Simultaneous, coincident 2-D ACAR and DBAR using segmented HPGe detectors incorporating sub-pixel interpolation

• Published in: Journal of physics. Conference series Vol. 225; no. 1; p. 012058
• Main Authors: Williams, Christopher S, Burggraf, Larry W, Adamson, Paul E, Petrosky, James C, Oxley, Mark E
• Format: Journal Article
• Language: English
• Published: Bristol IOP Publishing 01.04.2010
• Subjects: Angular correlation; Angular resolution; Attenuation; Copper; Detectors; Digital electronics; Germanium; Interpolation; Photons; Physics; Pixels; Position sensing; Positron annihilation; Radiation; Scientific imaging; Silicon carbide; Single crystals; Spatial resolution; Spectrometers; Spectrometry; Spectroscopy; Strip
• DOI: 10.1088/1742-6596/225/1/012058
• ISSN: 1742-6596; 1742-6588

A three-dimensional Positron Annihilation Spectrometry System (3D PASS) for determination of 3D electron-positron (e--e+) momentum densities by measuring coincident annihilation photons was designed, constructed and characterized. 3D PASS collects a single data set including correlated photon energies and coincident photon positions which are typically collected separately by two-dimensional angular correlation of annihilation radiation (2D ACAR) and two-detector coincident Doppler broadening of annihilation radiation (CDBAR) spectrometry. 3D PASS is composed of two position-sensitive, high-purity germanium (HPGe) double-sided strip detectors (DSSD(s)) linked together by a 32-channel, 50 MHz digital electronics suite. The DSSDs data were analyzed to determine location of photon detection events using an interpolation method to achieve a spatial resolution less than the 5-mm width of the DSSDs' charge collection strips. The interpolation method relies on measuring a figure-of-merit proportional to the area of the transient charges observed on both strips directly adjacent to the charge collection strip detecting the full charge deposited by the annihilation photon. This sub-pixel resolution, corresponding to the error associated with event location within a sub-pixel was measured for both DSSDs using the approach outlined in Williams et al [1] and was on the order of ± 0.20 mm (± one-standard deviation). As a result of the sub-pixel resolution, the distance between the DSSDs and material sample was reduced by a factor of five compared to what is typically required in 2D ACAR systems was necessary to achieve 0.5-mrad angular resolution. This reduction in the system's footprint decreases attenuation of the annihilation photons in the air between the material sample and the DSSDs and increases the solid angle between the sample and the DSSDs, ultimately resulting in higher system detection efficiency. 3D PASS was characterized in the same manner comparable to state-of-the-art 2D ACAR and CDBAR spectrometers. 3D PASS spectra were collected and analyzed for single-crystal copper (Cu) and silicon carbide (6H SiC) and compared with the results in the literature.