High resolution imaging analysis of CdSe/ZnS core–shell quantum dots (QDs) using Cs-corrected HR-TEM/STEM

CdSe/ZnS core–shell structured nano-crystal quantum dots (QDs) are ideal candidates for light-emission applications due to their high quantum efficiency, narrow-band, and particle-size-tunable photoluminescence. In particular, their small size results in the quantum confinement of semiconductor nano...

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Published inJournal of materials science. Materials in electronics Vol. 24; no. 10; pp. 3744 - 3748
Main Authors Shin, Huiyoun, Jang, Dongseon, Jang, Youngil, Cho, Myungju, Park, Kyuho
Format Journal Article
LanguageEnglish
Published Boston Springer US 01.10.2013
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Abstract CdSe/ZnS core–shell structured nano-crystal quantum dots (QDs) are ideal candidates for light-emission applications due to their high quantum efficiency, narrow-band, and particle-size-tunable photoluminescence. In particular, their small size results in the quantum confinement of semiconductor nano-crystals, which widens their energy gaps. In general, high resolution imaging analyses of QDs using a transmission electron microscope are very difficult due to their significantly small size. Successful imaging depends on the capabilities of TEM equipment and the contrast of the QDs sample relative to the supporting film. In this work, all imaging analyses were performed on a TEM equipped with a probe Cs corrector. The samples for observing QDs were prepared by drying each QDs solution on a lacey carbon Cu (300 mesh) grid previously coated with an ultra-thin graphene monolayer (thickness = 0.3 nm), due to the need to minimize the effect of the supported film.
AbstractList CdSe/ZnS core–shell structured nano-crystal quantum dots (QDs) are ideal candidates for light-emission applications due to their high quantum efficiency, narrow-band, and particle-size-tunable photoluminescence. In particular, their small size results in the quantum confinement of semiconductor nano-crystals, which widens their energy gaps. In general, high resolution imaging analyses of QDs using a transmission electron microscope are very difficult due to their significantly small size. Successful imaging depends on the capabilities of TEM equipment and the contrast of the QDs sample relative to the supporting film. In this work, all imaging analyses were performed on a TEM equipped with a probe Cs corrector. The samples for observing QDs were prepared by drying each QDs solution on a lacey carbon Cu (300 mesh) grid previously coated with an ultra-thin graphene monolayer (thickness = 0.3 nm), due to the need to minimize the effect of the supported film.
CdSe/ZnS core-shell structured nano-crystal quantum dots (QDs) are ideal candidates for light-emission applications due to their high quantum efficiency, narrow-band, and particle-size-tunable photoluminescence. In particular, their small size results in the quantum confinement of semiconductor nano-crystals, which widens their energy gaps. In general, high resolution imaging analyses of QDs using a transmission electron microscope are very difficult due to their significantly small size. Successful imaging depends on the capabilities of TEM equipment and the contrast of the QDs sample relative to the supporting film. In this work, all imaging analyses were performed on a TEM equipped with a probe Cs corrector. The samples for observing QDs were prepared by drying each QDs solution on a lacey carbon Cu (300 mesh) grid previously coated with an ultra-thin graphene monolayer (thickness = 0.3 nm), due to the need to minimize the effect of the supported film.[PUBLICATION ABSTRACT]
CdSe/ZnS core-shell structured nano-crystal quantum dots (QDs) are ideal candidates for light-emission applications due to their high quantum efficiency, narrow-band, and particle-size-tunable photoluminescence. In particular, their small size results in the quantum confinement of semiconductor nano-crystals, which widens their energy gaps. In general, high resolution imaging analyses of QDs using a transmission electron microscope are very difficult due to their significantly small size. Successful imaging depends on the capabilities of TEM equipment and the contrast of the QDs sample relative to the supporting film. In this work, all imaging analyses were performed on a TEM equipped with a probe Cs corrector. The samples for observing QDs were prepared by drying each QDs solution on a lacey carbon Cu (300 mesh) grid previously coated with an ultra-thin graphene monolayer (thickness = 0.3 nm), due to the need to minimize the effect of the supported film.
Author Cho, Myungju
Park, Kyuho
Jang, Dongseon
Jang, Youngil
Shin, Huiyoun
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  givenname: Dongseon
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  fullname: Jang, Dongseon
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  surname: Park
  fullname: Park, Kyuho
  organization: Materials Characterization Team, Materials and Components Laboratory, LG Electronics Advanced Research Institute
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CitedBy_id crossref_primary_10_1007_s10854_015_3241_7
crossref_primary_10_1021_acsnano_6b01266
crossref_primary_10_1155_2015_764712
Cites_doi 10.1021/bc034153y
10.1021/cr030063a
10.1007/s11671-008-9125-5
10.1016/S0304-3991(98)00035-7
10.1063/1.3337091
10.1063/1.447218
10.1117/12.587248
10.1021/cr00098a010
10.1021/jp9530562
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Issue 10
Keywords Graphene Membrane
Graphene Monolayer
Transmission Electron Microscope Specimen
Stem HAADF Image
CdSe Core
Quantum confinement
Tunable circuit
Particle size
High resolution
Quantum dot
Photoluminescence
Coatings
Zinc sulfide
Energy gap
Light emission
Imaging
Nanodot
Copper
Scanning transmission electron microscopy
Nanocrystal
Ultrathin films
II-VI compound
Core shell structure
Quantum yield
Narrow band
Carbon
Coated material
Cadmium selenides
Thickness
Transmission electron microscopy
Graphene
High efficiency
Zero band gap semiconductors
Drying
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References BurdaCChenXNarayananREl-SayedMAChem. Rev.2005105102510.1021/cr030063a1:CAS:528:DC%2BD2MXisVyquro%3D
HytchMJSnoeckEKilaasRUltramicroscopy19987413110.1016/S0304-3991(98)00035-71:CAS:528:DyaK1cXlsVygs78%3D
ShinHYKwonSKChangYIChoMJParkKHJ. Korean Phys. Soc.2008533402
JacobG.BarbosaL.C.CesarC.L.Proceeding of the SPIE20055734124
BrusLEJ. Chem. Phys.198480440310.1063/1.4472181:CAS:528:DyaL2cXitF2ltL8%3D
BallouBLagerholmBCErnstLAWaggonerASBioconjugate Chem.2004157910.1021/bc034153y1:CAS:528:DC%2BD3sXhtVWit7bM
HengleinAChem. Rev.198989186110.1021/cr00098a0101:CAS:528:DyaL1MXmsVSmsr4%3D
LuanWYangHShan-TungTNanoscale Res. Lett.2008313413510.1007/s11671-008-9125-5
HinesMAGuyot-SionnestPJ. Phys. Chem.199610046847110.1021/jp95305621:CAS:528:DyaK2MXhtVSgs7vN
ReganWAlemNAlemánBAppl. Phys. Lett.20109611310210.1063/1.3337091
C Burda (1312_CR3) 2005; 105
B Ballou (1312_CR5) 2004; 15
MJ Hytch (1312_CR8) 1998; 74
MA Hines (1312_CR7) 1996; 100
LE Brus (1312_CR1) 1984; 80
1312_CR4
A Henglein (1312_CR2) 1989; 89
W Luan (1312_CR6) 2008; 3
HY Shin (1312_CR10) 2008; 53
W Regan (1312_CR9) 2010; 96
References_xml – volume: 15
  start-page: 79
  year: 2004
  ident: 1312_CR5
  publication-title: Bioconjugate Chem.
  doi: 10.1021/bc034153y
  contributor:
    fullname: B Ballou
– volume: 105
  start-page: 1025
  year: 2005
  ident: 1312_CR3
  publication-title: Chem. Rev.
  doi: 10.1021/cr030063a
  contributor:
    fullname: C Burda
– volume: 3
  start-page: 134
  year: 2008
  ident: 1312_CR6
  publication-title: Nanoscale Res. Lett.
  doi: 10.1007/s11671-008-9125-5
  contributor:
    fullname: W Luan
– volume: 74
  start-page: 131
  year: 1998
  ident: 1312_CR8
  publication-title: Ultramicroscopy
  doi: 10.1016/S0304-3991(98)00035-7
  contributor:
    fullname: MJ Hytch
– volume: 96
  start-page: 113102
  year: 2010
  ident: 1312_CR9
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.3337091
  contributor:
    fullname: W Regan
– volume: 80
  start-page: 4403
  year: 1984
  ident: 1312_CR1
  publication-title: J. Chem. Phys.
  doi: 10.1063/1.447218
  contributor:
    fullname: LE Brus
– ident: 1312_CR4
  doi: 10.1117/12.587248
– volume: 89
  start-page: 1861
  year: 1989
  ident: 1312_CR2
  publication-title: Chem. Rev.
  doi: 10.1021/cr00098a010
  contributor:
    fullname: A Henglein
– volume: 100
  start-page: 468
  year: 1996
  ident: 1312_CR7
  publication-title: J. Phys. Chem.
  doi: 10.1021/jp9530562
  contributor:
    fullname: MA Hines
– volume: 53
  start-page: 3402
  year: 2008
  ident: 1312_CR10
  publication-title: J. Korean Phys. Soc.
  contributor:
    fullname: HY Shin
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Snippet CdSe/ZnS core–shell structured nano-crystal quantum dots (QDs) are ideal candidates for light-emission applications due to their high quantum efficiency,...
CdSe/ZnS core-shell structured nano-crystal quantum dots (QDs) are ideal candidates for light-emission applications due to their high quantum efficiency,...
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SubjectTerms Applied sciences
Cadmium selenides
Characterization and Evaluation of Materials
Chemistry and Materials Science
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross-disciplinary physics: materials science; rheology
Electronics
Exact sciences and technology
High resolution
Imaging
Intermetallics
Materials
Materials Science
Metals. Metallurgy
Nanocrystals
Nanoscale materials and structures: fabrication and characterization
Optical and Electronic Materials
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Photoluminescence
Physics
Production techniques
Quantum confinement
Quantum dots
Semiconductors
Surface treatment
Transmission electron microscopy
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Title High resolution imaging analysis of CdSe/ZnS core–shell quantum dots (QDs) using Cs-corrected HR-TEM/STEM
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