Wicherts, J. M., Dolan, C. V., Hessen, D. J., Oosterveld, P., van Baal, G. C. M., Boomsma, D. I., & Span, M. M. (2004). Are intelligence tests measurement invariant over time? Investigating the nature of the Flynn effect. Intelligence (Norwood), 32(5), 509-537. https://doi.org/10.1016/j.intell.2004.07.002
Chicago Style (17th ed.) CitationWicherts, Jelte M., Conor V. Dolan, David J. Hessen, Paul Oosterveld, G. Caroline M. van Baal, Dorret I. Boomsma, and Mark M. Span. "Are Intelligence Tests Measurement Invariant over Time? Investigating the Nature of the Flynn Effect." Intelligence (Norwood) 32, no. 5 (2004): 509-537. https://doi.org/10.1016/j.intell.2004.07.002.
MLA (9th ed.) CitationWicherts, Jelte M., et al. "Are Intelligence Tests Measurement Invariant over Time? Investigating the Nature of the Flynn Effect." Intelligence (Norwood), vol. 32, no. 5, 2004, pp. 509-537, https://doi.org/10.1016/j.intell.2004.07.002.