-propagation in constructing the solver. Our major c...
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Published in | 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) pp. 1666 - 1674 |
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Main Authors | , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.06.2015
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Subjects | |
Online Access | Get full text |
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